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    DSA0090579.pdf by Freescale Semiconductor

    • Whisker Formation on Tin Plated Cu based Leadframes Results and Conclusion 29 October 2004 Content · · · · · Introduction Experience E4 Main cause whisker growth on Cu LF Countermeasu
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    Atotech c14415 C18070 C18090 C19210 C1940 C19400 C50710 C70250 c70250 composition cte 3080 Cu3Sn Cu6Sn5 CuCrSiTi CuZn10 FeNi42 olin 194 olin 7025 Olin-194 Pyramid Shipley ST-200 ST-300 whisker Sn

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