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    AT24C128

    Abstract: AT3500 ATMEL Qualification Package AT24C128 at350 AT35000 Atmel AT35523 Product Reliability Test ATMEL AT35000 package qualification
    Contextual Info: AT24C128 AT35523 2-Wire Bus Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C128 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado


    Original     		at24c128at35523at350002g5606+5at3500atmel qualification package at24c128at350atmel at35523 product reliability testatmel at35000 package qualification PDF

    MIL-STD-883 Method 3015.7

    Abstract: atmel lot marking eeprom atmel 922 AT89C5114 breakdown gate oxide atmel 336 DYNAMIC RAM CROSS REFERENCE Atmel eeprom Cross Reference Atmel 434 Atmel AT35523 Product Reliability Test
    Contextual Info: T8xC5121 QualPack Qualification Package T8xC5121 C51 Microcontrollers T8xC5121 FEBRUARY 2003 Rev. 0 – 2003 February 1 T8xC5121 QualPack 1 Table of contents 1 TABLE OF CONTENTS .2


    Original     		t8xc5121mil-std-883 method 3015.7atmel lot marking eepromatmel 922+7at89c5114breakdown gate oxideatmel 336dynamic ram cross referenceatmel eeprom cross referenceatmel 434atmel at35523 product reliability test PDF