500 MILLION PARTS FROM 12000 MANUFACTURERS

DATASHEET SEARCH ENGINE

Top Results

Part Manufacturer Description Datasheet BUY
ADVANCED_BQMTESTER Texas Instruments Texas Instruments Advanced bqMTester Multi-Station Test and Program Board visit Texas Instruments
PMP3866 Texas Instruments Sync Buck for Hard Drive Tester 5V@5A and 3.3V@5A visit Texas Instruments

credence tester

Catalog Datasheet MFG & Type PDF Document Tags

credence tester

Abstract: DS1868 capability to test the DS1267, DS1867, DS1868, and DS1869 on an STS5000 Credence tester. All package styles , : Testing on the Credence tester is expected to begin work week 9646. No marking changes will be made to , DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244­3292 (214) 450­0400 Date: October 31, 1996 Subject: PRODUCT CHANGE NOTICE ­ J61801 Description: TESTER , product to a new test system includes extensive correlation activity between the old and new tester. This
-
Original
credence tester ON SEMICONDUCTOR TRACEABILITY

credence tester

Abstract: ON SEMICONDUCTOR TRACEABILITY to the Credence SC212 test system. The SC212 is a newer and higher performance tester than the STS , DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244­3292 (214) 450­0400 Date: September 9, 1996 Subject: PRODUCT CHANGE NOTICE ­ H62201 Description: New Tester , traceability to the test equipment used on all products. Qualification Status: The new tester is being , ) were tested on the new tester and QC tested on the old tester with no failures. For further
-
Original
DS5000

JM7000

Abstract: ltx credence tester Credence D10 · Memory Test - Teradyne J937 and J997 · Linear Test Systems LTX TS80 · Semitek Discrete , · Sophisticated Automated Bench Tester FULL STATIC/DYNAMIC BURN-IN · Burn-in Boards in Stock ·
Micross Components
Original
JM7000 ltx credence tester ltx ts80 teradyne flex tester optocoupler NAND j937 MIL-PRF-38535 MIL-PRF-38534 MIL-STD-883 AS9100

ambit rev 4

Abstract: Checklist . _ Each vector set has been run with tester loading on all output/bidi pins. (The simulated tester was the (Credence LT, Trillium) _) (Tester loading values must be provided, corner file =
-
Original
ambit rev 4 Checklist cycle count worksheet

costello altera

Abstract: : _ _ Specify tester (Credence, Sentry, Trillium) and loading that was used in simulation: *C , ) range with appropriate system and tester loading. *C _ For ASIC conversions merging multiple , all signals that required active pull-ups in simulation. *C - Tester loading simulation not required
Atmel
Original
costello altera

credence tester

Abstract: SENTRY-21 Automatic Test Equipment (ATE) memory size limit. · Cycle Count < (tester cycle limit) ­ (total functional , be within tester limits. · Must pass Rule Analyzer test vector checking tool. Parametric DC Test , simulation results. Tester Accuracy of +1ns per pin must be accounted for. No same cycle paths may be , eventually the production components. To ensure that the test vectors provided will conform to tester , vectors in a variety of formats, and provide a pass/fail indication of tester acceptability. If they
Atmel
Original
SENTRY-21

INCOMING RAW MATERIAL INSPECTION checklist

Abstract: AVR Cores - Complex ASIC Cores - Software functionally exercised, and waveform timing relationships can be implemented on tester hardware. The Atmel
Atmel
Original
ATL60 INCOMING RAW MATERIAL INSPECTION checklist AVR Cores - Complex ASIC Cores - Software ATMEL 311 ATLS60 atmel 424 ARM920TTM ARM946E-S MIPS64TM

atmel 532

Abstract: atmel 906 high-performance digital tester. Combinations of parametric, functional and structural tests, defined for digital , nodes so that functional and/or parametric testing can be performed. Since a digital tester must control , functionally exercised, and waveform timing relationships can be implemented on tester hardware. The Atmel
Atmel
Original
ATL25 ARM920T atmel 532 atmel 906 2042A atmel 706 ATMEL 712 dsp oak pine ARM946E-STM

ltx credence tester

Abstract: AMI 602 . 16 Mixed Signal Guts.QXD 6/16/99 3:26 PM Page 17 TESTER CAPABILITY Analog Systems Tester Capabilities Credence STS 3500 LTX Synchro Digital Specifications Pin Count 24 48 , test solutions using one of two tester platforms: Credence STS3500 or LTX Synchromaster. An
AMI Semiconductor
Original
AMI 602 verilog code for UART with BIST capability military relay R80186 AMI MG82C54 GA99045 CX6/99

