The Datasheet Archive

Top Results (6)

Part Manufacturer Description Datasheet Download Buy Part
CY7B933-PC Rochester Electronics LLC SPECIALTY TELECOM CIRCUIT; PDIP28
CY7B923-PC Rochester Electronics LLC SPECIALTY TELECOM CIRCUIT; PDIP28
CDP1855CEX Rochester Electronics LLC Multiplier, 3-Bit, CMOS, PDIP28
CDP1855E Rochester Electronics LLC Multiplier, 3-Bit, CMOS, PDIP28
HI3-0516-5Z Intersil Corporation 16-Channel/Differential 8-Channel, CMOS High Speed Analog Multiplexer; PDIP28; Temp Range: 0° to 70°
HI9P0547-9Z96 Intersil Corporation Differential 8-Channel CMOS Analog MUXs with Active Overvoltage Protection; PDIP28, SOIC28; Temp Range: See Datasheet

ic vr PDIP28 datasheet (1)

Part Manufacturer Description Type PDF
iC-VR-PDIP28 iC-Haus BIDIRECTIONAL uP INTERFACE TO 24V Original PDF

ic vr PDIP28 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
1997 - 7206Y

Abstract: A101 A102 A104 A106 A110 9616P
Text: failure mechanisms in IC components by the application of high temperatures and the use of dynamic bias , IC components in humid environments. It employs severe conditions of temperature, pressure, humidity , Quarter: Q1'96 72105Z 9530 C-5 PDIP-28 2 S +5.5V +125°C 116 116,000 0 72401Y , +5.5V +125°C 111 111,000 0 7205Y 9512 C-6 PDIP-28 2 P +5.5V +125°C 116 , -7 TQFP-64 2 A +5.5V +125°C 116 348,000 0 7202S 9526 C-7 PDIP-28 2 P


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PDF PLCC-32 7202S 7205X 7204T 72104Y PLCC-44 7206Y 7206Y A101 A102 A104 A106 A110 9616P
FET Drivers

Abstract: L4417 ML4401 motor damping data SSOP20 ML4413 ML8464C ML117
Text: % M ic r o Linear Mass Storage Selection Guide READ/WRITE AMPLIFIERS Part Number ML117 M , PDIP-18, 22, 28; SO-18, 24; PCC-28 PDIP-18, 22, 28; SO-18, 24; PCC-28 PDIP-28 , 40; SO-32; PCC-28, 44 PDIP-28 , 40; SO-28, 32; PCC-28, 44 PDIP-28 , 40; SO-32; PCC-28, 44 PDIP-28 , 40; SO-32; PCC-28, 44 PCC , AGC Recovery, 1 ns Pulse Pairing Package Options PDIP-24, SO-24, PCC-28 PDIP-28 , SO-28, PCC-28 SO , Undervoltage Detector Fast A GC Recovery, 1ns Pulse Pairing Zone Bit Recording IC 100 M Hz VCO Pulse


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PDF ML117 L117R ML501 ML501R ML502 ML502R ML502S PDIP-18, SO-18, FET Drivers L4417 ML4401 motor damping data SSOP20 ML4413 ML8464C
1996 - S 1854

Abstract: 1005 Ic Data report on PLCC Power PQFP 64 PQFP 64 9528 A101 A102 A104 A106
Text: failure mechanisms in IC components by the application of high temperatures and the use of dynamic bias , : HAST is used in order to evaluate the reliability of non-hermetic IC components in humid environments , @ Stress Fails Pkg Calendar Quarter: Q3'95 72105 9509 C-5 PDIP-28 2 S +5.5V , 9510 C-6 PDIP-28 2 P +5.5V 125°C 116 116,000 0 72205 9511 C-6 PQFP , -6 PQFP-64 2 X +5.5V +125°C 116 116,000 0 7205Y 9448 C-6 PDIP-28 2 A


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PDF PLCC-68 72245X PQFP-64 7202S PLCC-32 72241Y 7204T PDIP-28 S 1854 1005 Ic Data report on PLCC Power PQFP 64 PQFP 64 9528 A101 A102 A104 A106
1995 - 100A484

