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KLA-Tenco (102)

Semiconductor Equipment Industry

KLA-Tencor continues to serve the semiconductor equipment industry and also a number of other industries, including the light emitting diode (LED) and data storage, as well as general materials research. With a comprehensive portfolio of yield management products, systems, services, software and expertise, KLA-Tencor helps nanoeletronics manufacturers manage yield throughout their fabrication process—from research and development to final volume production.

Showing 1 to 102 of 102 entries
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Klat Fact-sheet Japanese - Japan - MEDIA CENTER Klat Fact-sheet Japanese : Japan (PDF)
KLAT Fact-Sheet V8 - Print Version (US) - Fact Sheet KLAT Fact-Sheet V8 : Print Version (US) (PDF)
Technology Drive Map - Technology Drive Campus Map - Offices Maps Technology Drive Map : Technology Drive Campus Map (PDF)
Fact Sheet08 Taiwan 012009 - Print Version (Taiwan) - Fact Sheet Fact Sheet08 Taiwan 012009 : Print Version (Taiwan) (PDF)
ICOS T640 Brochure - ICOS T640 Brochure ICOS T640 Brochure : ICOS T640 Brochure (PDF)
KLAT Trifod T830 V8 FINAL - ICOS T830 Brochure KLAT Trifod T830 V8 FINAL : ICOS T830 Brochure (PDF)
Index.php?option=com Joomdoc&task=document.download&path=SensArray Product Line Brochure 0514FINAL - SensArray Wafer Level Metrology overview - In Situ Process Monitoring Index.php?option=com Joomdoc&task=document.download&path=SensArray Product Line Brochure 0514FINAL : SensArray Wafer Level Metrology overview (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=TeronSL650 Press Release May 2014 Final Korean - TeronSL650 Press Release (Korean) - Korea Index.php?option=com Joomdoc&task=document.download&path=TeronSL650 Press Release May 2014 Final Korean : TeronSL650 Press Release (Korean) (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=20141127 KLA EETimes 1xnmInspectionPortfolio Paperinterview Taiwan - 1xnm Inspection Portfolio (Traditional Chinese) - Taiwan Index.php?option=com Joomdoc&task=document.download&path=20141127 KLA EETimes 1xnmInspectionPortfolio Paperinterview Taiwan : 1xnm Inspection Portfolio (Traditional Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=5D Portfolio Press Release Aug 2014 Final Traditional Chinese - 5D Portfolio Press Release (Traditional Chinese) - Taiwan Index.php?option=com Joomdoc&task=document.download&path=5D Portfolio Press Release Aug 2014 Final Traditional Chinese : 5D Portfolio Press Release (Traditional Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=InspectionReviewPortfolio Press Release July 2014 Final Traditional Chinese - InspectionReviewPortfolio press release (Traditional Chinese) - Taiwan Index.php?option=com Joomdoc&task=document.download&path=InspectionReviewPortfolio Press Release July 2014 Final Traditional Chinese : InspectionReviewPortfolio press release (Traditional Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=TeronSL650 Press Release May 2014 Final TraditionalChinese - TeronSL650 Press Release (Traditional Chinese) - Taiwan Index.php?option=com Joomdoc&task=document.download&path=TeronSL650 Press Release May 2014 Final TraditionalChinese : TeronSL650 Press Release (Traditional Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=291x EDR7100 Press Release Jul 2013 Final Traditional Chinese - 2910 eDR-7100 Jul 2013 (Traditional Chinese) - Taiwan Index.php?option=com Joomdoc&task=document.download&path=291x EDR7100 Press Release Jul 2013 Final Traditional Chinese : 2910 eDR-7100 Jul 2013 (Traditional Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=NanoPoint Press Release Apr 2013 Final Traditional Chinese - NanoPoint press release Apr 2013 (Traditional Chinese) - Taiwan Index.php?option=com Joomdoc&task=document.download&path=NanoPoint Press Release Apr 2013 Final Traditional Chinese : NanoPoint press release Apr 2013 (Traditional Chinese) (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=rapid Press Release China Final 8 16 2016 - Mask Inspection Portolfio Index.php?option=com