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tms 3755

Catalog Datasheet MFG & Type PDF Document Tags

tms 3755

Abstract: Y104 0.1UF 50 - ns Data hold time tDH D0 to D7, CL2 50 - ns M setup time tMS M , ns Data hold time tDH D0 to D7, CL2 20 - ns M setup time tMS M, CL1 20 , D0 - 7 0.2 VCC tCWH1 0.8 VCC 0.2 VCC CL1 tSCL tHCL CL2 0.2 VCC tMS tMH , 138 Y190 -1537 -418 94 Y234 -3755 -418 139 Y189 -1487 -418 95 , -418 243 Y85 3755 -418 199 Y129 1537 -418 244 Y84 3805 -418 200
Sunplus Technology
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ae 4b15

Abstract: tico 732 /O66 I/O65 I/O64 I/O63 I/O62 I/O61 I/O60 TMS 3A2 3A3 3A4 3A7 3A8 3A11 3A12 3A13 3D13 , GND VCC I/O87 I/O86 I/O85 I/O84 I/O83 I/O82 I/O81 I/O80 TMS 3A2 3A3 3A4 3A7 3A8 3A11 , I/O92 TMS 3A2 3A3 3A4 3A7 3A8 3A11 3A12 3A13 3D15 3D14 3D13 3D12 3D11 3D10 3D9 , /O162 I/O177 I/O190 U TMS I/O161 I/O176 I/O189 T I/O144 I/O160 I/O175 GND VCC I/O159 I/O174 I , 3D7 4 2A0 2A2 2A6 VCC TMS 3 GND 2A3 VCC 2A8 2 2A7 2A9 1
Vantis
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ae 4b15 tico 732 0d12 mach5 320 vantis jtag schematic Quazar MACH5-320/MACH5LV-320 MACH5-320/120-7/10/12/15/20 MACH5-320/160-7/10/12/15/20 MACH5-320/184-7/10/12/15/20 MACH5-320/192-7/10/12/15/20 MACH5LV-320/120-7/10/12/15/20

tico 732

Abstract: 5B7 Marking I/O72 I/O71 I/O70 I/O69 I/O68 GND I/O67 I/O66 I/O65 I/O64 I/O63 I/O62 I/O61 I/O60 TMS , /O82 I/O81 I/O80 TMS 4A2 4A3 4A4 4A7 4A8 4A11 4A12 4A13 4D15 4D14 4D13 4D12 4D11 , GND VCC I/O99 I/O98 I/O97 I/O96 I/O95 I/O94 I/O93 I/O92 TMS 4A2 4A3 4A4 4A7 4A8 4A11 , I2/CLK2 I3/CLK3 GND L I/O186 K N R VCC I/O162 I/O177 I/O190 U TMS I/O161 I , VCC 4B4 3B3 VCC TMS 3A7 VCC 3D11 3D6 3D1 4D1 4D6 7 2B8 4D14
Vantis
Original
5B7 Marking 5a7 02 5B12 DT114 tms 3755 LV 20-P MACH5-384/MACH5LV-384 MACH5-384/120-7/10/12/15/20 MACH5-384/160-7/10/12/15/20 MACH5-384/184-7/10/12/15/20 MACH5-384/192-7/10/12/15/20 MACH5LV-384/120-7/10/12/15/20

tms 3755

Abstract: PAL26V12 N/C I3 TMS GND GND BLOCK G 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 , I3 TMS BLOCK F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 , four JTAG pins: Test Mode Select (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out (TDO , . MANUFACTURER SOFTWARE DEVELOPMENT SYSTEMS Vantis Corporation P.O. Box 3755 920 DeGuigne Drive , Vantis Corporation P.O. Box 3755 920 DeGuigne Drive Sunnyvale, CA 94088 (408) 732-0555 or 1(888
Vantis
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PAL26V12 MACH220 PALCE22V10 PALCE* programming teradyne lasar teradyne flex tester MACH221SP PQR100 100-P 16-038-PQR-1
Abstract: I/09 1/011 36 35 34 33 32 31 30 I/027 I/026 I/025 I/024 TDO GND CLK1/I1 TMS I/023 Block B £ 15 , utput Supply Voltage TDI TCK TMS TDO = Test Data In = Test Clock = Test Mode Select = Test Data Out 4 , ) O i - C M Block A 1/027 1/026 1/025 1/024 TDO GND CLK1/I1 TMS I/023 Block B I , Clock or Input GND = Ground I I/O Vcc = Input = Input/O utput = Supply Voltage TDI TCK TMS TDO = Test = , /027 1/026 1/025 1/024 TDO GND NC CLK1/I1 TMS I/023 Block B 1/022 1/021 CVJCO^IO U -
OCR Scan
4-32/MACH4LV-32 MACH111SP MACH4-32 M4-32 MACH4LV-32 M4LV-32
Abstract: ] 33 ] 32 1 31 30 ] 29 ] j 1/027 1/026 1/025 1/024 TDO GND CLK1/I1 TMS 1/023 Block B 1/010 1/011 , = Clock or Input GND I I/O < n o = Ground Input = Input/Output Supply Voltage il TDI TCK TMS TDO = , /025 1/024 TDO GND CLK1/I1 TMS 1/023 CO N CO IO 6 7 8 9 10 Block B 1/010 1/011 , Input/Output Supply Voltage TDI TCK TMS TDO = Test Data In = Test Clock = Test Mode Select = Test Data , GND GND vcc vcc I3/CLK2 I/047 I/046 I/045 I/044 I/043 I/042 1/041 I/040 I2 TMS GND GND 1/020 1 -
OCR Scan
MACH111 MACH131 PQL100

