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2n2222 temperature vs mV

Catalog Datasheet MFG & Type PDF Document Tags

s parameters of 2N2222

Abstract: 15-V CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 500 VCC± = ±15 V VO = 1 V to 14 V See , CURRENT vs FREE-AIR TEMPERATURE 400 350 300 Condition 2 250 200 150 Condition 1 100 2 , Current and Dissipation - mA 160 POSITIVE SUPPLY CURRENT vs POSITIVE SUPPLY VOLTAGE VID = 10 mV , PART NUMBER TOP-SIDE MARKING -40°C to 125°C 3 mV SOIC (D) Reel of 2500 LM211QDRQ1 LM211Q1 , 2004 absolute maximum ratings over operating free-air temperature range (unless otherwise noted
Texas Instruments
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AEC-Q100 LM211 s parameters of 2N2222 15-V 2N2222 Q100 SLCS143

2N2222 chip

Abstract: HP5082-4204 specifications which apply over the full operating temperature range of VCM = 0V, 0°C ≤ TA ≤ 70°C. VS =  , over the full operating temperature range of â'" 55°C ≤ TA ≤ 125°C. VS = ± 15V, VCM = 0V , (DEGREES) 140 TA = 125°C Phase Margin, Gain Bandwidth Product, Slew Rate vs Temperature Gain , characteristics: Input Bias and Offset Currents vs Temperature Input Bias Current Over the Common-Mode Range , Noise vs Chip Temperature Short Circuit Current vs Time Output Impedance vs Frequency Common Mode
Linear Technology
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2N2222 chip HP5082-4204 HP-5082-4204 2n2222 h parameter values Endevco 2215 LT1022 LT1022A OP-16A OP-16E LT1055

1N2175

Abstract: ranges of the various devices. INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 18 I IO - Input Offset , 300 250 200 150 100 Condition 1 LM211 Condition 2 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC , temperature ranges of the various devices. OUTPUT CURRENT AND DISSIPATION vs OUTPUT VOLTAGE 160 IO - Output , Temperature Performance of ­55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced , temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85
Texas Instruments
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1N2175 LM211-EP SLCS140A

1N2175

Abstract: 100 khz crystal ranges of the various devices. INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 18 I IO - Input Offset , 300 250 200 150 100 Condition 1 LM211 Condition 2 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC , temperature ranges of the various devices. OUTPUT CURRENT AND DISSIPATION vs OUTPUT VOLTAGE 160 IO - Output , Temperature Performance of ­55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced , temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85
Texas Instruments
Original
100 khz crystal

Endevco 2215

Abstract: 2n2222 h parameter values specified with wider operating temperature ranges. ELECTRICAL CHARACTERISTICS VS = ± 15V, TA = 25 , ±7 mV The denotes the specifications which apply over the full operating temperature range of , specifications which apply over the full operating temperature range of ­ 55°C TA 125°C. VS = ± 15V, VCM = 0V , TEMPERATURE (°C) 100 125 LT1022 · TPC03 Small-Signal Response Settling Time 10 VS = ±15V , vs Temperature Gain, Phase Shift vs Frequency PHASE SHIFT (DEGREES) Gain vs Frequency
Linear Technology
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LT1010 TO-5 hp5082-2810 HP5082-4204 photodiode 2N2222 circuit Endevco 104 327 LAMP

1N2175

Abstract: 15-V SLCS140 ­ DECEMBER 2002 TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 , D D D D D D D D ­ One Assembly/Test Site, One Fabrication Site Extended Temperature , with JEDEC and industry standards to ensure reliable operation over an extended temperature range , , temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound , PART NUMBER TOP-SIDE MARKING ­40°C to 125°C 3 mV SOIC ­ D Tape and reel LM211QDREP LM211E
Texas Instruments
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1N914 2N3708 TL081 LM2110 LM211EP
Abstract: OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 18 I IO - Input Offset Current - nA 16 14 12 10 8 6 4 2 0 -60 , 120 140 Condition 2 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC± = ±15 V VO = 1 V to 14 V See , = 25°C No Load I CC+ - Positive Supply Current - mA 5 VID = -10 mV POSITIVE SUPPLY CURRENT vs , V Figure 8 Figure 9 NEGATIVE SUPPLY CURRENT vs NEGATIVE SUPPLY VOLTAGE -6 VID = 10 mV or , TA VIO max AT 25°C PACKAGE ORDERABLE PART NUMBER TOP-SIDE MARKING -40°C to 125°C 3 mV SOIC (D Texas Instruments
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1N2175

