NEW DATABASE - 350 MILLION DATASHEETS FROM 8500 MANUFACTURERS
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| Catalog Datasheet Results | Type | Document Tags |
| Abstract: M24C64 M24C64 M24C32 64Kbit and 32Kbit Serial I²C Bus EEPROM FEATURES SUMMARY 2 s Two Wire I C Serial , SO8 (MN) 150 mil width TSSOP8 (DW) 169 mil width May 2003 1/24 M24C64 M24C64, M24C32 SUMMARY , as 8192 x 8 bits (M24C64 M24C64) and 4096 x 8 bits (M24C32). Table 1. Signal Names SCL Write Control Supply Voltage Ground SDA M24C64 M24C64 M24C32 WC VSS AI01844B AI01844B These devices are , applying any logic signal. Figure 3. DIP, SO and TSSOP Connections M24C64 M24C64 M24C32 E0 E1 E2 VSS ... | Original |
24 pages, |
M24C64 M24C32 M24C64 abstract |
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| Abstract: M24C64 M24C64 M24C32 64/32 Kbit Serial I²C Bus EEPROM s Two Wire I2C Serial Interface Supports 400 , ) and 4096x8 bits (M24C32), and operate down to 2.5 V (for the -W version), and down to 1.8 V (for the , Supply Voltage VSS M24C64 M24C64 M24C32 Serial Clock WC SCL SDA Ground January 2002 WC VSS AI01844B AI01844B 1/19 M24C64 M24C64, M24C32 Figure 2B. SO and TSSOP Connections Figure 2A. DIP Connections M24C64 M24C64 M24C32 E0 E1 E2 VSS 1 2 3 4 8 7 6 5 M24C64 M24C64 M24C32 VCC WC SCL ... | Original |
19 pages, |
Marking STMicroelectronics m24c32 M24C64 M24C32 JESD22-A114A J-STD-020A M24C64 abstract |
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| Abstract: M24C64 M24C64 M24C32 64Kbit and 32Kbit Serial I²C Bus EEPROM FEATURES SUMMARY , M24C32 M24C32 M24C32-W M24C32-W M24C32-R M24C32-R UFDFPN8 (MB) 2x3mm² (MLP) January 2005 1/26 M24C64 M24C64, M24C32 TABLE OF CONTENTS FEATURES SUMMARY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . , M24C64 M24C64, M24C32 Acknowledge in Read Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . , M24C64 M24C64, M24C32 SUMMARY DESCRIPTION These I2C-compatible electrically erasable programmable memory ... | Original |
26 pages, |
M24C64-W M24C64-R M24C64 M24C32-W M24C32-R M24C32 MLP8 2x3mm M24C64 abstract |
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| Abstract: M24C64 M24C64 M24C32 64Kbit and 32Kbit Serial I²C Bus EEPROM FEATURES SUMMARY 2 s Two Wire I C Serial , SO8 (MN) 150 mil width TSSOP8 (DW) 169 mil width October 2003 1/26 M24C64 M24C64, M24C32 , 2/26 M24C64 M24C64, M24C32 Figure 10. Read Mode Sequences . . . . . . . . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 3/26 M24C64 M24C64, M24C32 SUMMARY , as 8192 x 8 bits (M24C64 M24C64) and 4096 x 8 bits (M24C32). Table 1. Signal Names SCL SDA M24C64 M24C64 ... | Original |
26 pages, |
M24C64 M24C32 SO8W Package M24C64 abstract |
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| Abstract: M24128 M24128 M24C64 M24C64 M24C32 128 Kbit, 64 Kbit and 32 Kbit serial I²C bus EEPROM Features Two-wire , to 5.5V M24C32-W M24C32-W 2.5 V to 5.5V M24C32-R M24C32-R 1.8 V to 5.5V M24C32-F M24C32-F M24C32 M24128-BR M24128-BR , M24128 M24128, M24C64 M24C64, M24C32 Contents 1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . , . . . . . . . . . 20 M24128 M24128, M24C64 M24C64, M24C32 Contents 5 Initial delivery state . . . . . , . . . . . . . 36 3/39 List of tables M24128 M24128, M24C64 M24C64, M24C32 List of tables Table 1. ... | Original |
39 pages, |
M24128-BR M24128-BW M24C32 M24C32-W M24C64 M24C64-F M24C64-R M24C64-W Marking STMicroelectronics m24c32 M24128 M24128 abstract |
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| Abstract: M24128 M24128 M24C64 M24C64 M24C32 128 Kbit, 64 Kbit and 32 Kbit serial I²C bus EEPROM Features Supports , M24C64-F M24C64-F M24C32 M24128-BR M24128-BR M24C64-W M24C64-W M24C64 M24C64 2.5 V to 5.5V M24128-BF M24128-BF M24128 M24128 SO8 (MN , www.st.com 1 Contents M24128 M24128, M24C64 M24C64, M24C32 Contents 1 Description . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . 20 M24128 M24128, M24C64 M24C64, M24C32 Contents 5 , , M24C64 M24C64, M24C32 List of tables Table 1. Table 2. Table 3. Table 4. Table 5. Table 6. Table 7. ... | Original |
39 pages, |
M24C64-R M24C32-W M24C64 M24C64-F M24128-BW M24C64-W M24x M24128-BR SO8w package outline M24128 ufdfpn M24C32 JESD22-A114A ufdfpn8 M24128 abstract |
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| Abstract: , STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any , by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications , replaces all information previously supplied. STMicroelectronics products are not authorized for use as , STMicroelectronics. © STMicroelectronics - February 2005 - Printed in Italy - All rights reserved The STMicroelectronics corporate logo is a registered trademark of the STMicroelectronics group of companies. All other ... | Original |
12 pages, |
stmicroelectronics traceability TSOP 28 SPI memory Package flash TSOP32 AN1470 SO8 WIDE M25P16 m25pe m25pe 512 MSOP8 Part marking M45PE20 M25PXX stmicroelectronics eeprom EEPROM 16Mb datasheet abstract |
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| Abstract: M24C32 and (1011) for the M24C32-D M24C32-D. When writing data to the memory, the device inserts an acknowledge , memory array (M24C32 and M24C32-D M24C32-D), and the 4-bit device type identifier 1011b addresses the , not acknowledged (NoAck). 4.11 ECC (Error Correction Code) and Write cycling The M24C32 devices , larger amount of Write cycles. The M24C32 devices are qualified as 1 million (1,000,000) Write cycles , conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE ... | Original |
42 pages, |
M24C32-W M24C32-R M24C32 J-STD-020D M24C32-DF M24C32-F M24C32-DF abstract |
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| Abstract: , E0). The 4-bit device type identifier 1010b addresses the memory array (M24C32 and M24C32-D M24C32-D), and the , 4.11 ECC (Error Correction Code) and Write cycling The M24C32 devices identified with the process , cycles. The M24C32 devices are qualified as 1 million (1,000,000) Write cycles, using a cycling routine , to the STMicroelectronics SURE Program and other relevant quality documents. Table 6. Symbol , and fall times be more than 20 ns and less than 300 ns when fC < 400 kHz. 5. The new M24C32 device ... | Original |
42 pages, |
M24C32-DF M24C32-W M24C32-R M24C32-F M24C32-DF abstract |
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| Abstract: M24C32-R M24C32-R M24C32-F M24C32-F 1 Description The M24C32 is a 32-Kbit I2C-compatible EEPROM (Electrically Erasable , enable the execution of a WRITE command. 9. The previous M24C32 device (identified by process letter P) offers tNS = 100 ns (max), while the current M24C32 device offers tNS = 80 ns (max). Both products offer , ignored (input filter on SCL and SDA) tW tNS(3) 1. Only for M24C32 devices identified by the process ... | Original |
42 pages, |
M24C32-DF M24C32-W M24C32-R M24C32-F M24C32-DF abstract |
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| NVRAM Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which in identifier. This letter is marked after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C801 M27C801 M27C801 M27C801 revision identifier. This letter is marked after the datecode on device marking. Test Procedure MIL identifier. This letter is marked after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6655-v1.htm |
STMicroelectronics | 25/05/2000 | 70.03 Kb | HTM | 6655-v1.htm |
| MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail 1998 to March 1999 - EPROM, Flash Memory, EEPROM and NVRAM Products INTRODUCTION STMicroelectronics device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C256 M27C256 M27C256 M27C256 (D) M87C257 M87C257 M87C257 M87C257 (D) M27C after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C801 M27C801 M27C801 M27C801 letter is marked after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6655.htm |
STMicroelectronics | 20/10/2000 | 74.66 Kb | HTM | 6655.htm |
| -STD-883 -STD-883 -STD-883 -STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Operating Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Temperature,Humidity, Bias INTRODUCTION STMicroelectronics manufactures a wide range of memory types which in- clude: Non letter is marked after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Die revision identifier. This letter is marked after the datecode on device marking. Test Procedure www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6493.htm |
STMicroelectronics | 20/10/2000 | 69.54 Kb | HTM | 6493.htm |
| . Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp , EEPROM and NVRAM Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types Die revision identifier. This letter is marked after the datecode on device marking. Test Procedure datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C2001 M27C2001 M27C2001 M27C2001 (D) M27 Die revision identifier. This letter is marked after the datecode on device marking. Test www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6493-v3.htm |
STMicroelectronics | 25/05/2000 | 64.99 Kb | HTM | 6493-v3.htm |
| 1998 Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C02 M24C02 M24C02 M24C02 M24C04 M24C04 M24C04 M24C04 M24C08 M24C08 M24C08 M24C08 M24C16 M24C16 M24C16 M24C16 M24C32 1997 to June 1998 Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 and NVRAM Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which revision identifier. This letter is marked after the datecode on device marking. Table 5A. CMOS E5/0.6 m revision identifier. This letter is marked after the datecode on device marking. Table 5B. CMOS E5/0.6 m www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6242-v3.htm |
STMicroelectronics | 25/05/2000 | 64.11 Kb | HTM | 6242-v3.htm |
| Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Operating Life Test 1005 1405C 1405C 1405C 1405C, V CC September 1998 Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail INTRODUCTION STMicroelectronics manufactures a wide range of memory types which in- clude: Non letter is marked after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Die revision identifier. This letter is marked after the datecode on device marking. Test Procedure www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6351.htm |
STMicroelectronics | 20/10/2000 | 70.45 Kb | HTM | 6351.htm |
| 1998 Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Memory, EEPROM and NVRAM Products INTRODUCTION STMicroelectronics manufactures a wide range of memory Die revision identifier. This letter is marked after the datecode on device marking. Test Procedure datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C2001 M27C2001 M27C2001 M27C2001 (D) M27 Die revision identifier. This letter is marked after the datecode on device marking. Test www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6351-v3.htm |
STMicroelectronics | 25/05/2000 | 65.91 Kb | HTM | 6351-v3.htm |
| C04 M24C08 M24C08 M24C08 M24C08 M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Samp. Fail Samp. Fail Samp. Fail 24C16 24C16 24C16 24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Temperature,Humidity, Bias CECC 90,000 855C 1997 to June 1998 - EPROM, Flash Memory, EEPROM and NVRAM Products INTRODUCTION STMicroelectronics brackets represents the Die revision identifier. This letter is marked after the datecode on device marking brackets represents the Die revision identifier. This letter is marked after the datecode on device marking www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6242.htm |
STMicroelectronics | 20/10/2000 | 68.54 Kb | HTM | 6242.htm |
| -STD-883 -STD-883 -STD-883 -STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Operating Life 1999 Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail STMicroelectronics manufactures a wide range of memory types which in- clude: Non-volatile memories: Flash memory, UV revision identifier. This letter is marked after the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 the datecode on device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C801 M27C801 M27C801 M27C801 (D) Samp www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6655-v2.htm |
STMicroelectronics | 14/06/1999 | 68.16 Kb | HTM | 6655-v2.htm |
| MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp. Fail Samp. Fail Operating September 1998 Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M24C16 M24C16 M24C16 M24C16 M24C32 M24C64 M24C64 M24C64 M24C64 Samp. Fail Samp Products INTRODUCTION STMicroelectronics manufactures a wide range of memory types which in- clude: Non device marking. Test Procedure MIL-STD-883 MIL-STD-883 MIL-STD-883 MIL-STD-883 Procedure Test Conditions M27C256 M27C256 M27C256 M27C256 (D) M87C257 M87C257 M87C257 M87C257 (D) M27C512 M27C512 M27C512 M27C512 (D represents the Die revision identifier. This letter is marked after the datecode on device marking. Test www.datasheetarchive.com/files/stmicroelectronics/stonline/books/ascii/docs/6351-v1.htm |
STMicroelectronics | 02/04/1999 | 64.07 Kb | HTM | 6351-v1.htm |