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DSAE0065865.pdf
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QuickLogic
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RELIABILITY MECHANISM OF THE UNPROGRAMMED AMORPHOUS SILICON ANTIFUSE by Richard J. Wong and Kathryn E. Gordon 7 7-15 Reprints Presented at the International Reliability and Physics Sym
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Original
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User Tagged Keywords
Amorphous AS
antifuse
Dielectric Constant Silicon Nitride
pp151-153
pp186
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