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DSA0019322.pdf
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Fairchild Semiconductor
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Fairchild Semiconductor Application Note 889 April 1993 ABSTRACT The IEEE Std. 1149.1 Standard Test Access Port and Boundary-Scan Architecture1 as well as other scan path methodologies use a s
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Original
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8 bit LFSR for test pattern generation
AN-889
AN889
fairchild tdi
SCANPSC100F
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