1149 Search Results

programmable storage device

Contextual Info: TMS29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE SMJS816B-NOVEMBER1990-REVISED JANUARY 1993 FM PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE'“ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible * Organization . . . 2048 x 8-Bit Flash Memory

Contextual Info: SCAN15MB200 www.ti.com SNLS188D – NOVEMBER 2005 – REVISED MAY 2006 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 Check for Samples: SCAN15MB200 FEATURES 1 • • 2 • • 1.5 Gbps data rate per channel Configurable off/on pre-emphasis drives lossy

Contextual Info: Doc No. TT4-EA-11493 Revision. 3 Product Standards Switching Diode DA2S10100L DA2S10100L Silicon epitaxial planar type Unit: mm For high speed switching circuits DA2J101 in SSMini2 type package 0.8 0.13 2 • Features 1.2 1.6  Small reverse current IR  Short reverse recovery time trr

t10-25 u2

Abstract: G2156 f10107
Contextual Info: Preliminary GS816273AC-300/275/250/225/200 300 MHz–200 MHz 256K x 72 1.8 V or 2.5 V VDD 18Mb S/DCD Sync Burst SRAMs 1.8 V or 2.5 V I/O 209-Pin BGA Commercial Temp Industrial Temp Features • Single/Dual Cycle Deselect selectable • IEEE 1149.1 JTAG-compatible Boundary Scan

Contextual Info: SN54LVT8986, SN74LVT8986 3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS www.ti.com SCBS759E – OCTOBER 2002 – REVISED MAY 2007 FEATURES • • • • • • • Members of the Texas Instruments (TI) Family

IRFU840

Abstract: ELECTRONIC BALLAST DIAGRAM 28w capacitor 100nf 630v CAPACITOR 10U 16V 28W ELECTRONIC BALLAST 2 LAMP SCHEMATIC IR2158 electronic ballast for T5 28w ELECTRONIC BALLAST T5 54w PFC BALLAST CONTROL IC l6562 L6562 dimming
Contextual Info: Application Note AN-1149 Designing a Wide Range Input Linear Dimming T5/54W Fluorescent Ballast using the IRS2158D By Peter Green, Veronika Stelmakh, Andre Tjokrorahardjo Table of Contents Page Introduction . 2

SCAN16512

Abstract: SLC64A
Contextual Info: SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs General Description Features The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals.

SCANSTA111

Abstract: STA111
Contextual Info: SCANSTA111 Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 JTAG Port General Description The SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a multidrop approach over a single serial scan chain is improved test throughput and the ability to remove a board

Contextual Info: SN74LVT8980AĆEP EMBEDDED TESTĆBUS CONTROLLER IEEE STD 1149.1 JTAG TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS761A − JUNE 2003 − REVISED OCTOBER 2003 D Controlled Baseline D D D D D D D D D D Flexible TCK Generator Provides − One Assembly/Test Site, One Fabrication

LVT8980

Abstract: LVT8990 MS-013 MSOI003E SN54LVT8980 SN74LVT8980
Contextual Info: SN54LVT8980, SN74LVT8980 EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES SCBS676D – DECEMBER 1996 – REVISED AUGUST 2002 D D D D D D D D D D D SN54LVT8980 . . . JT PACKAGE SN74LVT8980 . . . DW PACKAGE

act8990

Abstract: SN54ACT8990 SN74ACT8990 sn74act8890
Contextual Info: SN54ACT8990, SN74ACT8990 TEST BUS CONTROLLERS SC AS190B - JUN E 1990 - REVISED A UG UST 1994 • Members of the Texas Instruments SCOPE Family of Testability Products * Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and Boundary-Scan Architecture

TTL 7474

Abstract: 7474 for shift register 7474 shift register 7474 texas instruments ABT8245 SN54ABT8245 SN74ABT8245 tms 3534
Contextual Info: SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124A - A UGUS T 1992 - REVI SED AUGUS T 1993 ' Members of the Texas Instruments SCOPE Family of Testability Products 1 Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port

