SCBS184B Search Results

Contextual Info: SN54ABT241A, SN74ABT241A OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS SCBS184B - JANUARY 1991 - MARCH 1996 • State-of-the-Art EPIC-UB BiCMOS Design Significantly Reduces Power Dissipation • Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17

ABT244A

Abstract: SN74ABT241A SN54ABT241A
Contextual Info: SN54ABT241A, SN74ABT241A OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS _ SCBS184B-JANUARY 1991 - MARCH 1996 State-of-the-Art EPIC-UB BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17 SN54ABT241A . . . J OR W PACKAGE

SN74ALVCH162245

Abstract: Schottky Barrier Diode Bus-Termination Array SN7400 CLOCKED SLLS210 SCAD001D TEXAS INSTRUMENTS SN7400 SERIES buffer SN74LVCC4245 sn74154 SDAD001C SN7497
Contextual Info: Section 4 Logic Selection Guide ABT – Advanced BiCMOS Technology . . . . . . . . . . . . . . . . . . . . . . . . . . 4–3 ABTE/ETL – Advanced BiCMOS Technology/ Enhanced Transceiver Logic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4–9

SF 9001A

Abstract: 1A61
Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS S C 8 S 1 6 4 B -A U G U S T 1 9 9 3 -flE V IS E D M AR C H 1995 One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency