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MIL-R-55342

Catalog Datasheet MFG & Type PDF Document Tags

MIL-R-55342

Abstract: MIL-R-55342/07 Qualified to MIL-R-55342 Passivated TaNFilm element Wrap around termination Performance exceeds MIL-R-55342 , , Tantalum Nitride film insure ongoing environmental and long term life stability surpassing all MIL-R-55342 , - MIL-R-55342/07 W0805 - MIL-R-55342/06 Style RM1206 Style RM0705 Tolerance , 07 Commercial Commercial Commerical MIL-R-55342 MIL-R-55342 Code % = ±0.1% = ±.25% = Â
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MIL-R-55342/07 W1206 125KQ MIL-R-55342/06
Abstract: DRIFT TESTS CONDITIONS MIL-R-55342 C MIL-STD-702-Method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 and 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 and 4.7.8 MIL-STD-202-Method 106 MIL-R-55342 C PARA 3.11 and 4.7.6 MIL-R-55342 C 2000 h Pn at 70 °C MIL-STD-202-Method 108 MIL-R-55342 Vishay Sfernice
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R0028
Abstract: ±2.0% AR Max. 95% Minimum Coverage METHOD MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 Par. Par. Par. Par. Par. Par. Par. Par. 4.7.3 4.7.4 -
OCR Scan
CR1210 500PPM RS-481 1002JCDA

CR08051002JVCA

Abstract: MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342
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CR08051002JVCA CR0805
Abstract: TESTS CONDITIONS MIL-R-55342 C MIL-STD-702-Method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 & 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 & 4.7.8 MIL-STD-202-Method 106 MIL-R-55342 C PARA 3.11 & 4.7.6 MIL-R-55342 C 2000 hours Pn at 70°C MIL-STD-202-Method 108 MIL-R-55342 Vishay Sfernice
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IPC-7351A

Abstract: smd 0705 100 8 mm PERFORMANCE VALUES AND DRIFT TESTS CONDITIONS MIL-R-55342 REQUIREMENTS ± 0.25 % ± 0.10 % , time overload Low temperature operation Resistance to solder heat MIL-R-55342 C MIL-STD-702-Method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 and 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 and 4.7.8 MIL-STD-202-Method 106 MIL-R-55342 C PARA 3.11 and 4.7.6 MIL-R-55342
Vishay Sfernice
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IPC-7351A smd 0705 vishay 0603 SMD resistors SMD code 306 vishay 0805 SMD resistors 2002/95/EC

MIL-R-55342

Abstract: RM1206 MODEL TNPWM Thin Film Chip Resistors Military/Established Reliability MIL-R-55342/7 Qualified, Type RM, Precision FEATURES · Internationally standardized size · Meets requirements of MIL-R-55342 · Established Reliability - Verified failure rate (contact factory) · Operating temperature range is - 55°C to + , ±0.1% MILITARY RESISTANCE MIL-R-55342 SHEET RANGE TYPE NUMBER CHAR. TOLERANCE (Ohms) R M 1206 07 H E , . INDICATING MIL-R-55342 CHARACTERISTIC 07 MIL SPEC. SHEET NUMBER (STYLE) B TERMINATION MATERIAL 1B00
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MIL-R-55342/7 D55342 25PPM/ 50PPM/

MIL-R-55342

Abstract: 1R00 MIL-R-55342 REQUIREMENTS TYPICAL PERFORMANCES MIL-R-55342 C MIL-STD-702-Method 107 ± 0.25 % ± 0.02 % Short time overload MIL-R-55342 C PARA 3.10.4.7.5 ± 0.10 % ± 0.01 % Low temperature operation MIL-R-55342 C PARA 3.9 & 4.7.4 ± 0.25 % ± 0.01 % Resistance to solder heat MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 ± 0.25 % ± 0.04 % Moisture resistance MIL-R-55342 C PARA 3.13 & 4.7.8 MIL-STD-202-Method 106 ± 0.40 % ± 0.01 % MIL-R-55342 C PARA 3.11 & 4.7.6
Vishay Sfernice
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1R00 MIL-STD-202-M L0805K1R00GBT0028