SN54ABT18502

Abstract: H TR 1A60 texas instruments 486 TR 1A60
Contextual Info: SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS109C - AU G U S T 1992 - RE V IS E D AU G U S T 1994 SCOPE Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With

SN54LVT8980A

Abstract: SN74LVT8980A SN74LVT8980ADW SN74LVT8980ADWR SNJ54LVT8980AFK SNJ54LVT8980AJT SNJ54LVT8980AW
Contextual Info: SN54LVT8980A, SN74LVT8980A EMBEDDED TESTĆBUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS755B − APRIL 2002 − REVISED MARCH 2004 D D D D D D D D D D STRB R/W D0 D1 D2 D3 GND D4 D5 D6 D7 CLKIN 1 24 2 23 3 22 4

Contextual Info: TLK1201ARCP, TLK1201AIRCP ETHERNET TRANSCEIVERS www.ti.com • • • • • • • • • • • • • • • No External Filter Capacitors Required Comprehensive Suite of Built-In Testability IEEE 1149.1 JTAG Support 2.5-V Supply Voltage for Lowest Power

identification trace code texas

Contextual Info: SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products

Contextual Info: TMS320C6472 SPRS612G – JUNE 2009 – REVISED JULY 2011 www.ti.com TMS320C6472 Fixed-Point Digital Signal Processor 1 Features • • • • • • • • • • • Congestion Control • IEEE 1149.6 Compliant I/Os – UTOPIA • UTOPIA Level 2 Slave ATM Controller

Contextual Info: SN54LVT8980, SN74LVT8980 EMBEDDED TESTĆBUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS676E − DECEMBER 1996 − REVISED MARCH 2004 D D D D D D D D D D D STRB R/W D0 D1 D2 D3 GND D4 D5 D6 D7 CLKIN 1 24 2 23 3 22

Contextual Info: SMJ29F816 16 384-BIT SCOPE DIARY JTAG ADDRESSABLE STORAGE DEVICE S G M S 0 5 3-N O V E M B E R 1 99 0-R E V IS E D JA N U A R Y 1993 FG PACKAGEt TOP VIEW * Member of Texas Instruments SCOPE™ Family of Testability Products * IEEE 1149.1 Serial Test Bus Compatible

Contextual Info: S C A N 9 0C P 0 2 SCAN90CP02 1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 Texa s In s t r u m e n t s Literature Number: SNLS168L SCAN90CP02 1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 General Description

Contextual Info: PART NUMBER UNCONTROLLED DOCUMENT LP B -R 01 1 1051 S REV, A B E.C.N. NUMBER AND REVISION COMMENTS E.C.N. #11148, E.C.N. #11498. REV. B DATE 01.24.07 04.1 6.08 PCB LAYOUT 1. MILKY WHITE DIFFUSED WINDOW. 2. RECOMMEND SML-LX2S32 SERIES LED. UNCONTROLLED DOCUMENT

SN54ABT8652

Abstract: SN74ABT8652
Contextual Info: SN54ABT8652, SN74ABT8652 « SCAN TEST d e v ic e s WITH OCTAL BUS TRANSCEIVERS AND REGISTERS - _ • Members of the Texas Instruments SCOPE Family of Testability Products • Compatible With the IEEE Standard 1149.1-1990 JTAG Test Access Port and

SN74ACT8999

Abstract: ACT8999 SN54ACT8999
Contextual Info: SN54ACT8999, SN74ACT8999 SCAN PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES SCAS1 58B - JUNE 1990 - REVISED AU G U S T 1994 Members of theTexas Instruments SC O PE Family of Testability Products SN74ACT8999 . . . DW OR NT PACKAGE TOP VIEW Compatible With the IEEE Standard 1149.1

LVT8986

Abstract: SN54LVT8986 SN74LVT8986 SN74LVT8986GGV SN74LVT8986PM SNJ54LVT8986HV
Contextual Info: SN54LVT8986, SN74LVT8986 3.3-V LINKING ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS SCBS759B – OCTOBER 2002 – REVISED APRIL 2003 D D D D D D D D Members of the Texas Instruments (TI) Family of JTAG Scan-Support Products