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40H-721-010-016

Catalog Datasheet MFG & Type PDF Document Tags

ta3842

Abstract: APPLICATION CD4094 40H-311-200-008 40H-311-203-XXX 40H-721-010-001 TEST LOT ACCEPT 40H-721-010-016 CONFORMANCE TESTING
Harris Semiconductor
Original
ta3842 APPLICATION CD4094 CD40110 equivalent cd40110 87XXXX 211026001 02-JUN-1997

APPLICATION CD4094

Abstract: ta3842 40H-311-203-XXX 40H-721-010-001 TEST LOT ACCEPT 40H-721-010-016 CONFORMANCE TESTING 40H-721-050-001
Harris Semiconductor
Original
tA 1507 989XXXX TA384 icl7667 die ta1313 51122A 19-SEP-1997

intersil DATE CODE MARKING

Abstract: pin diagram details of CD4015 DOCUMENTS 233XXX 240111-XXX 40H-721-010-016 230473 Quality Procedures QCI Test Inspection Procedures
Intersil
Original
intersil DATE CODE MARKING pin diagram details of CD4015 R4573 B y2010 ESD test plan R4573 07-AUG-2000 MIL-PRF-38535 EB-1997 05-APR-1996 07-JUN-1996 03-NOV-1995

nikon STEPPER

Abstract: 40F-701-1-15 . QUALITY SUPPORT DOCUMENTS 233XXX 240103 240111 40H-721-010-016 Quality Procedures MIL Compliant Class S
Harris Semiconductor
Original
nikon STEPPER 40F-701-1-15 MIL-STD-883 method 5003 71007 harris top marking product change notification INCOMING MATERIAL INSPECTION procedure DOC004 DOC005 210XXX 710-010-XX 40F-400-0-0

MIL-STD-883 method 5003

Abstract: TM2004 40H-721-010-016 Quality Procedures MIL Compliant Class S Traceability & Acceptance QCI Test Inspection Procedures
Harris Semiconductor
Original
TM2004 TM1011 marking 25b ACT-R01 Harris top marking 54XXXX