Abstract: DIFFERENTIAL COMPARATOR temperature ranges of the various devices. INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 500 20 VCC± = ±15 V VO = 1 V to 14 V See Note A 16 14 , Fabrication Site Extended Temperature Performance of ­55°C to 125°C Enhanced Diminishing Manufacturing , temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and
Texas Instruments
Original
DIFFERENTIAL COMPARATOR LM211M LM211MDREP

LM311 OPERATIONAL AMPLIFIER OPERATION

Abstract: LM311 zero crossing detector TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 500 VCC± = ±15 V VO = 1 , Current ­ nA I IO ­ Input Offset Current ­ nA INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC+ = , DEVICES TA VIOmax at 25°C SMALL OUTLINE (D) SSOP (DB) 0°C to 70°C 7.5 mV LM311D LM311DBLE 3 mV LM211D ­ 40°C to 85°C CHIP CERAMIC CARRIER DIP (FK) (J) CERAMIC DIP , ) LM311Y LM211P ­ 55°C to 3 mV LM111FK LM111J LM111JG LM111U 125°C The D package is
Texas Instruments
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LM311 SLCS007A LM311 OPERATIONAL AMPLIFIER OPERATION LM311 zero crossing detector 2n3708 equivalent NATIONAL SEMICONDUCTOR LM311D LM311 free download LM111

1N2175

Abstract: lm311 equivalent TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 500 VCC± = ±15 V VO = 1 , CURRENT vs FREE-AIR TEMPERATURE 50 40 60 80 100 120 140 LM111 LM211 0 ­60 ­40 ­20 , connection The LM111 is characterized for operation over the full military temperature range of ­55°C to , ) CERAMIC DIP (JG) PLASTIC DIP (P) PLASTIC TSSOP (PW) LM311PWR 7.5 mV LM311D LM311P ­40°C to 85°C 3 mV LM211D LM211P ­40°C to 125°C 3 mV LM211QD ­55°C to 125°C 3 mV
Texas Instruments
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lm311 equivalent LM111-LM211-LM311 TEXAS INSTRUMENTS TIP29 2N2222 national LM311 application notes SLCS007C

LM311

Abstract: LM311PS 2002 TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 18 I IO ­ Input , Condition 2 LM311 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC± = ±15 V VO = 1 V to 14 V See Note A , I CC+ ­ Positive Supply Current ­ mA 5 VID = ­10 mV POSITIVE SUPPLY CURRENT vs POSITIVE SUPPLY , Figure 9 NEGATIVE SUPPLY CURRENT vs NEGATIVE SUPPLY VOLTAGE ­6 VID = 10 mV or ­10 mV TA = 25°C No , 2N2222 R1 30 k R1 sets the comparison level. At comparison, the photodiode has less than 5 mV across
Texas Instruments
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LM311PS LM311 ti SLCS007E

lm311 ti

Abstract: LM211P SEPTEMBER 1973 ­ REVISED JULY 2002 TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE , Condition 1 LM111 LM211 Condition 2 LM311 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC± = ±15 V VO = 1 , = 25°C No Load I CC+ ­ Positive Supply Current ­ mA 5 VID = ­10 mV POSITIVE SUPPLY CURRENT vs , V Figure 8 Figure 9 NEGATIVE SUPPLY CURRENT vs NEGATIVE SUPPLY VOLTAGE ­6 VID = 10 mV or , TA VIO max AT 25°C PDIP ­ P ­0°C to 70°C 7.5 mV SOIC ­ D SOP ­ PS TSSOP ­ PW PDIP ­ P ­ 40°C to 85
Texas Instruments
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SLCS007G gate driver LM311 LM211DR LM211PWR LM211QDR SLCJ005

