The Datasheet Archive

Top Results (6)

Part Manufacturer Description Datasheet Download Buy Part
DRV8872DDARQ1 Texas Instruments Automotive 3.6A Brushed DC Motor Driver With Fault Reporting 8-SO PowerPAD -40 to 125
DRV8872DDA Texas Instruments 3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125
DRV8872DDAR Texas Instruments 3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125
TPS2011APWP Texas Instruments 1.2A, 2.7 to 5.5V Single High-Side MOSFET Switch IC, No Fault Reporting, Active-Low Enable 14-HTSSOP -40 to 85
TPS2014DR Texas Instruments 0.66A, 4-5.5V Single Hi-Side MOSFET, Fault Report, Act-Low Enable 8-SOIC
TPS2022DRQ1 Texas Instruments Automotive 2.7V to 5.5V, 1A Power Distribution Switch with Hot-Swap Compatible, Fault Report 8-SOIC -40 to 85

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1997 - 68hc11pa8

Abstract: 68hc11kg4 68B09E 68HC11PH8 HC711KG4 68HC57 68HC11KA4 HC705B16 motorola 68hc11kg4 68HC11L6
Text: MCTG RELIABILITY AND QUALITY 1996 ANNUAL REPORT MRQSY96/D Microcontroller Technologies Group Reliability and Quality 1996 Annual Report To Our Valued Customers: Thank you for selecting Motorola as , activities are also initiated on design fixes, process capability enhancements and defectivity reductions based on our ongoing reliability monitor program and our Total Control Methodology in manufacturing processes. We are glad to publish this annual 1996 MCTG Reliability Monitor Report for your use. Please


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PDF MRQSY96/D 68hc11pa8 68hc11kg4 68B09E 68HC11PH8 HC711KG4 68HC57 68HC11KA4 HC705B16 motorola 68hc11kg4 68HC11L6
1997 - report on PLCC

Abstract: 40673 plcc 68 QL8X12A solar cell Amorphous 40673 equivalent reliability report ql8x12 QL8X12B A101
Text: RELIABILITY REPORT ACCELERATED LIFE TESTS ON THE pASIC TABLE 2. Results of Accelerated Life Tests on the , has no measurable effect on the reliability of the resulting product. 9-3 9 Quality, Packaging pASIC ® 1 and 2 FAMILY Reliability Report RELIABILITY REPORT PROCESS DESCRIPTION , . It is created by depositing a very high resistance amorphous silicon film on a standard size , RELIABILITY REPORT In Table 1, t50 is the mean time to failure, E is the electric field, Ea is the


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1996 - pj 989

Abstract: 145026 PASIC 380 solar cell Amorphous report on PLCC 38980 14093 QL8X12B-2 A101 QL8X12A
Text: REPORT Failure @ Hours Package 68 PLCC Fab lot 1351104 Device QL8X12B Quantity 100 , 0 0 Total * = 150 ºC 6-9 3 6 Quality, Packaging 84 PLCC RELIABILITY REPORT , RELIABILITY REPORT The reliability tests on the programmed ViaLink element must demonstrate the stability of , QL16x24B 4 0 0 0 6-24 RELIABILITY REPORT Failure @ Hours Package 84 PLCC Fab Lot , pASICTM 1 FAMILY Reliability Report SUMMARY The pASIC device is a highly reliable Field


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PDF pp27-30. pj 989 145026 PASIC 380 solar cell Amorphous report on PLCC 38980 14093 QL8X12B-2 A101 QL8X12A
1997 - 68HC11L6

Abstract: 68hc11ka4 68HC11PH8 68HC11a1 527 MOSFET TRANSISTOR motorola 68HC05N4 D65C nippon denso 128 QFP 14x20 68HC05B6
Text: REPORT Quarter 1, 1997 Semiconductor Product Sector Test results contained herein are for information only. This report does not alter MotorolaÕs standard warranty or product speciÞcations. Microcontroller Technologies Group Reliability and Quality Quarter 1, 1997 Report © MOTOROLA INC., 1997 1 MICROCONTROLLER TECHNOLOGIES GROUP RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION , . 3-1 MICROCONTROLLER TECHNOLOGIES GROUP RELIABILITY AND QUALITY Q1 1997 REPORT MOTOROLA iii


