CD54HCT195 Search Results
CD54HCT195 Datasheets (1)
| Part | ECAD Model | Manufacturer | Description | Datasheet Type | PDF Size | Page count | |
|---|---|---|---|---|---|---|---|
| CD54HCT195/3A | RCA Solid State | High-Reliability High-Speed CMOS Logic ICs | Scan | 73.48KB | 2 |
CD54HCT195 Price and Stock
RCA CD54HCT195F3A |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
CD54HCT195F3A | 4 |
|
Buy Now | |||||||
Harris Semiconductor CD54HCT195F3AShift Registers Universal 1 Element 4 Bits 5V 16-DIP |
|||||||||||
| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
|
CD54HCT195F3A | 106 | 1 |
|
Buy Now | ||||||
CD54HCT195 Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
54HC
Abstract: CD54HC221 CD54HCT221 hct195
|
OCR Scan |
cd54hc195/3acd54hct195/354hctcd54hc/hct221+5 | |
|
Contextual Info: IHAS 43GEE71 0025^30 T 37E riigh-Reliability High-Speed CMOS Logic ICs HARRIS SENICOND SECTOR CD54HC195/3A CD54HCT195/3A T iit-œ -Q S Switching Speed Limits with black dots (• are tested 100%.) "P S SWITCHING CHARACTERISTICS (CL = 50 pF, Input tr, t, = 6 ns) |
OCR Scan |
43gee71cd54hc195/3acd54hct195/3a54hct+2 | |
|
Contextual Info: High-Reliability High-Speed CMOS Logic ICs C D 5 4 M C 1 9 5 /3 A CD54HCT195/3A Switching Speed Limits w ith black dots (• are tested 100%.) SW ITCHING CHARACTERISTICS (C L = 50 pF, Input t„ t, = 6 ns) TEST CONDITIO NS CHARACTERISTIC Propagation Delay |
OCR Scan |
cd54hct195/3a54hc/hctcd54hc/hct221 | |
CD54HC194Contextual Info: High-Reliability High-Speed CMOS Logic ICs _ CD54HC194/3A CD54HCT194/3A Burn-ln Test-Circuit Connections Static OPEN 12-15 CD 54H C /H C T194 Dynamic Use Static II for /3A burn-in and Dynamic fo r Life Test. STATIC BURN-IN 1 |
OCR Scan |
cd54hc194/3acd54hct194/3acd54hct195/3acd54hc195+3 | |
74HC195
Abstract: 74HCT195
|
OCR Scan |
cd54/74hc195cd54/74hct195cd74hc/hct74hc195+1 | |
CD54HC194Contextual Info: m 37E D High-Reliability High-Speed CMOS Logic ICs _ , CD54HC194/3A CD54HCT194/3A HARRIS SE"IC0NI SECT0R~ 'T-Hi-OS-oS Burn-In Test-Circuit Connections Static 12-15 Dynamic Use Static II for /3A burn-in and Dynamic for Life Test. STATIC BURN-IN 1 GROUND |
OCR Scan |
cd54hc194/3acd54hct194/3acd54hc/hct1942k-47k+6 | |
|
Contextual Info: Technical Data File Number CD54/74HC195 CD54/74HCT195 1482 High-Speed CM O S Logic PE DO D1 D2 D3 4-Bit Parallel Access Register I , U Is I • It Type Features: 115 J14 j13 ¡12 0 0 01 0 2 0 3 FUNCTIONAL DIAGRAM • • ■ • • • ■ Asynchronous Master Reset |
OCR Scan |
cd54/74hc195cd54/74hct195cd74hc/hctcd54hc/cd74hc | |
74HCT195
Abstract: FMM50
|
OCR Scan |
cd54/74hc195cd54/74hct195fmm--5074tion+3 | |
CD74HC4063E
Abstract: cd74hct192e C074HC377E CD74HC40S1E C074HC132E CD74HCT4017E CD74HC643E C074HC174E CD74HCT563e rca CD54HCT4094F
|
OCR Scan |
54/74lsttl74/54hcd74hct4051ecd54hct4051f+16 | |
CD54HC194Contextual Info: High-Speed C M O S Logic ICs CD54HC194/3A CD54HCT194/3A 4-Bit Bidirectional Universal Shift Register T he R C A CD 54H C194 and CD 54 H C T 1 9 4 are four-bit shift registers with A synch ron ou s M aster Reset MR . In the |
OCR Scan |
cd54hc194/3acd54hct194/3acd54hc194 |