Abstract: A106 A110 A101 A102 A104 ase korea on semiconductor ic 9435 Q494
Text: used to accelerate thermally activated failure mechanisms in IC components by the application of high , evaluate the reliability of non-hermetic IC components in humid environments. It employs severe conditions , -6 PLCC-32 2 A 116/0 7202 9406 C-6 PDIP-28 2 P 116/0 116/0 7203 9414 C-6 PDIP-28 2 A 116/0 116/11 Calendar Quarter: Q4'94 72230 9222 C-5 PDIP-28 2 A 116/0 72401 9432 C-5 PDIP-32 2 D 116/0 72402 9437 C


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PDF PLCC-32 PQFP-120 PQFP-64 300cy 500cy 1000cy 100A484 A106 A110 A101 A102 A104 ase korea on semiconductor ic 9435 Q494
1997 - A101

Abstract: A102 A104 A106 A110 P-DIP-18 PLCC-32 TQFP-64 9626 pot
Text: used to accelerate thermally activated failure mechanisms in IC components by the application of high , reliability of non-hermetic IC components in humid environments. It employs severe conditions of temperature , -32 PLCC-32 P-DIP-28 P-DIP-28 P-DIP-28 P-DIP-28 PLCC-32 PLCC-32 2 2 2 2 2 2 2 2 2 2 P , '96 9639 9543 9623 9619 9637 C-7 C-7 C-7 C-7 C-7 PLCC-32 PLCC-32 PLCC-32 P-DIP-28 P-DIP-28 , -32 PDIP-28 PLCC-32 PDIP-28 PDIP-28 PDIP-18 N T H N P H P 45/0 45/0 45/0 45/0 45/0 45


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PDF PDIP-18 PLCC-32 PLCC-44 PDIP-28 7204T 500cycle A101 A102 A104 A106 A110 P-DIP-18 PLCC-32 TQFP-64 9626 pot
1996 - TSOP 173 g

Abstract: T 9527 SOJ-28 DATASHEET OF IC 741 A110 A106 A104 A102 A101 9438 diode
Text: Temperature Operating Life testing is used to accelerate thermally activated failure mechanisms in IC , Stress Test (HAST) Purpose: HAST is used in order to evaluate the reliability of non-hermetic IC , -24 PDIP-24 PDIP-20 PDIP-20 PDIP-28 SOJ-32 SOJ-32 PDIP-28 SOJ-28 PDIP-28 PDIP-28 PDIP-28 SOJ-28 PDIP-28 SOJ-28 PDIP-28 PDIP-28 PDIP-28 PDIP-28 PDIP-28 SOJ-28 SOJ-28 SOJ-28 SOJ-28 SOJ , 1500 hours Assy Loc: Pkg Q1'95 (Cont'd) 9444 C-7 SOJ-28 9440 C-7 PDIP-28 9447 C-7 PDIP-28


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PDF SOJ-28 11256L 11V256C 71028T 71024T SOJ-32 TSOP 173 g T 9527 SOJ-28 DATASHEET OF IC 741 A110 A106 A104 A102 A101 9438 diode
1996 - UM 9515

Abstract: T 9527 S 1854 dip-28 p 9552 diode 931 p 7 6116L A101 A102 A104
Text: failure mechanisms in IC components by the application of high temperatures and the use of dynamic bias , : HAST is used in order to evaluate the reliability of non-hermetic IC components in humid environments , +5.5V +150°C 116 58,000 0 11256K 9509 C-7 PDIP-28 2 P +5.5V +150°C 116 173,000 1 11256K 9509 C-7 PDIP-28 2 P +5.5V +150°C 114 170,500 0 11256K 9512 C-7 PDIP-28 2 P +5.5V +150°C 114 173,000 0 11256K 9515 C


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PDF TecV256C SOJ-28 11V256C 11V256B 71024U SOJ-32 UM 9515 T 9527 S 1854 dip-28 p 9552 diode 931 p 7 6116L A101 A102 A104
1996 - Hyundai Semiconductor

Abstract: report on PLCC 100A484 CERDIP28 s 122 transistor "p 77" 1005 Ic Data plcc-32 vcc IC 741 data sheet DATASHEET OF IC 741 A104
Text: Temperature Operating Life testing is used to accelerate thermally activated failure mechanisms in IC , Stress Test (HAST) Purpose: HAST is used in order to evaluate the reliability of non-hermetic IC , 9441 C-5 PDIP-28 2 P +5.5V +125°C 116 116,000 0 72401 9422 C-5 PDIP , -6 CERDIP-28 2 D +5.5V +125°C 45 45,000 0 7205 9436 C-6 PDIP-28 2 A , 116,000 0 7206 9441 C-6 PDIP-28 2 D +5.5V +125°C 116 116,000 0


