CD54HC4518 Search Results

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC4518/3A CD54HCT4518/3A Dual Synchronous BCD Counter Th e R C A C D 5 4 H C 4 5 18 and C D 5 4 H C T 4 5 1 8 are dual B CD up-counters. Each device consists of two independent internally synchronous 4-stage counters. Th e counter stages

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC4518/3A CD54HCT 4518/3A Burn-ln Test-Circuit Connections Static OPEN 3-6,11-14 CD54HC/HCT 4518 Dynamic Use Static II for /3A burn-in and Dynamic for Life Test. STATIC BURN-IN I GROUND Vcc (6V) 1,2,7-10,15

ICE 3b502

Abstract: 93C39-5 3B502 54HC
Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC4518/3A CD54HCT 4518/3A Dual Synchronous BCD Counter The RCA CD54HC4518 and CD54HCT4518 are dual BCD up-counters. Each device consists o f tw o independent internally synchronous 4-stage counters. The counter stages

ic 4518

Abstract: pin diagram of ic 4518
Contextual Info: 37E M3G2S71 D02b055 □ HIHAS High-Reliability High-Speed CMOS Logic ICs HARRIS SEMICON» SECTOR CD54HC4518/3A CD54HCT 4518/3A Dual Synchronous BCD Counter ~T<4S-2i>-OS The RCA CD54HC4518 and CD54HCT4518 are dual BCD up-counters. Each device consists o f tw o independent

Contextual Info: HARRIS SEMICOND SECTOR 37E D • High-Reliabillty High-Speed CMOS Logic ics - ^ LJ3G2271 0G2b053 2 BIHAS SQ|_X] STATE - CD54HC4518/3A CD54HCT 4518/3A ' ^ 4 5 -2 5 -0 5 Burn-In Test-Circuit Connections Static OPEN 3-6,11-14 CD54HC/HCT 4518 Dynamic

CD74HC4063E

Abstract: cd74hct192e C074HC377E CD74HC40S1E C074HC132E CD74HCT4017E CD74HC643E C074HC174E CD74HCT563e rca CD54HCT4094F
Contextual Info: The QMOS Product Line RCA also offers the QM OS series of high-speed CMOS logic integrated circuits which include an extensive line of products that are pin compatible with many existing bipolar 54/74LSTTL and CM OS 4000 series of digital logic types. The new QM OS IC ’s provide high-speed