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Electron Research

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Abstract: The new Agilent 8500 FE-SEM offers researchers a field emission scanning electron microscope , without constant re-tuning • Compact size enables easy installation in any research laboratory and , scanning electron microscope is the electron beam column, which extracts, collimates, shapes, scans, and focuses the electron beam. A conventional electron beam column relies on a combination of precisionmachined electromagnetic and electrostatic elements to control the electron beam. The coils that form ... Agilent Technologies
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4 pages,
297.08 Kb

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Abstract: exponential and research is already delving deeper into submicron technologies. The turnaround time between , RESEARCH In parallel with function integration, package technology has been progressing. Packages with , technological development and to offer leading edge products, SGS-THOMSON invests significantly in Research , industry, particularly for highrisk and costly advanced research programs. DESIGN FOR TESTABILITY Using , (MEDEA), a pan-European program of advanced research and development, designed to ensure Europe ... STMicroelectronics
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datasheet

9 pages,
74.91 Kb

VLSI Vision SGS-Thomson ball grid array hot electron devices TEXT
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Abstract: fields such as chemical analysis, medical diagnosis, scientific research and industrial measurement , changes in the electronic state of the substance (electron transition) or induces characteristic , annihilates with an electron, two gamma-ray photons of 511 keV are emitted in opposite directions. These , been chiefly used in research and study on brain functions and other organ mechanisms. Currently, PET , such as animal experiments for research that cannot be easily done with humans, as well as for ... Hamamatsu
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datasheet

40 pages,
584.15 Kb

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Abstract: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 3, MARCH 2003 809 An Analytical Model for , electron injection-induced gate current during programming. Based on full transient simulation of the , Integrated Nanosystems Research Facility, Department of Electrical and Computer Engineering, University of , . Hot electron injection into the select gate channel was analyzed the same way as programming in the , from IEEE Xplore. Restrictions apply. 810 IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 3 ... Original
datasheet

7 pages,
314.23 Kb

superflash sst permittivity electric field Dual-Gate Mosfet SST superflash sonos igfet hot electron devices TEXT
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Abstract: €‚ This power supply was developed for use in high speed electron beam accelerator. It can be used to , The figures and wave patterns are from the Institute of Physical and Chemical Research これまでの実績 The present results 学術 For academic research 研究用 医療用 For medical , 出典:独立行政法人 理化学研究所  The SACLA XFEL X-ray free electron laser) facility ( (Source , Chemical Research RIKEN) ( 【写真右 On right】 超高精度高電圧充電器 (ã ... Nichicon
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1 pages,
844.02 Kb

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Abstract: ACKNOWLEDGMENT REFERENCES SuperFlash cell based on field enhancing electron injector uses a relatively thick , using polyto-poly Fowler-Nordheim (F-N) tunneling for erase and source-side channel hot electron , degradation under program/erase cycling is electron trapping in tunnel oxide near floating gate injector during erase. Electron trapping occurs on existing traps and traps For quantitative characterization , the tunneling current varies with time during erase and the total electron charge transferred from ... Original
datasheet

4 pages,
119.66 Kb

material science and technology Hebrew 1117 FG 0.18-um CMOS Flash technology Angstrem TEXT
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Abstract: .201004340 Investigation of electron delay www.pss-rapid.com in the base on noise performance in InGaP heterojunction , good agreement with the HICUM L2 compact model [M. Schroter, IEICE Trans. Electron. E88-C E88-C, 1098 (2005 , place mainly in the base and the base/collector (B/C) region where the electron transport is also , quasi-ballistic electron transport. © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim solidi status physica 336 rrl A. Shimukovitch et al.: Investigation of electron delay in base on noise ... Original
datasheet

3 pages,
1113.67 Kb

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Abstract: presented. Single electron tunneling events have been detected, using regular flash memory cell. A physical , Fowler-Nordheim (F-N) Electron Injection from field-enhancing FG-injector through tunneling oxide during ERASE and Source-Side Channel Hot Electron Injection during PROGRAM [2,3]. TABLE OF CONTENTS 1. 2 , Tunneling 2.3. Reverse Tunneling 2.4. Tunneling Model for FG Injector 2.5. Single Electron Event , of electron tunneling injection from FG. When tunneling conditions are reached, a corresponding ... Original
datasheet

6 pages,
442.39 Kb

tunnel detector injector ed 39 1E-18 tunnel diodes TEXT
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Abstract: research. Structure and principle PHOTOCATHODE (PHOTONS ELECTRONS) MCP(ELECTRON MULTIPLICATION , Photon is our business Electron Tube Products Condensed Catalog HAMAMATSU PHOTONICS K.K , , chemical analysis, measurement, industrial instrumentation, and academic research As a world leader in photonics technology, Hamamatsu Photonics is constantly researching light in all its forms. The Electron , research as well as in medical applications such as blood analysis and diagnostic imaging. Based on this ... Hamamatsu Photonics
Original
datasheet

