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    TESTING Search Results

    TESTING Result Highlights (6)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet
    FO-62.5LPBLC0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBLC0-001 LC Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
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    TESTING Price and Stock

    Microchip Technology Inc JANSR2N2222AUB/HRDS-XRAY_TESTING

    JANSR2N2222AUB/HRDS-XRAY_TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: HRDS-XRAY_TESTING)
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    Amphenol Corporation GROUP B TESTING

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    Tri-Star Electronics International U LEVEL TESTING

    U LEVEL TESTING - Virtual or Non-Physical Inventory (Software & Literature) (Alt: U LEVEL TESTING)
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    Avnet Americas U LEVEL TESTING No Container 14 Weeks 1
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    Amphenol Corporation GROUP A TESTING

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    Sensitron Semiconductors FAI TESTING 1N6065AJAN

    TVS Diode MIL-PRF-19500/507 Bi-Directional 114V 8.9A 1500W 2-Pin DO-13 - Virtual or Non-Physical Inventory (Software & Literature) (Alt: FAI TESTING 1N6065AJAN)
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    Avnet Americas FAI TESTING 1N6065AJAN No Container 16 Weeks 1
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    TESTING Datasheets (1)

    Part ECAD Model Manufacturer Description Curated Type PDF
    Testing and specifying FAST logic NXP Semiconductors AN202 - Testing and specifying FAST logic Original PDF