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    28C040

    Abstract: 28C256 atmel AT28C040 28c010 28C256 28HC64 MIL-M-38535 5F0280 AT28C010
    Contextual Info: PAGE 1 OF 4 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C040 EEPROM RELIABILITY DATA* - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST *. This data is applicable to the following device types due to same technology grouping as


    Original     		at-28c040mil-m-38535at-28c256at-28c010+125f02805f95265f07235f9522at-28hc6428c04028c256 atmelat28c04028c01028c25628hc64at28c010 PDF

    TSOP 173 g

    Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
    Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT


    Original     		at-27c040mil-m-38535at-27c1024at-27c512r+13at-27c01012c/tsop/soic/pdip6d97028b9832tsop 173 g5h96026c96483b13265g95516f96274c193c1660atmel 906 PDF