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PDF 72103Y PLCC-44 2205W PQFP-64 7200T PDIP-28 7201T PLCC-32 72245X Hyundai Semiconductor report on PLCC 100A484 CERDIP28 s 122 transistor "p 77" 1005 Ic Data plcc-32 vcc IC 741 data sheet DATASHEET OF IC 741 A104
1995 - 71B74

Abstract: ss 9509 6167 INTEGRATED DEVICE TECHNology 7164 SRAM 6116 9418 had 11256 A110 A106 A102
Text: used to accelerate thermally activated failure mechanisms in IC components by the application of high , evaluate the reliability of non-hermetic IC components in humid environments. It employs severe conditions , /2 C-7 PDIP-28 3 A 116/0 116/0 116/0 9420 C-7 PDIP-28 2 A 113 , -7 PDIP-28 2 L 116/0 115/0 114/0 11256 9426 C-7 PDIP-28 3 S 116/0 , -20 PDIP-20 PDIP-20 SOJ-28 SOJ-32 SOJ-32 SOJ-28 SOJ-28 SOJ-28 PDIP-28 SOJ-28 SOJ-28 SOJ-28 SOJ


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PDF PDIP-28 SOIC-28 11V256 SOJ-28 TQFP-80 71V256 TSOP-28 300cy 71B74 ss 9509 6167 INTEGRATED DEVICE TECHNology 7164 SRAM 6116 9418 had 11256 A110 A106 A102
1995 - power supply ic 9435

Abstract: 9435, ic ic 9435 9435 49C460 report on PLCC olin 7026 SRAM 6116 malaysia IC f 9222 l
Text: used to accelerate thermally activated failure mechanisms in IC components by the application of high , evaluate the reliability of non-hermetic IC components in humid environments. It employs severe conditions , 7200 9411 C-6 PLCC-32 2 A 116/0 7202 9406 C-6 PDIP-28 2 P 116/0 116/0 7203 9414 C-6 PDIP-28 2 A 116/0 116/11 Calendar Quarter: Q4'94 72230 9222 C-5 PDIP-28 2 A 116/0 72401 9432 C-5 PDIP-32 2 D 116/0 72402


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PDF PDIP-28 SOIC-28 11V256 SOJ-28 TQFP-80 71V256 TSOP-28 300cy power supply ic 9435 9435, ic ic 9435 9435 49C460 report on PLCC olin 7026 SRAM 6116 malaysia IC f 9222 l
1996 - IMSC012-P20S

Abstract: ST9291J7B1 STG1764X-13 IMSC004G20S ST6371J3B1 microcontroller ST9036 ST9293J9B1 ST6375BB1 EF6854 EF68B09
Text: Timer Package PDIP40, PLCC44 PDIP20, PSO20 PDIP28 , PSO28, PLCC28 PDIP40, PLCC44 68000 FAMILY - , , Package PDIP40 PDIP40 PDIP40 PDIP40 PDIP40 PDIP40 PDIP40 PDIP40 PDIP28 PDIP24 PDIP28 PDIP40 PDIP28 PDIP24 PDIP28 PDIP40 PDIP28 PDIP24 PDIP28 PDIP28 High Performance MPU, 1.5 MHz 68A09 With External Clock, 1.5 , None 256 256 256 256 256 256 256 384 512 512 512 512 512 896 PDIP28 PSO28 PDIP28 PSO28 PDIP28 PSO28 CDIP28W CDIP28W PDIP28 PSO28 PDIP28 PSO28 PDIP28 PSO28 PDIP28 PSO28 CDIP28W PDIP28 PSO28 PSDIP56 PSDIP56


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PDF ST486DC ST486DX2-66GS ST486DX2-80GS ST486DX4V75HS ST486DX4V10HS ST486DX4V12HS ST5X86V10HS ST6X86P90 ST6X86P120 ST6X86P133 IMSC012-P20S ST9291J7B1 STG1764X-13 IMSC004G20S ST6371J3B1 microcontroller ST9036 ST9293J9B1 ST6375BB1 EF6854 EF68B09
2004 - ATTINY26L-8PJ