MIL-R-55342

Abstract: resistance High temperature Load life Revision: 04-Sep-14 CONDITIONS MIL-R-55342 REQUIREMENTS TYPICAL PERFORMANCES MIL-R-55342 C MIL-STD-702, method 107 ± 0.25 % ± 0.02 % MIL-R-55342 C PARA 3.10.4.7.5 ± 0.10 % ± 0.01 % MIL-R-55342 C PARA 3.9 and 4.7.4 ± 0.25 % ± 0.01 % MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 ± 0.25 % ± 0.04 % MIL-R-55342 C PARA 3.13 , h - Max. < 0.5 % + 0.05  MIL-R-55342 C PARA 3.11 and 4.7.6 ± 0.20 % ± 0.075 %
Vishay Sfernice
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AEC-Q200 L0603 L0805 L1206 L1505 2011/65/EU
Abstract: Teat Method MIL-STD-202, Method 107, -55°C to +125°C, 5 cycles MIL-R-55342 n 4.7.4, 1 hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 it 4.7.6, 100 hours @ 125°C MIL-R-55342 it 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 7 C4.7.7, 260°C for 10 seconds 2mm min. deflection in either direction for -
OCR Scan
Abstract: MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 MIL-R-55342 -
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CR1206
Abstract: 140 100 8 mm PERFORMANCE VALUES AND DRIFT TESTS CONDITIONS MIL-R-55342 REQUIREMENTS ± 0.25 % ± , Short time overload Low temperature operation Resistance to solder heat MIL-R-55342 C MIL-STD-702, method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 and 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 and 4.7.8 MIL-STD-202, method 106 ± 0.40 % ± 0.01 % Moisture resistance AEC-Q200 85 °C/85 % RH/0.1 Pn 1000 h High temperature MIL-R-55342 C PARA 3.11 and 4.7.6 MIL-R-55342 Vishay Sfernice
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Abstract: minutes Mil-Std-202 Method 107B -65 +125 C Mil-R-55342 par. 4.7.5 Mil-R-55342 par. 4.7.6 *TCR down to 50 milliohms typ ica lly" 65 to + 125 C Mil-R-55342 par. 4.7.8 Mil-R-55342 par. 4.7.10 70°C Rated Power Mil-R-55342 par. 4.7.4 Mil-Std-202 Method 210 Molten Solder 250 C 3 0 0 \i S g c 1 m Sec -
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LR1206 LR2010 LR2512

MIL-R-55342

Abstract: WQ80 Qualified to MIL-R-55342, Char. E, H, K, & M Passivated TaNFilm® element Wrap around termination TCR to 5 , ongoing environmental and long term life stability surpassing all MIL-R-55342 requirements by a wide , MIL-R-55342 ; Char. E 0.10% 0.10% 0.10% 0.10% 0,20% 0.20% 0.50% PFC I 206 Perforn ance Typical 0 0 2 , litllS ilt U HOW TO ORDER: Sample Part No.: Model -W1206 - MIL-R-55342/07 Style RM1206 W0805 - MIL-R-55342/06 Style RM0705 Terminal Designator R=Solder Coated Characteristic CODE 01 02
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WQ80 W1206R-03 RS481 W12UG WQ80510
Abstract: '¢ â'¢ â'¢ â'¢ Qualified to MIL-R-55342 Passivated TaNFilm element Wrap around termination Performance exceeds MIL-R-55342 characteristic E 8 mm reel packaging standard TCR to 10 ppm/°C Tolerance , , Tantalum Nitride film insure ongoing environmental and long term life stability surpassing all MIL-R-55342 , MIL-R-55342/07 Style RM1206 W0805 - MIL-R-55342/06 Style RM0705 T i Jc t L 4 0 volts max , ARper MIL-R-55342 Char. E 5 - 500K T o y a q 7 ft4 1 1 -1 RRO â'¢ T p I' S1 ?-Qq?-7Qnn â -
OCR Scan

rm-1005

Abstract: MODELS RCM, RCWPM, RCWM Thick Film Chip Resistors Military/Established Reliability MIL-R-55342/2 , hybrid circuitry â'¢ Variety of termination materials â'¢ Meets requirements of MIL-R-55342 â , % screen tested per Group A, Subgroup 1 of MIL-R-55342 CODE LETTERS (Tol. & M ultipliers) STANDARD , MIL-R55342 RCM, RCWPM, STYLE RCWM -550 RM0505 02 S, R, T, U, B. C -5100 RM1005 03 S , -2010 RCM-2512 RCWPM/RCWM-2512 RCM-1100 RCWPM/RCWM-1100 MIL-R-55342 STYLE RM0505 RM0505 RM1005
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rm-1005 MIL-R-55342/2/3/4/5/6/7/8/9/10 RM1505 RM2008 RM2010 RM2512 RM1010

1R00

Abstract: AND DRIFT TESTS CONDITIONS MIL-R-55342 C MIL-STD-702-Method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 and 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 and 4.7.8 MIL-STD-202-Method 106 MIL-R-55342 C PARA 3.11 and 4.7.6 MIL-R-55342 C 2000 h Pn at 70 °C MIL-STD-202-Method 108 MIL-R-55342 REQUIREMENTS ± 0.25 % ± 0.10 % ± 0.25 % ± 0.25 % TYPICAL PERFORMANCES ± 0.02 % ± 0.01
Vishay Sfernice
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MIL-R-55342