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1996 - 68hc26

Abstract: 68hc705p9 68HC05C4 JPC3400 68HC05B6 68HC05C12 68705r3 68hc805b6 68HC705B5 68HC68SE
Text: CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report © MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION , QUALITY . 3-1 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY Q2 1996 REPORT MOTOROLA iii MOTOROLA iv CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY Q2 1996 REPORT CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION RELIABILITY AND


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1995 - power supply ic 9435

Abstract: report on PLCC- II 7134 AN 7134 PLCC-52 9511 PLCC-52 A110 A106 A104 A102
Text: ) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 Introduction to Integrated Device Technology , , and office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report . For


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PDF PDIP-48 PLCC-52 PLCC-68 power supply ic 9435 report on PLCC- II 7134 AN 7134 PLCC-52 9511 PLCC-52 A110 A106 A104 A102
2000 - tms 9937

Abstract: TSMC fuse PALC22V10b M99242 CY7C1353-AC MR841 Hyundai 9944 PALC22V10B-15PC
Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 STANDARD , Bias Page 2 of 32 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4 , 32 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 , stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See


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PDF SRAM/LOGIC-R52LD 121C/100 CY62137-AI MR94085 tms 9937 TSMC fuse PALC22V10b M99242 CY7C1353-AC MR841 Hyundai 9944 PALC22V10B-15PC
1996 - PLCC-64

Abstract: 9529 PLCC52 TQFP-132 A110 A106 A104 A102 A101 report on PLCC
Text: FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report


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PDF IntegratedP-48 71321U PLCC-52 7133X PLCC-68 7006X PLCC-64 9529 PLCC52 TQFP-132 A110 A106 A104 A102 A101 report on PLCC
1997 - A101

Abstract: A102 A104 A106 A110 TQFP-64 PACKAGE thermal resistance 7025X quality and reliability report IDT QUALITY & RELIABILITY MONITOR REPORT
Text: ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , Monitor Program. Section II of this report contains four-quarter rolling summaries of reliability testing , methods used for the monitors are described in Section II of this report . For more information regarding


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PDF PLCC-68 P-DIP-48 TQFP-100 PLCC-84 TQFP-64 PLCC-52 300cycle A101 A102 A104 A106 A110 TQFP-64 PACKAGE thermal resistance 7025X quality and reliability report IDT QUALITY & RELIABILITY MONITOR REPORT
1995 - 100A484

Abstract: A106 A110 A101 A102 A104 ase korea on semiconductor ic 9435 Q494
Text: ) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 Introduction to Integrated Device Technology , , and office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report . For


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PDF PLCC-32 PQFP-120 PQFP-64 300cy 500cy 1000cy 100A484 A106 A110 A101 A102 A104 ase korea on semiconductor ic 9435 Q494
2001 - ACT1020

Abstract: JH05 MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR 44 pin actel 1020b ACTEL 1020B JEDEC-A113 smd U1p Jl03 JL-03 ACP55
Text: , continuous communication between top executives, managers, and employees I Emphasis on cooperation and , successfully advance to higher complexity designs with confidence. Quality & Reliability Report 1 2 , STACK Member. 2 Quality & Reliability Report STACK Registered suppliers include Actel, Altera , . Quality & Reliability Report 3 Reliability Assurance System1 To ensure that customers are satisfied , following documents on page 57. · Actel and the Antifuse-A Technical Backgrounder · Oxide-Nitride-Oxide


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1996 - Hyundai Semiconductor

Abstract: report on PLCC 100A484 CERDIP28 s 122 transistor "p 77" 1005 Ic Data plcc-32 vcc IC 741 data sheet DATASHEET OF IC 741 A104
Text: FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report


