TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Contextual Info: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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AT-27C040
MIL-M-38535
AT-27C1024
AT-27C512R
AT-27C010
AT-27C040
12C/TSOP/SOIC/PDIP
6D9702
8B9832
TSOP 173 g
5H9602
6c9648
3b1326
5G9551
6F9627
4c19
3C1660
atmel 906
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PDF
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29C256
Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
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AT-29C256
MIL-M-38535
AT-29C257
AT-29C256
2D9303
3A9313
3A9318
3B9324
29C256
29C257
report on PLCC
tsop 6
3A0081
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PDF
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M1014
Abstract: K2078 1c9136 5D9602 AT27C010 AT27C512R 1C9133 27c256r 1A9110 3D9352
Contextual Info: PAGE 1 OF 15 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C256R CMOS EPROM RELIABILITY DATA* * - 200°C DATA RETENTION BAKE - 125°C DYNAMIC OPERATING LIFE TEST - 125°C HIGH TEMPERATURE REVERSE BIAS (HTRB) - TEMPERATURE CYCLE, CENTRIFUGE, FINE AND GROSS
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AT-27C256R
from27C256R
4B0691
8703A)
M1014
K2078
1c9136
5D9602
AT27C010
AT27C512R
1C9133
27c256r
1A9110
3D9352
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PDF
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27c080
Abstract: tsop 138 atmel 27c080 resistor activation energy MIL-M-38535 tsop40 3D0442-1
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C080 EPROM RELIABILITY DATA - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT * This report was generated from AT-27C080 reliability testing.
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AT-27C080
MIL-M-38535
AT-27C040
AT-27C4096
AT-27C080
A3B0575-2
3B9336
A3B0575-1
3B9331
27c080
tsop 138
atmel 27c080
resistor activation energy
tsop40
3D0442-1
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PDF
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EEPROM 28C256
Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-28C256
MIL-M38535
AT-28C010
AT-28C040
AT-28C256
1C0302
3E0319
3E0323
3G0338
EEPROM 28C256
7b9729
1C0302
28C040
28C256
82307
28C256 atmel
4b23
6D9708
6C9638
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PDF
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29C256
Abstract: 29C257 PLCC 64
Contextual Info: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
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AT-29C256
MILM-38535
AT-29C257
AT-29C256
2D9303
3A9313
3A9318
3B9324
29C256
29C257
PLCC 64
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PDF
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29c512 datasheet
Abstract: 29c512 3B9317 1H0050 at 29c512 datasheet 6F9631 1H0208 ATMEL 940
Contextual Info: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C512 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
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AT-29C512
AT-29C512
B3B0684
4A0927
4A2182
4D0262
5G1621
2D9303
3B9327
4A9422
29c512 datasheet
29c512
3B9317
1H0050
at 29c512 datasheet
6F9631
1H0208
ATMEL 940
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