Abstract: TQFP32 footprint 4061B IC ATMEGA16 ATMEGA8 rs232 atmega32 microcontroller interface with lcd atmega128 QFN64 tiny11 ATMEGA88-20MU MLF32 ATMEGA168-20AI
Text: MLF32 PDIP20 SOIC20 MLF32 PDIP20 SOIC20 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 , 20 8 8 8 8 8 8 8 8 16 16 16 16 16 16 16 16 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32 TQFP32 PDIP28 MLF32


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PDF 4061B 16-bit CH-1705 4061B-AVR-09/04/1M ATTINY26L-8PJ TQFP32 footprint IC ATMEGA16 ATMEGA8 rs232 atmega32 microcontroller interface with lcd atmega128 QFN64 tiny11 ATMEGA88-20MU MLF32 ATMEGA168-20AI
2004 - M5480

Abstract: pin diagram of ic 5480 M5451 PDIP28
Text: PDIP28 (Plastic Package) RELAY DRIVER 28 INSTRUMENTATION READOUTS DESCRIPTION The M5480 , POWER DISSIPATION OF THE IC The power dissipation of the IC can be limited using different , diodes are properly chosen. The total power dissipation of the IC depends, in a first approximation , the IC depends only on the number of segments activated. 6/10 M5480 PART NUMBERING Table 4. Order Codes Part Number Package Temperature Range M5480 PDIP28 -25 to 85 °C 7/10


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PDF M5480 PDIP28 M5480 M5451 28-pin pin diagram of ic 5480 PDIP28
PSB45030

Abstract: 45030-T 45030 hf electret microphone siemens PSB 2160 H piezo microphone preamplifier ic vr PDIP28
Text: Ordering Code Q67000-A6020 Q67000-A6015 Package P-DIP-28 P-DSO-28 (SMD) The PBS 45030 is an 1C for , and supply voltage regulator feeds the circuit itself and delivers two constant voltages Vr and Vs for , telephone handset operation), when the IC open or high), is shown in figure 4. required current depends on , ensure a good AC decoupling in the IC , caused by varying current in the speaker amplifier, a filter capacitor of min. 100 nF close to the IC is necessary. Figure 3 Supply Current versus Supply Voltage


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PDF 45030-T PSB45030 45030-T 45030 hf electret microphone siemens PSB 2160 H piezo microphone preamplifier ic vr PDIP28
1997 - iC-VR-PDIP28

Abstract: iC-VR GND67 CHN 507 ic vr PDIP28 PDIP28 PLCC44 AG401
Text: in 24V industrial applications PACKAGES PLCC44 PDIP28 BLOCK DIAGRAM Input/Output , the cause of the short circuit has been eliminated. The shutdown at overtemperature protects the IC , BIDIRECTIONAL µP INTERFACE TO 24V Rev A0, Page 4/13 PACKAGES PDIP28 to JEDEC Standard PIN CONFIGURATION PDIP28 (top view) PIN FUNCTIONS PDIP28 No. Name Function Description No. Name 1 2 , B B B B For PDIP28 version the following pins of PLCC44 package are internally connected: GND


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PDF 100mAdc 500mApeak V/10mA, V/500mA l9-6135-9292-0 iC-VR-PDIP28 iC-VR GND67 CHN 507 ic vr PDIP28 PDIP28 PLCC44 AG401
ST62T65BM

Abstract: ST62E60/T60
Text: selectable size (in program EPROM) 128 bytes 128 bytes PDIP20 PDIP28 PS020 PS028 PDIP20, PS 020 (ST62T60B) packages PDIP28 , P S 028 (ST62T65B) packages FDIP20W (ST62E60B) packages ià , [ 12 17 ] PA5 / Ain Ain / PA1 [ 13 16 ] PA4 / Ain Ain / PA2 [ 14 15 ] PA3 / Ain VR 001822 PC2 , / Ain VR 001821 Note 1 . This pin is also the V p p input tor EPROM based devices Figure 3 , crystal, a ceram ic resonator, an external clock signal or an RC network can be connected in order to


