BCT37 Search Results

Contextual Info: NA TI ON AL S E M I C O N D LOGIC 4TE D NSC1 b S 0 1 1 2 2 0 0 7 3 33 2 June 1992 BCT374 Octal D Flip-Flop with TRI-STATE Outputs General Description Features The 'BCT374 is a high-speed, low-power octal D-type flipflop featuring separate D-type inputs for each flip-flop and

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

ABT245

Abstract: F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245
Contextual Info: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information

SN54BCT374

Abstract: SN74BCT374 SN74BCT374DW SN74BCT374DWR SN74BCT374N SN74BCT374NSR
Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

SN54LVT18502

Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
Contextual Info: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

V5050

Abstract: F373 SN54BCT8373A SN74BCT8373A
Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016C – SEPTEMBER 1988 – REVISED NOVEMBER 1993 • • • • BCT373 . . . J OR W PACKAGE BCT373 . . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS019B – SEPTEMBER 1988 – REVISED APRIL 1994 • • • • • BCT374 . . . J OR W PACKAGE BCT374 . . . DB OR DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

F374

Abstract: SN54BCT8374A SN74BCT8374A
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

SN54BCT373

Abstract: SN74BCT373
Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016C – SEPTEMBER 1988 – REVISED NOVEMBER 1993 • • • • BCT373 . . . J OR W PACKAGE BCT373 . . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

F374

Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

texas F245

Abstract: ti8245 an7005 A37 diode ABT245 F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW
Contextual Info: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information

SN54BCT374

Abstract: SN74BCT374 SN74BCT374DW SN74BCT374DWR SN74BCT374N SN74BCT374NSR
Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading