2a92
Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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at-27c010e901-140562d1147-122a92+927c010a6e96216b96373a93153e03175a95165c95501b91262d1150-9
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5A9516
Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Contextual Info: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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at-27c010e901-140562d1147-125a9516+95h96065h96057h97442a92125a95247h97479d90185c1121b9126
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TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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at-27c040mil-m-38535at-27c1024at-27c512r+13at-27c01012c/tsop/soic/pdip6d97028b9832tsop 173 g5h96026c96483b13265g95516f96274c193c1660atmel 906
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27C2048
Abstract: 7A9819 MIL-M-38535 plcc failures
Contextual Info: PAGE 1 OF 6 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C2048 CMOS EPROM RELIABILITY DATA - 150°C RETENTION BAKE (PLASTIC) - EXTENDED THERMAL SHOCK - EXTENDED TEMPERATURE CYCLE - 85°C/85% RETENTION HUMIDITY OPERATING LIFE TEST - 15 PSIG PRESSURE POT
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at-27c2048mil-m-385356b19246b9633+47a0378-227c20487a9819plcc failures
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