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PDF ST62E60B, ST62E65B, PDIP20 PDIP28 PS020 PS028 PDIP20, ST62T60B) PDIP28, ST62T65B) ST62T65BM ST62E60/T60
1996 - data sheet IC 7217

Abstract: 7217 IC S 1854 report on PLCC MQUAD malaysia IC transistor 9529 IDT QUALITY & RELIABILITY MONITOR REPORT PLCC-52 9529
Text: failure mechanisms in IC components by the application of high temperatures and the use of dynamic bias , : HAST is used in order to evaluate the reliability of non-hermetic IC components in humid environments , @ Stress Fails Pkg Calendar Quarter: Q3'95 72105 9509 C-5 PDIP-28 2 S +5.5V , 9510 C-6 PDIP-28 2 P +5.5V 125°C 116 116,000 0 72205 9511 C-6 PQFP , -6 PQFP-64 2 X +5.5V +125°C 116 116,000 0 7205Y 9448 C-6 PDIP-28 2 A


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PDF TecV256C SOJ-28 11V256C 11V256B 71024U SOJ-32 data sheet IC 7217 7217 IC S 1854 report on PLCC MQUAD malaysia IC transistor 9529 IDT QUALITY & RELIABILITY MONITOR REPORT PLCC-52 9529
2004 - Not Available

Abstract: No abstract text available
Text: – INDUSTRIAL CONTROL INDICATION ■1 PDIP28 (Plastic Package) RELAY DRIVER ■28 , DRIVER CLOCK DATA 5/10 M5480 POWER DISSIPATION OF THE IC The power dissipation of the IC , connected diodes is quite stable if the diodes are properly chosen. The total power dissipation of the IC , VOUT+ VD In this configuration VOUT + VD is constant. The total power dissipation of the IC depends , Number Package Temperature Range M5480 PDIP28 -25 to 85 °C 7/10 M5480 PACKAGE


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PDF M5480 PDIP28 M5480 M5451 28-pin
1997 - A101

Abstract: A102 A104 A106 A110 IDT QUALITY & RELIABILITY MONITOR REPORT
Text: failure mechanisms in IC components by the application of high temperatures and the use of dynamic bias , IC components in humid environments. It employs severe conditions of temperature, pressure, humidity , 9548 C-7 P-DIP-28 3 Y +5.5V +150°C 116 58,000 0 11256L 9549 C-7 SOJ , ,000 0 11V256C 3.3V 9537 C-7E P-DIP-28 3 Y +3.6V +150°C 116 58,000 0 , '96 71B74M 9539 B-4 SOJ-28 2 I 71256K 9533 C-7 P-DIP-28 2 71256K 9543 C


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PDF VII-15 A101 A102 A104 A106 A110 IDT QUALITY & RELIABILITY MONITOR REPORT
1997 - H9549

Abstract: h9627 79r3081 memory 9652 Y9709 7015X H9541 MQUAD h961 report on PLCC
Text: used to accelerate thermally activated failure mechanisms in IC components by the application of high , reliability of non-hermetic IC components in humid environments. It employs severe conditions of temperature , -32 PLCC-32 P-DIP-28 P-DIP-28 P-DIP-28 P-DIP-28 PLCC-32 PLCC-32 2 2 2 2 2 2 2 2 2 2 P , '96 9639 9543 9623 9619 9637 C-7 C-7 C-7 C-7 C-7 PLCC-32 PLCC-32 PLCC-32 P-DIP-28 P-DIP-28 , -32 PDIP-28 PLCC-32 PDIP-28 PDIP-28 PDIP-18 N T H N P H P 45/0 45/0 45/0 45/0 45/0 45


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PDF 71V280Y PQFP-128 300cycle VII-13 H9549 h9627 79r3081 memory 9652 Y9709 7015X H9541 MQUAD h961 report on PLCC
1996 - power supply ic 9435

Abstract: 9435 72 100A484 datasheet and application 7217 malaysia IC v9452 report on PLCC T 9527 PDIP-48 MQUAD
Text: Temperature Operating Life testing is used to accelerate thermally activated failure mechanisms in IC , Stress Test (HAST) Purpose: HAST is used in order to evaluate the reliability of non-hermetic IC , 9441 C-5 PDIP-28 2 P +5.5V +125°C 116 116,000 0 72401 9422 C-5 PDIP , -6 CERDIP-28 2 D +5.5V +125°C 45 45,000 0 7205 9436 C-6 PDIP-28 2 A , 116,000 0 7206 9441 C-6 PDIP-28 2 D +5.5V +125°C 116 116,000 0


