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DSA00345536.pdf
Manufacturer
Lattice Semiconductor
Partial File Text
Metastability in Lattice Devices March 2004 Technical Note TN1055 Introduction There are two critical issues in metastability characterization. One is to devise an accurate but practical meas
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Original
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User Tagged Keywords
11801B
6410VC
HFS9003
LC4128
oscilloscope MTBF
TN1055
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