A14I Search Results

LH53V4C00ET

Abstract: sharp mask rom 48-pin
Contextual Info: CMOS 4M 512K x 8/256K x 16 MROM FEATURES • 524,288 x 8 bit organization (Byte mode: BYTE = V,L) 262,144 x 16 bit organization (Word mode: BYTE = V,H) PIN CONNECTIONS 48-PIN TSOP (Type I) r TOP VIEW A15C 1 • A14IZ 2 A13C 3 • Access time: 150 ns (MAX.)

LVTH18514

Abstract: LVTH182514 SN54LVTH182514 SN54LVTH18514 SN74LVTH182514 SN74LVTH18514 78 hkc
Contextual Info: SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 D D D D D D D D D D Members of the Texas Instruments TI SCOPE  Family of Testability Products

EN 60352

Abstract: FLASH PRO MC52-MC31
Contextual Info: AMDÌ1 P R E L IM IN A R Y A m 1 8 6 E S /E S L V a n d A m 188™ E S /E S L V High Performance, 80C186-/80C188-Compatible and 80L186-/80L188-Compatible, 16-Bit Embedded Microcontrollers DISTINCTIVE CHARACTERISTICS • ■ E86™ family 80C186-/188- and 80L186-/188compatible microcontrollers with enhanced bus

Contextual Info: : I dt 3.3V CMOS STATIC RAM 1 MEG 64Kx 16-BIT) PRELIMINARY IDT71V016SA Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • 64K x 16 advanced high-speed CMOS Static RAM • Equal access and cycle times — 10/12/15/20ns • One Chip Select plus one Output Enable pin

Contextual Info: QPRO XQ4000XL Serles QML flX IU N X High-Reliablllty Field Programmable Gate Arrays May 19, 1998 Version 1.0 XG4QQQX Series Features • • • • • • • • • • • • • • Certified to MIL-PRF-38535 Appendix A QML (Qualified Manufacturer Listing)

Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B - JULY 1996 - REVISED JUNE 1997 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments

bv228

Abstract: S1C33210 S1C33L01 MF1517-01 CP4D
Contextual Info: MF1517-01 CMOS 32-BIT SINGLE CHIP MICROCOMPUTER S1C33210 Technical Manual S1C33210 PRODUCT PART S1C33210 FUNCTION PART NOTICE No part of this material may be reproduced or duplicated in any form or by any means without the written permission of Seiko Epson. Seiko Epson reserves the right to make changes to this material without notice.

Contextual Info: Advance Data Sheet June 1992 ^ B A T s iT ^ ^ ^ M ic ro e le c tro n ic s ATT3000 Series Military Field-Programmable Gate Arrays Features • User-programmable gate array ■ Low-power, CMOS, static memory technology ■ Standard product; 100% factory tested

Contextual Info: IM P O R T A N T N O TIC E All new designs should use XC3000A or XC3100A. Information on XC3000 and XC3100 is presented here as reference for existing designs. £ x il in x XC3000, XC3000A, XC3000L, XC3100, XC3100A Logic Cell Array Families Product Description

3771

Abstract: 3771 ic 8 pin
Contextual Info: LOW POWER 3V CMOS SRAM 1 MEG 64K x 16-BIT ADVANCE INFORMATION IDT71V016L Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • • • • • • • The ID T71V016L is a 1,048,576-bit very low-pow er Static RAM organized as 64K x 16. It is fabricated using ID T’s highreliability CMOS technology. This state-of-the-art technology,

TIP 3771

Abstract: 3771 E1 3771 8 pin ic
Contextual Info: LOW PO W ER 3V C M O S S R A M 1 M EG 64Kx 16-BIT ADVANCE INFORMATION IDT71L016 In te g ra te d D e v iz e T e c h n o lo g y , l i e . FEATURES: • 64K x 16 Organization • Wide Operating Voltage Range: 2.7V to 3.6V • Commercial (0° to 70°C) and Industrial (-40° to 85°C)

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN54ABT18504

Abstract: SN74ABT18504
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: S G S -1 H 0 M S 0 N 5 7 . » « m i » « ® M28F210 M28F220 2 Megabit x8 or x16, Block Erase FLASH MEMORY PRELIMINARY DATA DUAL x8 and x16 ORGANIZATION SMALL SIZE PLASTIC PACKAGES TSOP56 and S044 MEMORY ERASE in BLOCKS - One 16K Byte or 8K Word Boot Block (top or

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

transistor trio anemometer

Abstract: Horizontal Transistor TT 2246 FPGA programmable switch capacitor PI-165 ATT3000 lsc 3120 ATT3020 ATT3030 grid tie inverter schematic ATT3064
Contextual Info: Data Sheet March 1995 — _—— • y - T • _ = ¡T" 1 , Microelectronics ATT3000 Series Field-Programmable Gate Arrays Features ■ High performance: — Up to 270 MHz toggle rates — 4-input LUT delays < 3 ns ■ User-programmable gate arrays

smd diode code a6I

Abstract: A1s smd TRANSISTOR 4c7 SMD grid tie inverters circuit diagrams ATT3000 grid tie inverter schematics n993 smd transistor A1s ATT3020 ATT3042
Contextual Info: Data Sheet October 1993 -— s u A T « T — M l * Microelectronics ATT3000 Series Field-Programmable Gate Arrays -50, -70, -100, -125, and -150 MHz Features Description • High performance—up to 150 MHz toggle rates The CMOS ATT3000 Series Field-Programmable Gate

SN54ABT18504

Abstract: SN74ABT18504 A14O
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS667B – JULY 1996 – REVISED JUNE 1997 D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: CMOS 32-BIT SINGLE CHIP MICROCOMPUTER S1C33301 Technical Manual NOTICE No part of this material may be reproduced or duplicated in any form or by any means without the written permission of Seiko Epson. Seiko Epson reserves the right to make changes to this material without notice. Seiko Epson does not assume any

FPQ-132-0

Abstract: XC3020-CQ100 XC3020
Contextual Info: XC3020B Military Logic Cell Array Product Specification. S ee Note 1. FEATURES Part Number • M IL-S T D -883 Class B Processing. Complies with paragraph 1.2.1 • Field-programmable gate array • Low power CMOS static memory technology Logic Capacity

M3P1

Abstract: KD 2107 X3032
Contextual Info: XC3000, XC3000A, XC3000L, XC3100, XC3100A Logic Cell Array Families £ Product Description Features • Complete XACT Development System - Schematic capture, automatic place and route - Logic and timing simulation - Interactive design editor for design optimization

Contextual Info: YPQfiQflR K Military Logic Cell Array Product Specification. S e e Note 1. FEATURES Part Number • M IL-S T D -883 Class B Processing. Complies with paragraph 1.2.1 • Field-programmable gate array • Low power CMOS static memory technology Logic Capacity

A18I

Contextual Info: SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products