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OP470ATC/883 Datasheet

Part Manufacturer Description PDF Type
OP470ATC/883 Analog Devices OP470 - IC QUAD OP-AMP, 600 uV OFFSET-MAX, 6 MHz BAND WIDTH, CQCC28, LCC-28, Operational Amplifier Original
OP470ATC/883 Analog Devices Very Low Noise Quad Operational Amplifier Scan
OP-470ATC/883 Analog Devices VERY LOW NOISE QUAD OPERATIONAL AMPLIFIER Scan
OP470ATC/883C Analog Devices Very Low Noise Quad Operational Amplifier Original

OP470ATC/883

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: _XIND - OP470AHC/863 OP470ATC/883 -IN D ♦ IN A ( T à T ] +IND v.|T 3 +IN A , -27. 3 I7 IW N R N . For devices processed in total compliance to MIL-STD-883, add /883 after part -
OCR Scan
0P-470 OP-470 OP-27 14-PH OP470AY OP470FY

pmi op11

Abstract: OP-47C (|iV) 14-PIN PLASTIC LCC* RANGE 400 OP470ARC/883 MIL 400 OP470AY* - OP470ATC/883 MIL 400 OP470EY - - , total compliance to MIL-STD-883, add /883 after part number. Consult factory for 883 data sheet. t
-
OCR Scan
OP470GP OP-47C pmi op11 pmi op400 5 band graphic equalizer operational amplifier OP47C TAPEHEAD OP470ARC/883 OP47QGS MIL-STD-883 N4148

QP-470

Abstract: CJP-470 _PACKAGE_ OPERATING V0SMAX CERDIP TEMPERATURE QtV) 14-PIN PLASTIC LCC* RANGE 400 OP470ARC/883 Ml 400 OP470AV - OP470ATC/883 MIL 400 OP47DEY IND 800 OP47OFY - - IND 1000 - OP470GP - XIND 1000_OP47QGS»_-_XIND â'¢ For devices processed in total compliance to MIL-STD-883, add /883 after part number. Consult factory for 883 data sheet. t Burn-in is available on commercial and industrial temperature range parts in
-
OCR Scan
QP-470 CJP-470 RESISTOR 470g of la 7830 pin 7028c

PMI OP470

Abstract: OP470EY OP470ARC/883 400 OP470AY* OP470ATC/883 400 OP470EY 800 OP470FY 1000 OP470GP 1000_ - _ OP47QGS , processed in total compliance to MIL-STD-883, add /883 after part number. Consult factory for 883 data sheet
-
OCR Scan
PMI OP470

0p-470

Abstract: D 400 400 OP470AY* 400 OP470EY 800 OP470FY 1000 1000_ · t tt OP470ARC/883 MIL OP470ATC/883 MIL IND IND OP470GP XIND OP47QGS»_- _ XIND - ; n B l~i~ OUT B [ T I] Q , (P-Suffix) T t z t S* g T z For devices processed in total compliance to MIL-STD-883, add /883 after part number. Consult factory for 883 data sheet. Burn-in is available on commercial and
-
OCR Scan
Abstract: OP470EY 800 OP470FY 1000 1000_ ` t tt OP470ARC/883 MIL OP470ATC/883 MIL IND IND OP470GP XIND , total compliance to MIL-STD-883, add /883 after part number. Consult factory for 883 data sheet, Burn-in -
OCR Scan
P-470

P470A

Abstract: 400 CIP470AY* 400 OP470EY 800 OP470FY 1000 1000_ ` t tt OP470ARC/883 MIL OP470ATC/883 MIL , -PIN P L A S T IC M IN I-D IP (P-Suffix) For devices processed in total compliance to MIL-STD-883, add /883 after part number. Consult factory for 883 data sheet, Burn-in is available on commercial and
-
OCR Scan
P470A