Abstract: TESTS CONDITIONS MIL-R-55342 C MIL-STD-702-Method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 & 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 & 4.7.8 MIL-STD-202-Method 106 MIL-R-55342 C PARA 3.11 & 4.7.6 MIL-R-55342 C 2000 hours Pn at 70°C MIL-STD-202-Method 108 MIL-R-55342
Vishay Sfernice
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MIL-STD-702-M
Abstract: MIL-R-55342 REQUIREMENTS TYPICAL PERFORMANCES MIL-R-55342 C MIL-STD-702-Method 107 ± 0.25 % ± 0.02 % Short time overload MIL-R-55342 C PARA 3.10.4.7.5 ± 0.10 % ± 0.01 % Low temperature operation MIL-R-55342 C PARA 3.9 & 4.7.4 ± 0.25 % ± 0.01 % Resistance to solder heat MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 ± 0.25 % ± 0.04 % Moisture resistance MIL-R-55342 C PARA 3.13 & 4.7.8 MIL-STD-202-Method 106 ± 0.40 % ± 0.01 % MIL-R-55342 C Vishay Sfernice
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RM1206 vishay

Abstract: MIL-R-55342 MODELS RCM, RCWPM, RCWM Thick Film Chip Resistors Military/Established Reliability MIL-R-55342/2/3 , circuitry · Meets requirements of MIL-R-55342 · Established reliability - Verified failure rate (contact factory) · Operating temperature range is - 55°C to + 150°C STANDARD ELECTRICAL SPECIFICATIONS MIL-R-55342 , , Subgroup 1 of MIL-R-55342 · Variety of termination material · One-surface and wraparound terminations · 95 , -1206 RCWPM/RCWM-1206 RCM-2010 RCWPM/RCWM-2010 RCM-2512 RCWPM/RCWM-2512 RCM-1100 RCWPM/RCWM-1100 MIL-R-55342
Vishay Dale
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RM1206 vishay RCWM-550 RCWM-5100 RCWM-5150 RCWM-7225 RCWM-575 RCWM-1206

CN1E4K

Abstract: MIL-R-55342 1,000 M Minimum Test Method MIL-STD-202, Method 107, -55°C to +125°C, 5 cycles MIL-R-55342 4.7.4, 1 hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 125°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7, 260°C for 10 seconds 1.2 Kg for 1 minute 5mm
KOA Speer Electronics
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CN1E4K RK73
Abstract: , 5 cycles MIL-R-55342 4.7.4, 1 hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 125°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7, 260°C for 10 seconds 1.2 KOA Speer Electronics
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2005/95/EC
Abstract: Method MIL-STD-202, Method 107, -55°C to +125°C, 5 cycles MIL-R-55342 4.7.4, 1 hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 125°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7, 260°C for 10 seconds 2mm min. deflection in either direction for 10 seconds KOA Speer Electronics
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CNB2E5Z

Abstract: MIL-R-55342 -202, Method 107, -55°C to +125°C, 5 cycles MIL-R-55342 4.7.4, 1 hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 125°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7
KOA Speer Electronics
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CNB2E5Z

2D 1002

Abstract: RH 2D 1002 10,000 M Test Method MIL-STD-202, Method 107, -55°C to +155°C, 5 cycles MIL-R-55342 4.7.4, 1 Hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 155°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7, 260°C for 10 seconds 2.5 x RCWV, not exceeding maximum overload
KOA Speer Electronics
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2D 1002 RH 2D 1002 MARKING 2d 1002 RN412 EIAJ-8009 EIA-PDP-100

CND2A10Y

Abstract: cycles MIL-R-55342 4.7.4, 1 hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 125°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7, 260°C for 10 seconds 1.2 Kg for
KOA Speer Electronics
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CND2A10Y 2B10V 1J10Y 2A10Y 1J10K CND1J10K
Abstract: ±1.0% Test Method MIL-STD-202, Method 107, -55°C to +155°C, 5 cycles MIL-R-55342 4.7.4, 1 Hour @ -55°C followed by 45 minutes of RCWV* MIL-R-55342 4.7.6, 100 hours @ 125°C MIL-R-55342 4.7.5, 2.5 x RCWV for 5 seconds MIL-R-55342 4.7.7, 260°C for 10 seconds 2mm min. deflection in either direction for KOA Speer Electronics
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SS-251

vishay CHP

Abstract: 140 100 8 mm PERFORMANCE VALUES AND DRIFT TESTS CONDITIONS MIL-R-55342 REQUIREMENTS ± 0.25 % ± , Short time overload Low temperature operation Resistance to solder heat MIL-R-55342 C MIL-STD-702, method 107 MIL-R-55342 C PARA 3.10.4.7.5 MIL-R-55342 C PARA 3.9 and 4.7.4 MIL-R-55342 C PARA 3.12, 4.7.7, 4.7.1.2 MIL-R-55342 C PARA 3.13 and 4.7.8 MIL-STD-202, method 106 ± 0.40 % ± 0.01 % Moisture resistance AEC-Q200 85 °C/85 % RH/0.1 Pn 1000 h High temperature MIL-R-55342 C PARA 3.11 and 4.7.6 MIL-R-55342
Vishay Sfernice
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vishay CHP
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