sharp CCD Camera
Abstract: Transformer Inspection Testing C2955 C7103 control using ic 741 die bonding CCD in a TV camera
Contextual Info: TENTATIVE DATA SHEET INFRARED IC INTERNAL INSPECTION SYSTEM C2955 From the backside of the chip, you can see through the silicon substrate to the patterns of the chip by means of an infrared light. A newly developed infrared CCD camera is used to inspect pattern
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c2955se-171-411025e02jul/99+6sharp ccd cameratransformer inspection testingc7103control using ic 741die bondingccd in a tv camera
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