Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    Scans-0084932.pdf

    • Not Available
    • Gate current: Modeling, A L extraction and impact on RF performance R. van Langevelde, A.J. Scholten, R. Duffy*, F.N. Cubaynes*, M.J. Knitel and D.B.M. Klaassen Philips Research Laboratories, Pro
    • Scan

    Scans-0084932.pdf preview Download Datasheet

    User Tagged Keywords

    AL 5052 bsim3 model
    Price & Stock Powered by Findchips

    Privacy Policy | Digital Services Act | Contact Us | About Us

    Copyright © 2024.

    Supplyframe Tracking Pixel