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    PQ160, Search Results

    PQ160, Datasheets (4)

    Nihon Inter Electronics
    Part ECAD Model Manufacturer Description Datasheet Type PDF PDF Size Page count
    PQ160QH04N
    		Nihon Inter Electronics 40 V, 160 A, diode Original PDF 56.25KB 2
    PQ160QH04N
    		Nihon Inter Electronics SCHOTTKY BARRIER DIODE MODULE Scan PDF 71.14KB 2
    PQ160QH06N
    		Nihon Inter Electronics 60 V, 160 A, diode Original PDF 56.28KB 2
    PQ160QH06N
    		Nihon Inter Electronics SCHOTTKY BARRIER DIODE MODULE Scan PDF 68.88KB 2
    SF Impression Pixel

    PQ160, Price and Stock

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    AMD XC5206-6PQ160C

    IC FPGA 133 I/O 160QFP
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    DigiKey XC5206-6PQ160C Tray
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    AMD XC5210-5PQ160C

    IC FPGA 133 I/O 160QFP
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    AMD XC5204-6PQ160C

    IC FPGA 124 I/O 160QFP
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    AMD XC4006E-4PQ160C

    IC FPGA 128 I/O 160QFP
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    DigiKey XC4006E-4PQ160C Tray 24
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    Rochester Electronics LLC XC3195A-4PQ160C

    FPGA, 484 CLBS, 6500 GATES
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    DigiKey XC3195A-4PQ160C Bulk
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    Find more PQ160, price and stock on Findchips.com

    PQ160, Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    121C-2

    Abstract: XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478
    Contextual Info: The Reliability Data Program Expanded Version Jan. 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


    Original     		XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA 121C-2 XC1765D XC95108 XL mp8000ch4 p103 pot datasheet reliability report PQFP240 XC95xxx 17256d D1 PGA 478 PDF

    XC95XXXL

    Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
    Contextual Info: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


    Original     		XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA XC95XXXL XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices PDF