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PDF 72103Y PLCC-44 2205W PQFP-64 7200T PDIP-28 7201T PLCC-32 72245X Hyundai Semiconductor report on PLCC 100A484 CERDIP28 s 122 transistor "p 77" 1005 Ic Data plcc-32 vcc IC 741 data sheet DATASHEET OF IC 741 A104
1997 - report on PLCC- II

Abstract: t450 7132-S ase korea on semiconductor A110 A106 A104 A102 A101 TQFP-64
Text: FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , 's quality system is the Quality and Reliability Monitor Program. Section II of this report contains , II of this report . For more information regarding the reliability performance of IDT products


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PDF VI-11 report on PLCC- II t450 7132-S ase korea on semiconductor A110 A106 A104 A102 A101 TQFP-64
vl16c552

Abstract: VL16C452 88C681 UART TTL buffer 68C681
Text: detection Status Report Register Independent Transmit and Receive Control TTL Compatible Inputs, Outputs , Detection Status Report Register Independent Transmit and Receive Control TTL Compatible In puts, Outputs , External Clock Source Supply Technology Voltages CMOS +5V ±5% UART Package 28 Pin Plastic PLCC XR , PLCC XR-16C550 Universal Asynchronous Receiver/ Transmitter with FIFOs CMOS 5V ±10% PLCC , and Detection Status Report Register Independent Transmit and Receive Control TTL Compatible Inputs


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PDF XR-16C450 INS8250 VL16C452 38MHz XR-88C681 XR-68C681 XR-82C684 vl16c552 88C681 UART TTL buffer 68C681
1997 - 7206Y

Abstract: A101 A102 A104 A106 A110 9616P
Text: FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , 's quality system is the Quality and Reliability Monitor Program. Section II of this report contains , II of this report . For more information regarding the reliability performance of IDT products


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PDF PLCC-32 7202S 7205X 7204T 72104Y PLCC-44 7206Y 7206Y A101 A102 A104 A106 A110 9616P
1996 - S 1854

Abstract: 1005 Ic Data report on PLCC Power PQFP 64 PQFP 64 9528 A101 A102 A104 A106
Text: ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report


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PDF PLCC-68 72245X PQFP-64 7202S PLCC-32 72241Y 7204T PDIP-28 S 1854 1005 Ic Data report on PLCC Power PQFP 64 PQFP 64 9528 A101 A102 A104 A106
1996 - PLCC-52

Abstract: PDIP-48 7024X report on PLCC S 1854 A104 A102 A101 transistor 9529 T 9527
Text: ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report


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PDF Tec9551 PLCC-68 7024X TQFP-100 70V05X TQFP-64 PLCC-52 PDIP-48 7024X report on PLCC S 1854 A104 A102 A101 transistor 9529 T 9527
1997 - A101

Abstract: A102 A104 A106 A110 P-DIP-18 PLCC-32 TQFP-64 9626 pot
Text: ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , Monitor Program. Section II of this report contains four-quarter rolling summaries of reliability testing , methods used for the monitors are described in Section II of this report . For more information regarding


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PDF PDIP-18 PLCC-32 PLCC-44 PDIP-28 7204T 500cycle A101 A102 A104 A106 A110 P-DIP-18 PLCC-32 TQFP-64 9626 pot
tms 9937

Abstract: M9922 TSMC fuse PALC22V10B-15PC CY62128-SC 9933 c CY7B923-JI 140C Hyundai 9944 PALC22V10B
Text: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 , RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 WAFER FAB AREAS FAB # LOCATION CA TX MN , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 , Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias


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PDF SRAM/LOGIC-R52LD 121C/100 CY62137-AI MR94085 tms 9937 M9922 TSMC fuse PALC22V10B-15PC CY62128-SC 9933 c CY7B923-JI 140C Hyundai 9944 PALC22V10B
1997 - SAM448