tms 3755

Abstract: cpld manual TCK 13 33 CLK1/I1 I/O8 14 32 TMS I/O9 I/O5 Block A 15 31 I/O23 , Test Clock I = Input TMS = Test Mode Select I/O = Input/Output TDO = Test Data Out , 30 29 28 27 26 25 24 23 I/O27 I/O26 I/O25 I/O24 TDO GND CLK1/I1 TMS I/O23 I/O22 I , = Ground TCK = Test Clock I = Input TMS = Test Mode Select I/O = Input , /O44 I/O43 I/O42 I/O41 I/O40 I2 TMS GND GND I/O24 I/O25 I/O26 I/O27 I/O28 I/O29 I/O30
Vantis
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cpld manual MACHpro MACH110 MACH211SP 16-038-SQ 16-038-PQT-2

HP3070

Abstract: PALCE22V10 I/O31 N/C I/O30 N/C I3 TMS GND GND Block G 1 2 3 4 5 6 7 8 9 10 11 12 13 , TCK = Test Clock I = Input TMS = Test Mode Select I/O = Input/Output TDO = , /O31 N/C I/O30 N/C I3 TMS Block G 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 , TDI = Test Data In GND = Ground TCK = Test Clock I = Input TMS = Test Mode , (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out (TDO). The MACH221SP can be employed in
Vantis
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PALCE26V12 HP3070 MACH221SP-7/10/12/15

Vantis PRO PROGRAMMING SW

Abstract: VANTIS PRO GND Vcc Vcc I3/CLK2 1/047 1/046 1/045 1/044 1/043 1/042 1/041 1/040 I2 TMS GND GND , GND = Ground TDO = Test D ata Out I = Input TMS = Test Mode Select I/O = Input , /CLK2 I/047 I/046 I/045 I/044 I/043 I/042 1/041 I/040 I2 TMS CM CN o o O T OO iC-OC MC O , TDO = Test Data Out I = Input TMS = Test Mode Select I/O = Input/O utput TCK , (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out (TDO). The MACH131SP can be deployed in
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OCR Scan
Vantis PRO PROGRAMMING SW VANTIS PRO PALCE26V16 MACH231SP MACH131SP-5/7/10/12/15 16-038-PQ

bpi400

Abstract: teradyne flex tester /O 24 - 11 35 ] TDO 12 34 ] GND 13 33 ] CLK1/I1 14 32 ] TMS 15 31 ] I/O 23 - 16 30 ] I/O , /O = Input/Output Vqq = Supply Voltage TDI = Test Data In TCK = Test Clock TMS = Test Mode Select , I/024 â'" TDO GND CLK1/I1 TMS I/023 â'" I/022 I/021 Block B Block C 20405d-3 PIN DESIGNATIONS CLK/I = Clock or Input TDI = Test Data In GND = Ground TCK = Test Clock I Input TMS = Test Mode , through four JTAG pins: Test Mode Select (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out
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OCR Scan
bpi400 FLEX-700 LA 7522 ISP-14 machpro 1,1 lhir 211SP-6/7/10/12/15 MACH21 MACH211SP-6/7/10/12/15 ACH211SP-6/7/10/12/15 PQT044 PQT44
Abstract: I2 TMS GND GND ^rincoi^opg)o^- o Q Q o^co^r i oc oi ^ooo) cvj cvj (M (MCVJCVJ co £> O â'˜Tâ , TCK = Test Clock I = Input TMS = Test M ode Select I/O = In p u t/O u tp u t v , â'"i 1/046 1/045 1/044 1/043 1/042 1/041 1/040 â'" I2 TMS o o m ( o r ^ o o o o - i - , = G round TCK = Test Clock I = Input TMS = Test M ode Select I/O = In p u t , accomplished through four JTAG pins: Test Mode Select (TMS), Test Clock (TCK), Test Data In (TDI), and Test -
OCR Scan
PALCE32V16 M4-128 ACH231SP-10/12/15