28 pages,
2659.5 Kb

photodiode pin alpha ray fingerprint scanner circuit light source xenon flash tube optical Sensors for fingerprint reader EndoScope Hamamatsu Photomultiplier Socket 14 Pin M9003-01 FLAME SENSOR UV xenon driver uv flame sensor led optical communication xenon flash lamps uv light PHOTO detector C8855-01 C9744 deuterium lamp circuit Solar Garden Light Controller 4 pin Lamps FLASH TUBE xenon xenon linear flash lamps TEXT
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Abstract: in electron multiplication technology, is continuously engaged in research and development and in , Technologies Burle is recognized as a worldwide leader in electron multiplication technology with its , family of electron multipliers. These advanced products satisfy the demanding detection needs of the scientific and research community, focusing on mass spectrometry, surface analysis, and space sciences , manufacturer of microchannel plate detector assemblies and channel electron multipliers, perfected the MCP ... Burle Industries
Original
datasheet

11 pages,
790.66 Kb

Viking II quantum scientific imaging technologies inc microchannel plate GIOTTO long range metal detector TP182 BURLE Security Products TEXT
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Archived Files

Abstract Saved from Date Saved File Size Type Download
Interchange Code EBM Electron Beam Machine EBN Electronic Buyers' News EBR Electron Equal To ERADCOM Electronic Research And Development Command ERA Electronic Routing and Eraseable Read-Only Memory ERP Exploratory Research Program ERU Ejector Release Unit (Bomb Escape ESCA Electron Spectroscopy for Chemical Analysis ESD Electro Static Discharge " Electron Technology and Device Laboratory ETF Enhanced Tactical Fighter ETL Engineer
/datasheets/files/texas-instruments/sc/docs/military/milprdov/e.txt
Texas Instruments 07/11/1996 9.44 Kb TXT e.txt
Partitioning Environment SCOR Scientific Committee on Oceanographic Research SCP System Scanning Electron Microscope " Serial Emulation Module " Standard Electron Module SRDL Semiconductor R & D Laboratories SREL Semiconductor Research and Engineering Laboratory SRI Stanford Research Institute SRP Standard Repair Procedures " Equipment " Swap Table Entry STEM Scanning Transmission Electron Microscope STEP
/datasheets/files/texas-instruments/sc/docs/military/milprdov/s.txt
Texas Instruments 07/11/1996 15.66 Kb TXT s.txt
Electron Device Letter , 1997, p. 209. [6] S. A. Campbell, D.C. Gilmer, X.-C. Wang, M.-T. Hsieh, H.-S. Kim, W.L. Gladfelter, and J.Yan, IEEE Electron Device , 1997, p. [21] J.B. Jacobs and D. Antoniadis, IEEE Transactions Electron Devices , 1995, p. 870. , and B. Davari, IBM Journal Research Development , 1995, p. 229. [23
/datasheets/files/intel/techno~1/itj/q31998/articles/art_3i.htm
Intel 31/10/1998 9.01 Kb HTM art_3i.htm
pegs $100M for DSP     development TI announces $25M college     research fund focused on     DSP research     Mixed-Signal and Analog Another step toward all-digital High-speed floating-gate technology incorporated in the TC281 TC281 gives it a low 10-to-20 electron noise floor at frequencies
/datasheets/files/texas-instruments/data/sc/docs/integrat/97oct/brief7.htm
Texas Instruments 08/02/1999 9.15 Kb HTM brief7.htm
Electron Device Letter , 1997, p. 209. [6] S. A. Campbell, D.C. Gilmer, X.-C. Wang, M.-T. Hsieh, H.-S. Kim, W.L. Gladfelter, and J.Yan, IEEE Electron Device , 1997, p. [21] J.B. Jacobs and D. Antoniadis, IEEE Transactions Electron Devices , 1995, p. 870. , and B. Davari, IBM Journal Research Development , 1995, p. 229. [23
/datasheets/files/intel/techno~1/itj/q31998/articles/art_3i-v1.htm
Intel 02/02/1999 9.01 Kb HTM art_3i-v1.htm
commercialize computers 1951 The first video tape recorder is developed by Armour Research Livermore Advanced Research Computer (LARC) with 60,000 transistors, the first scientific computer to use satellite, the first to contain integrated circuits Semiconductor diodes that use electron tunneling go electron tube introduced in Japan, Raytheon introduces the first small, affordable microwave oven leaves Control Data Corporation to found his own computer manufacturing company, Cray Research
/datasheets/files/international-rectifier/docs/wcd00002/wcd0021e.htm
International Rectifier 06/10/1998 18.44 Kb HTM wcd0021e.htm
National Electronics Manufacturing Initiative (NEMI)    Joint Electron Device Engineering Council  GINTIC  Japan  EIAJ  U.S. Focus Groups   Semiconductor Research
/datasheets/files/national/htm/nsc00905.htm
National 01/11/2002 10.3 Kb HTM nsc00905.htm
R Range " Reset R&D Research & Reverse-Bias Safe Operating Area RC Remote Control " Research Center " Received Data Enable " Research Development & Engineering RDF Rapid Deployment Forces Tracking RDT&E Research, Development, Test, and Evaluation RDTC Remote Data Terminal Requirements Specification (System) RES Research Existing Software RESC Resources System RESP
/datasheets/files/texas-instruments/sc/docs/military/milprdov/r.txt
Texas Instruments 07/11/1996 6.9 Kb TXT r.txt
          Joint Electron Device Engineering Council (JEDEC)            Global Environmental  U.S. Focus Groups           Semiconductor Research Corp. (SRC)   Packaging
/datasheets/files/national/lf_consortia.html
National 25/09/2003 5.74 Kb HTML lf_consortia.html