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PDF SOJ-28 11256L 11V256C 71028T 71024T SOJ-32 power supply ic 9435 9435 72 100A484 datasheet and application 7217 malaysia IC v9452 report on PLCC T 9527 PDIP-48 MQUAD
1997 - IC 9637

Abstract: 71124X pqfp100 11256E A101 A110 A106 A104 A102 IDT QUALITY & RELIABILITY MONITOR REPORT
Text: used to accelerate thermally activated failure mechanisms in IC components by the application of high , reliability of non-hermetic IC components in humid environments. It employs severe conditions of temperature , -8 C-8 C-8 C-8 C-8 C-8 C-9 C-8 C-8 C-8 C-8 C-8 C-8 P-DIP-20 P-DIP-28 PQFP-100 SOJ , -28 SOIC-24 SOJ-24 SOJ-24 SOIC-24 P-DIP-24 SOJ-20 P-DIP-28 SOJ-28 SOJ-28 P-DIP-28 P-DIP-28 P-DIP-28 , -24 P-DIP-28 SOJ-28 SOJ-28 P H P H B 45/0 45/0 45/0 45/0 45/0 Calendar Quarter: 6168Q


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PDF 71V280Y PQFP-128 300cycle VII-13 IC 9637 71124X pqfp100 11256E A101 A110 A106 A104 A102 IDT QUALITY & RELIABILITY MONITOR REPORT
1997 - H9549

Abstract: h954 X9642 h9610 SBGA-272 A110 A106 A104 A102 A101
Text: failure mechanisms in IC components by the application of high temperatures and the use of dynamic bias , IC components in humid environments. It employs severe conditions of temperature, pressure, humidity , Quarter: Q1'96 72105Z 9530 C-5 PDIP-28 2 S +5.5V +125°C 116 116,000 0 72401Y , +5.5V +125°C 111 111,000 0 7205Y 9512 C-6 PDIP-28 2 P +5.5V +125°C 116 , -7 TQFP-64 2 A +5.5V +125°C 116 348,000 0 7202S 9526 C-7 PDIP-28 2 P


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PDF VII-15 H9549 h954 X9642 h9610 SBGA-272 A110 A106 A104 A102 A101
A 4506

Abstract: 8 pin ic A 4506 ic a 4506 A4506 PSB RESISTORS ic psb 4505 Q67000-A6005 PSB45030 PSB4505 ic vr PDIP28
Text: Package P-DIP-28 P-DIP-28 P-DIP-28 P-DIP-28 Type PSB PSB PSB PSB The Enhanced Speech Circuits (ESC , the internal output impedance is complex 3 supply outputs for external circuits: VR E F -1 .2 6 V , power dissipation in the IC · · · · · · · · · · · · · · Siemens Aktiengesellschaft 783 PSB , - PSB 4506 PSB 4506A Figure 3 Block Diagram (complex impedance) ^R IF V c iC V ^ c C l ^ C C 2 ^ L , adjustment) Reduction of the power dissipation in the IC Adjustment of ycc1 Adjustment of VCC1 Typ. Value 33


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PDF Q67000-A8161 Q67000-A6005 Q67000-A8211 Q67000-A6004 P-DIP-28 P-DIP-28 4506/4506A PSB4505 A 4506 8 pin ic A 4506 ic a 4506 A4506 PSB RESISTORS ic psb 4505 PSB45030 ic vr PDIP28
2004 - M5480

Abstract: M5451 PDIP28
Text: INSTRUMENTATION READOUTS ro P PDIP28 (Plastic Package) INDUSTRIAL CONTROL INDICATION s) t , ( 23 SEGMENTS M5480 DISPLAY DRIVER CLOCK DATA 5/10 M5480 POWER DISSIPATION OF THE IC The power dissipation of the IC can be limited using different configurations. Figure 8. +VC , connected diodes is quite stable if the diodes are properly chosen. The total power dissipation of the IC , the IC depends only on the number of segments activated. M5480 PART NUMBERING Table 4. Order


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PDF M5480 PDIP28 M5480 M5451 28-pin PDIP28
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