QP-470

Abstract: OP470FY PMI v .[T * | - E 400 OP470ARC/883 MIL 400 OP470AY* OP470ATC/883 MIL 400 OP470EV IND 800 OP470FY IND
-
OCR Scan
OP470FY PMI
Abstract: (CERDIP) 28-contact hermetic leadless chip carrier (LCC) Part Number OP-470AY/883 OP-470ATC/883 Package Y , ).±1V OP-470 TABLE 1 Vg = ±15V; Rg = 50n; TA = T j = 2 5 ` C unless otherwise specified. OP-470/883 , specified. OP-470/883 LIMITSA Characteristics Supply Current (Note 2) Symbol Spécial Conditions No Load No , limit = total all foutf amplifiers. TABLE 2 OP-470/883 Electrical Test Requirements For Class B Devices MIL-STD-883 Test Requirements Subgroups (see Table 3) Interim Electrical Parameters (pre -
OCR Scan
MIL-M-38510 OP-470AY/883 OP-470/883 28-LEAD
Abstract: Part Number specification follow: Package OP-470AY/883 OP-470ATC/883 Y TC C a se O , OP-470/883 VERY LOW-NOISE QUAD OPERATIONAL AMPLIFIER P r e c isio n M o n o lit h ic * Inc , TABLE 1 V g = ±15V; R g = 50n; = T j = 2 5 'C unless otherwise specified. O P-470/883 LIMITS A , -470/883 LIMITS A Sym b ol S p e c ia l C o n d itio n s S u p p ly C u rre n t 'S Y No Load , OPERATIONAL AMPLIFIER D_ TABLE 2 O P-470/883 E le c tric a l -
OCR Scan
MIL-M-385101 D0210-01E 0210-01E
Abstract: OP-470AY/883 OP-470ATC/883 Package Y TC Case Outline. Letter Y TC 1.3 Part Number , T j = 2 5 â'˜C unless otherwise specified. OP-470/883 Characteristics Sym bol Input Offset , unless otherwise specified. OP-470/883 LIMITS A Characteristics Symbol Supply Current fSY , . 2. Igy TABLE 2 OP-470/883 Electrical Test Requirements For Class B Devices MIL-STD-883 , unless otherwise specified. OP-470/883 LIMITS A Subgroup Symbol Subgroup 1 VO S Ta = +25â' -
OCR Scan

5962-8856501CA

Abstract: 5962-88565 MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A , Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test , conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883 , criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D , power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883
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OCR Scan
5962-8856501CA 5962-88565 qml-38535 5962-88565012A OP471A 5962-R193-93 5962-E264-98 T0D470 70AY/883C OP-470ARC/883C OP-470ATC/883C

5962R8856501V2A

Abstract: 5962-88565012A documentation Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B , specified in MIL-STD-883, method 1019, condition A. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY , , Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD , are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. 3 , be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to
DEPARTMENT OF DEFENSE
Original
5962-8856501V2A 5962R8856501VCA 5962R8856501V2A 5962R8856502VCA e593 CQCC1-N20 OP-470A 5962-8856502CA OP-471AY/883C OP-471ARC/883C OP-471ATC/883C 5962-8856501VCA OP470AY/QMLV

5962-8856502vda

Abstract: 5962-8856502CA requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF , MIL-STD-883, method 1019, condition A. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS , , General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-1835 - Test Method , specified in MIL-STD-883, method 1019, condition A. 3/ This parameter is not tested post-irradiation. 4 , conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883
DEPARTMENT OF DEFENSE
Original
5962R8856501VKA 5962R8856502VDA 5962-8856502vda OP471AN/QMLV(SMD) equivalent 5962-8856501VKA OP471AM CDFP2-F14 5962-8856502VDA OP471AM/QMLV 5962-8856502V2A OP471ARC/QMLV 5962-8856502VKA OP471AN/QMLV

5962L8856503VCA

Abstract: OP471AM Device requirements documentation Vendor self-certification to the requirements for MIL-STD-883 compliant , conditions specified in MIL-STD-883, method 1019, condition A. 4/ For device type 03 and 04, radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method , . DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 Test Method Standard Microcircuits. Interface , specified in MIL-STD-883, method 1019, condition A for device types 01 and 02 and condition D for device
DEPARTMENT OF DEFENSE
Original
OP470AY/QMLR 5962L8856503VCA 471A 5962-E524-11 24355 OP470ARC/QMLR OP470AN/QMLR 5962R8856502V2A 5962R8856502VKA