2n2222 texas instruments

Abstract: lm211 cross reference vs FREE-AIR TEMPERATURE VCC± = ±15 V VO = 1 V to 14 V See Note A 0 ­60 ­40 ­20 0 20 40 , I CC+ ­ Positive Supply Current ­ mA 5 VID = ­10 mV POSITIVE SUPPLY CURRENT vs POSITIVE SUPPLY , Figure 9 NEGATIVE SUPPLY CURRENT vs NEGATIVE SUPPLY VOLTAGE ­6 VID = 10 mV or ­10 mV TA = 25°C No , D D ­ One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of ­40°C to 125 , operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated
Texas Instruments
Original
2n2222 texas instruments lm211 cross reference

squarer lm311

Abstract: LM311DBLE TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 500 VCC± = ±15 V VO = 1 , Current ­ nA I IO ­ Input Offset Current ­ nA INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC+ = , DEVICES TA VIOmax at 25°C SMALL OUTLINE (D) SSOP (DB) 0°C to 70°C 7.5 mV LM311D LM311DBLE 3 mV LM211D ­ 40°C to 85°C CHIP CERAMIC CARRIER DIP (FK) (J) CERAMIC DIP , ) LM311Y LM211P ­ 55°C to 3 mV LM111FK LM111J LM111JG LM111U 125°C The D package is
Texas Instruments
Original
squarer lm311 2n2222 temperature vs mV TIL102 CLM311 tip29 LM311PWLE MPDI001A 4040082/D MS-001
Abstract: OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 18 I IO - Input Offset Current - nA 16 14 12 10 8 6 4 2 0 -60 , 120 140 Condition 2 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC± = ±15 V VO = 1 V to 14 V See , = 25°C No Load I CC+ - Positive Supply Current - mA 5 VID = -10 mV POSITIVE SUPPLY CURRENT vs , V Figure 8 Figure 9 NEGATIVE SUPPLY CURRENT vs NEGATIVE SUPPLY VOLTAGE -6 VID = 10 mV or , TA VIO max AT 25°C PACKAGE ORDERABLE PART NUMBER TOP-SIDE MARKING -40°C to 125°C 3 mV SOIC (D Texas Instruments
Original

LM211

Abstract: 1N2175 OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 500 VCC± = ±15 V VO = 1 V to 14 V See Note A 18 , No internal connection The LM111 is characterized for operation over the full military temperature , mV PLASTIC SMALL OUTLINE (D, PS) CERAMIC CHIP CARRIER (FK) CERAMIC DIP (JG , LM311PS - - - - ­40°C to 85°C 3 mV LM211D - - LM211P - ­40°C to 125°C 3 mV LM211QD - - - - ­55°C to 125°C 3 mV - LM111FK LM111JG
Texas Instruments
Original
LM311V SLCS007F
Abstract: . INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 500 , Dissipation â' mA 160 POSITIVE SUPPLY CURRENT vs POSITIVE SUPPLY VOLTAGE VID = 10 mV or â'10 mV , Assembly/Test Site, One Fabrication Site Extended Temperature Performance of â'"55°C to 125 , ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST Texas Instruments
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ISO/TS16949

2n2222 ti

Abstract: ranges of the various devices. INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 18 I IO - Input Offset , 300 250 200 150 100 Condition 1 LM211 Condition 2 INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE VCC , temperature ranges of the various devices. OUTPUT CURRENT AND DISSIPATION vs OUTPUT VOLTAGE 160 IO - Output , Temperature Performance of ­55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced , temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85
Texas Instruments
Original
2n2222 ti

1N2175

Abstract: 2N3708 temperature ranges of the various devices. INPUT BIAS CURRENT vs FREE-AIR TEMPERATURE INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 500 20 VCC± = ±15 V VO = 1 V to 14 V See Note A 16 14 , Fabrication Site Extended Temperature Performance of ­55°C to 125°C Enhanced Diminishing Manufacturing , temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and
Texas Instruments
Original

15-V

Abstract: 1N914 SLCS140 ­ DECEMBER 2002 TYPICAL CHARACTERISTICS INPUT OFFSET CURRENT vs FREE-AIR TEMPERATURE 20 , D D D D D D D D ­ One Assembly/Test Site, One Fabrication Site Extended Temperature , with JEDEC and industry standards to ensure reliable operation over an extended temperature range , , temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound , PART NUMBER TOP-SIDE MARKING ­40°C to 125°C 3 mV SOIC ­ D Tape and reel LM211QDREP LM211E
Texas Instruments
Original
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