I426
Abstract: U2002 i437 ATL60 3I102 3SD11
Contextual Info: Scan Insertion and ATPG Development via Synopsys Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler , version
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"3 Bit Shift Register"
Abstract: I426 SD4 diode i437 ATL60 sdi verilog code OM32muxl0
Contextual Info: Test Compiler Scan Insertion and ATPG Development via Synopsys Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler , version
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U2002
Abstract: ATL60
Contextual Info: Test Compiler Scan Insertion and ATPG Development via Synopsys• Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys• Test Compiler• , version
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STR D 6601
Abstract: str 6601 str 4569
Contextual Info: NOTES; 1 M ATERIAL: G.F. PO LY ES TE R 2) HOUSING TO BE USED WITH TERM INALS PT . NO. 70058-»»1»» & 70028-»»1»» 3) SEE CHART A) FOR CIRCUIT SIZES. TO BE USED WITH 0.641/.025 SQ. OR RD. PINS. 5) PA RTS S TAC KAB LE END TO END AND SIDE BY SIDE ON (2.54)/. 100 CENTERS.
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U3I505
2I425
SD-70449-*
STR D 6601
str 6601
str 4569
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