883AND Search Results

FTG-12

Abstract: INCOMING RAW MATERIAL FILM INSPECTION procedure ADE-6 Sample form for INCOMING Inspection of RAW MATERIAL mosfet 1500v MTBF UCL 2003 INCOMING RAW MATERIAL INSPECTION method
Contextual Info: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to m onitor the integrity o f its devices. All industry standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect

6V88

Contextual Info: lattice G A L 1 6 V 8 B /8 8 3 G A L I 6 V 8 A /8 8 3 High Performance E^MOS PLD FUNCTIONAL BLOCK DIAGRAM FEATURES • HIGH PERFORMANCE E>CMOS* TECHNOLOGY — 10 ns Maximum Propagation Delay — Fmax = 62.5 MHz — 7 ns Maximum from Clock Input to Data Output

INCOMING RAW MATERIAL INSPECTION form

Abstract: IC 34992 ucl 11
Contextual Info: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to monitor the integrity of its devices. All industry' standard and various non-standard stresses are run. Testing is done not only to collect data, but also to detect

Contextual Info: L i r t LT1126M/883 LT1127M/883 o TECHNOLOGY D u a l/Q u ad D eco m p ensated Low Noise, High Speed Precision O p Amps mnximum RATinos DCSCMPTIOn abso lute The LT1126M/883 dual and LT1127M/883 quad are high performance, decompensated op amps that offer higher