MACHpro

Abstract: HP3070 /CLK3 GND GND VCC VCC I3/CLK2 I/O47 I/O46 I/O45 I/O44 I/O43 I/O42 I/O41 I/O40 I2 TMS GND , Ground TDO = Test Data Out I = Input TMS = Test Mode Select I/O = Input/Output , TMS GND GND I/O24 I/O25 I/O26 I/O27 I/O28 I/O29 I/O30 I/O31 NC VCC GND GND VCC I/O32 , TDI = Test Data In GND = Ground TDO = Test Data Out I = Input TMS = Test Mode , software. Programming is accomplished through four JTAG pins: Test Mode Select (TMS), Test Clock (TCK
Vantis
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ALL-07 PROGRAMMER pic
Abstract: 32 ] TMS I/0 9 E 15 31 ] 1/023 1/010 Q 16 30 ] 1/022 Q 17 29 ] 1 , = Clock or Input TDI = Test Data In GND = G round TCK = Test Clock Input TMS , ¡ â¡ 1/027 1/026 1/025 1/024 â'" TDO GND CLK1/I1 TMS 1/023 â'" â¡ 1/022 â¡ 1/021 , DESIGNATIONS CLK/I = Clock or Input TDI = Test GND = G round TCK = Test Input TMS = , four JTAG pins: Test Mode Select (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out (TDO). -
OCR Scan
ACH211SP-7/10/12/15
Abstract: TMS = Test M ode Select TDO = Test Data O ut il < n n 4 = In p u t/O u tp u t I4/CLK2 1/035 â'" 1/034 1/033 o 1/032 o 1/031 m N/C I/030 â'"1 N/C 1 3 TMS GND GND , 1/033 1/032 1/031 N/C 1/030 â'"I N/C I3 TMS o o m , TMS = Test M ode Select I/O = In p u t/O u tp u t TDO = Test Data O ut v cc = , . Programming is accomplished through four JTAG pins: Test Mode Select (TMS), Test Clock (TCK), Test Data In -
OCR Scan
ACH221SP-7/10/12/15

MACHpro

Abstract: MACH programming /O44 I/O43 I/O42 I/O41 I/O40 I2 TMS GND GND Block G 1 2 3 4 5 6 7 8 9 10 11 12 , In TCK = Test Clock TMS = Test Mode Select TDO = Test Data Out MACH231SP-10/12/15 , /O46 I/O45 I/O44 I/O43 I/O42 I/O41 I/O40 I2 TMS Block G 1 2 3 4 5 6 7 8 9 10 11 , /Output Supply Voltage TDI = Test Data In TCK = Test Clock TMS = Test Mode Select , accomplished through four JTAG pins: Test Mode Select (TMS), Test Clock (TCK), Test Data In (TDI), and Test
Vantis
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MACH programming

MACH111SP

Abstract: HP3070 TMS I/O9 15 31 I/O23 Block A I/O10 16 30 I/O22 I/O11 17 29 , TCK = Test Clock I = Input TMS = Test Mode Select I/O = Input/Output TDO = , 26 25 24 23 I/O27 I/O26 I/O25 I/O24 TDO GND CLK1/I1 TMS I/O23 I/O22 I/O21 I/O12 I , TMS = Test Mode Select I/O = Input/Output TDO = Test Data Out VCC = Supply Voltage , (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out (TDO). The MACH111SP can be employed in
Vantis
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MACH111SP-5/7/10/12/15

STR F 6168

Abstract: 1 - bit full adder multisim 1/041 1/040 I2 TMS GND GND O o o m o o m cn o m C cj C noo ) co r: o V v , Clock TMS Test Mode Select TDO Test D ata Out GND = Ground I = Input I/O = , 1/046 1/045 1/044 o o 1/043 m 1/042 1/041 I/040 â'"1 1 2 TMS , = Test Clock I Input TMS = Test Mode Select I/O Input/O utput V, oc Supply , software. Programming is accomplished through four HAG pins: Test Mode Select (TMS), Test Clock (TCK
Vantis
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STR F 6168 1 - bit full adder multisim grid tie inverters circuit diagrams HI-LO ALL-07 PAL 007 B PAL 007 c 175MH 17466E-059 17466E-060 17466E-061 PQR144 144-P
Abstract: 31 2 30 2 29 2 28 j I/027 I/026 I/025 I/024 TDO GND CLK1/I1 TMS I/023 I/022 1/021 211 20B -2 , Input = In p u t/O u tp u t TDI TCK TMS TDO = Test D ata In = Test Clock = Test Mode Select Test D ata O , /010 1/011 33 32 31 30 29 28 27 26 25 24 23 1/027 I/026 I/025 I/024 TDO GND CLK1/I1 TMS I/023 1 , CLK/I = Clock or Input GND I I/O = G round Input = In p u t/O u tp u t TDI TCK TMS TDO = Test = Test = , software. Program m ing is accom plished through four JTAG pins: Test M ode Select (TMS), Test Clock (TCK -
OCR Scan

Vantis PRO PROGRAMMING SW

Abstract: VANTIS JTAG 13 33 CLK1/I1 I/O8 14 32 TMS I/O9 15 31 I/O23 I/O10 16 30 I , Clock I = Input TMS = Test Mode Select I/O = Input/Output TDO = Test Data Out , TMS I/O23 I/O22 I/O21 I/O12 I/O13 I/O14 I/O15 VCC GND I/O16 I/O17 I/O18 I/O19 I/O20 , Test Data In GND = Ground TCK = Test Clock I = Input TMS = Test Mode Select I/O , (TMS), Test Clock (TCK), Test Data In (TDI), and Test Data Out (TDO). The MACH211SP can be deployed in
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OCR Scan
VANTIS JTAG RALCE26V16 ACH111SP-5/
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