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MMBZ5238BW

Abstract: zener 7.5 B 49 sot 323 25 27 30 REV. 0, May-2009, KSJR10 Notes: 1. Short duration test pulse used to minimize
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MMBZ5238BW zener 7.5 B 49 sot 323 MMBZ52 J-STD-020D 2002/95/EC MMBZ5221BW
Abstract: 3.0 3.5 4.0 5.0 6.0 6.5 6.5 7.0 8.0 8.4 9.1 9.9 11 12 14 15 17 18 21 21 23 REV. 2, Dec-2010, KSJR10 Lite-On Semiconductor
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Abstract: 3.0 3.5 4.0 5.0 6.0 6.5 6.5 7.0 8.0 8.4 9.1 9.9 11 12 14 15 17 18 21 21 23 REV. 3, Apr-2011, KSJR10 Lite-On Semiconductor
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MMBZ52XXBW

J-STD-020D

Abstract: MMBZ5221BW -2010, KSJR10 Notes: 1. Short duration test pulse used to minimize self-heating effect. 2. f = 1KHz
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MMBZ5223BW MMBZ5225BW MMBZ5226BW MMBZ5227BW MMBZ5228BW MMBZ5229BW MMBZ5259BW