Abstract: pac1000 PSD100 PAC1000A BA 9515 WS*57c257 ws57c257 ba 4913 ws57c43 psi c 275 9 121
Text: .1-1 TECHNICAL REPORT Intrinsic Floating Gate Charge Loss Mechanism , .5-1 WS27C256L 28 Pin CERDIP (600 Mil) 32 Pin PLCC 28 Pin PDIP (600 Mil) 32K x 8 CMOS EPROM .5-2 WS27C512L 28 Pin CERDIP (600 Mil) 32 Pin PLCC 64K x 8 CMOS EPROM .5-3 WS27C512LS 28 Pin CERDIP (600 Mil) 32 Pin PLCC 64K x 8 CMOS EPROM .5-4 WS27C010L 32 Pin CERDIP (600 Mil) 32 Pin PLCC 128K x 8 CMOS EPROM


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PDF WS59032 2-201-1A 91-1624-AC CA112 101-Pin 92-201-1B SAM448 pac1000 PSD100 PAC1000A BA 9515 WS*57c257 ws57c257 ba 4913 ws57c43 psi c 275 9 121
1997 - max232 16 pin diagram with pin function

Abstract: MAX232 MAX232 pin diagram 9434 8 pin integrated circuit max232 diagram max232 specification MXL902 MAX232 all pin diagram NSO package MAX202, MAX232
Text: Surface-Mount Devices Reliability Report Quad Pack or PLCC Pin Convention TABLE D , pin-for-pin compatible with the DIP package; i.e., pin 1 on the 28-lead Quad Pack or PLCC will have the same , February 1996 RR-2B Surface-Mount Devices Reliability Report This report presents , performed solely on epoxy surface-mount packages since 1991. Maxim's surface-mount packages are subjected , . Maxim Integrated Products Surface-Mount Devices Reliability Report RR


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PDF 28-lead 44-lead max232 16 pin diagram with pin function MAX232 MAX232 pin diagram 9434 8 pin integrated circuit max232 diagram max232 specification MXL902 MAX232 all pin diagram NSO package MAX202, MAX232
1995 - power supply ic 9435

Abstract: 9435, ic ic 9435 9435 49C460 report on PLCC olin 7026 SRAM 6116 malaysia IC f 9222 l
Text: ) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 Introduction to Integrated Device Technology , , and office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report . For


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PDF PDIP-28 SOIC-28 11V256 SOJ-28 TQFP-80 71V256 TSOP-28 300cy power supply ic 9435 9435, ic ic 9435 9435 49C460 report on PLCC olin 7026 SRAM 6116 malaysia IC f 9222 l
1996 - v9452

Abstract: p9506 N9514 v945 L9530 wh9513 k952 74FCT163373 H9516 54fct821
Text: FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report


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PDF PDIP-20 74FCT821 PDIP-24 YH9532 Z9530 PLCC68 74FCT805T P9534 QSOP-20 74FCT540 v9452 p9506 N9514 v945 L9530 wh9513 k952 74FCT163373 H9516 54fct821
pj 899 diode

Abstract: B897 JESD22-B100 K9814 k1917 B953 L9833 N9808 P9812 74FST163245
Text: REPORT April 1999 TABLE OF CONTENTS Section I: Introduction Section II: Summary Data , QUALITY & RELIABILITY MONITOR REPORT April 1999 Introduction to Integrated Device Technology Integrated , Malaysia. IDT stock is traded on the NASDAQ stock market under the symbol "IDTI." Additional information , the monitors are described in Section I of this report . Section II of this report contains , add bipolar elements to the CEMOS platform. I-1 QUALITY & RELIABILITY MONITOR REPORT April 1999


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PDF 723612Z 71215Y 72225S 2211W Y10648 Y10746 Y10662 T11844 61823N pj 899 diode B897 JESD22-B100 K9814 k1917 B953 L9833 N9808 P9812 74FST163245
1995 - 49C466

Abstract: power supply ic 9435 A101 A102 A104 74FCT245 A110 Monitor Hyundai Service PDIP-20 PDIP20
Text: ) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 Introduction to Integrated Device Technology , , and office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report . For


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PDF PDIP-20 74FCT42244 29FCT52T PDIP-24 74FCT827 74FCT821 SOIC-24 74FCT163373T 49C466 power supply ic 9435 A101 A102 A104 74FCT245 A110 Monitor Hyundai Service PDIP-20 PDIP20
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