ATMEL 634

Abstract: ST ARM CORE 1825 functionally exercised, and waveform timing relationships can be implemented on tester hardware. The Atmel
Atmel
Original
ATL18 ATMEL 634 ST ARM CORE 1825 2043A ARM CORE 1825 ATMEl 837

Atmel 826

Abstract: atmel 952 that the manufactured device will be tested on a high-performance digital tester. Combinations of , testing can be performed. Since a digital tester must control all the clocks during the testing of an , relationships can be implemented on tester hardware. The Atmel netlist checker, DoubleCheckTM, identifies
Atmel
Original
ATL35 Atmel 826 atmel 952 Atmel 642 sbl 20100 atmel 530

ATMEL 311

Abstract: atmel 424 be implemented on tester hardware. The Atmel netlist checker, DoubleCheck, identifies common design
Atmel
Original
assembly language programs for dft 5003b atmel 228 atmel atl 5003B-ASIC

fpga orcad schematic symbols

Abstract: ATL60 : _ _ Specify tester (Credence, Sentry, Trillium) and loading that was used in simulation , (derating) range with appropriate system and tester loading. *C _ For ASIC conversions merging multiple , all signals that required active pull-ups in simulation. *C - Tester loading simulation not required , simulations pass all requested conditions using estimated wire loads and both system and tester loads. _ , Revision 2.8 1996/02/08 19:16:52 uehara # added system and tester loads for logic sims and system loads
Atmel
Original
fpga orcad schematic symbols

0805 X7R 104

Abstract: PN2271 mm chip Flex (mm) 1.6 mm 90mm Figure 4 Tester Figure 2. Board Dimensions the center , already some history established with our tester and we were locked into testing for specific customers , confidence in the analysis. Sample groups of 100 give even greater credence to the results and are preferred
-
Original
PN-2271 0805 X7R 104 PN2271 LX 2271 100PPM LX 1206 F-2110

DIGITAL IC TESTER report for project

Abstract: 0.18-um CMOS technology characteristics features. · Test program in compliance with Atmel tester rules. 10 ATC18RHA 4261B­AERO­06/05 , either onto the wafer or after the dice are packaged. The Credence Octet test equipment is used for this , be tested on a high performance digital tester. Combinations of parametric, functional, and , a digital tester must control all the clocks during the testing of chip, provision must be made for
Atmel
Original
DIGITAL IC TESTER report for project 0.18-um CMOS technology characteristics atmel13 IO33 ATMEL 644 IO33 ATC18RHA

DIGITAL IC TESTER report for project

Abstract: atmel 504 bonding diagrams and package features. · Test program in compliance with Atmel tester rules. 10 , development phase is applied either onto the wafer or after the dice are packaged. The Credence Octet test , performance digital tester. Combinations of parametric, functional, and structural tests, defined for digital , nodes so that functional and/or parametric testing can be performed. Since a digital tester must control
Atmel
Original
4261C atmel 504 virage

DIGITAL IC TESTER report for project

Abstract: MCGA349 features. · Test program in compliance with Atmel tester rules. The final agreement for processing the , either onto the wafer or after the dice are packaged. The Credence Octet test equipment is used for this , be tested on a high performance digital tester. Combinations of parametric, functional, and , a digital tester must control all the clocks during the testing of chip, provision must be made for
Atmel
Original
5962-06B02 MCGA349 PL33RXZ MQFP-T352 LVPECL atmel pl33rxz 4261E

DIGITAL IC TESTER report for project

Abstract: IO33 features. · Test program in compliance with Atmel tester rules. The final agreement for processing the , either onto the wafer or after the dice are packaged. The Credence Octet test equipment is used for this , be tested on a high performance digital tester. Combinations of parametric, functional, and , a digital tester must control all the clocks during the testing of chip, provision must be made for
Atmel
Original
4261F MQFP-F196 Genesys Logic atmel 216

0805 X7R 104

Abstract: 1206 X7R 104 curvaideal arc consistent radius Flex (mm) 90 mm Figure 4. "zero" adj Tester actual arc , credence to the results and are preferred when comparing process or material variations that might lead
KEMET
Original
JIS-C-6429 1206 X7R 104 RC-3402 1206 capacitor chip pads layout EIAJ-RC3402 CRACK

atmel 952

Abstract: 2041b manufactured device will be tested on a high-performance digital tester. Combinations of parametric , performed. Since a digital tester must control all the clocks during the testing of an ASIC, provisions , , pins are functionally exercised, and waveform timing relationships can be implemented on tester
Atmel
Original
2041b IFR 840 Transistor Equivalent list po55 po55 Implementation AVR by verilog OAI22 2041B
Showing first 20 results.