Joomdoc&task=document.download&path=rapid Press Release China Final 8 16 2016 : Mask Inspection Portolfio (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=AdvPackaging CIRCL-AP ICOST830 PressRelease Apr2015 SimplifiedChinese - Advanced Packaging CIRCL-AP ICOST830 Press Release April 2015 (Simplified Chinese) Index.php?option=com Joomdoc&task=document.download&path=AdvPackaging CIRCL-AP ICOST830 PressRelease Apr2015 SimplifiedChinese : Advanced Packaging CIRCL-AP ICOST830 Press Release April 2015 (Simplified Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=5D Portfolio Press Release Aug 2014 Final Simplified Chinese - 5D Portfolio Press Release (Simplified Chinese) Index.php?option=com Joomdoc&task=document.download&path=5D Portfolio Press Release Aug 2014 Final Simplified Chinese : 5D Portfolio Press Release (Simplified Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=InspectionReviewPortfolio Press Release July 2014 Final Simplified Chinese - InspectionReviewPortfolio press release (Simplified Chinese) Index.php?option=com Joomdoc&task=document.download&path=InspectionReviewPortfolio Press Release July 2014 Final Simplified Chinese : InspectionReviewPortfolio press release (Simplified Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=TeronSL650 Press Release May 2014 Final SimplifiedChinese - TeronSL650 Press Release (Simplified Chinese) Index.php?option=com Joomdoc&task=document.download&path=TeronSL650 Press Release May 2014 Final SimplifiedChinese : TeronSL650 Press Release (Simplified Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=291x EDR7100 Press Release Jul 2013 Final Simplified Chinese - 2910 eDR-7100 Jul 2013 (Simplified Chinese) Index.php?option=com Joomdoc&task=document.download&path=291x EDR7100 Press Release Jul 2013 Final Simplified Chinese : 2910 eDR-7100 Jul 2013 (Simplified Chinese) (PDF)
Index.php?option=com Joomdoc&task=document.download&path=NanoPoint Overview - NanoPoint Overview Index.php?option=com Joomdoc&task=document.download&path=NanoPoint Overview : NanoPoint Overview (PDF)
Index.php?option=com Joomdoc&task=document.download&path=ProcessWindowQualification NanoPoint - Process Window Qualification using NanoPoint Index.php?option=com Joomdoc&task=document.download&path=ProcessWindowQualification NanoPoint : Process Window Qualification using NanoPoint (PDF)
Index.php?option=com Joomdoc&task=document.download&path=December 07 9241 JP - English D3 - Accelerate Yield: Design Based Inspection Index.php?option=com Joomdoc&task=document.download&path=December 07 9241 JP - English D3 : Accelerate Yield: Design Based Inspection (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=Comparing Patterned Wafer Inspectors - WATIP - Comparing Patterned Wafer Inspectors - WATIP Index.php?option=com Joomdoc&task=document.download&path=Comparing Patterned Wafer Inspectors - WATIP : Comparing Patterned Wafer Inspectors - WATIP (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Immersion Lithography Defect Control - Immersion Lithography Defect Control Index.php?option=com Joomdoc&task=document.download&path=Immersion Lithography Defect Control : Immersion Lithography Defect Control (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=76361E Euv Mask - The Analysis of EUV Mask Defects Using a Wafer Defect Inspection System Index.php?option=com Joomdoc&task=document.download&path=76361E Euv Mask : The Analysis of EUV Mask Defects Using a Wafer Defect Inspection System (PDF)
Index.php?option=com Joomdoc&task=document.download&path=76360J Evu Mask Def - Assessing EUV Mask Defectivity Index.php?option=com Joomdoc&task=document.download&path=76360J Evu Mask Def : Assessing EUV Mask Defectivity (PDF)
Index.php?option=com Joomdoc&task=document.download&path=75201C Sys Defect - Systematic Defect Management by Design Aware Inspection Index.php?option=com Joomdoc&task=document.download&path=75201C Sys Defect : Systematic Defect Management by Design Aware Inspection (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=51a Process Win - Process Window Centering for 22 nm Lithography Index.php?option=com Joomdoc&task=document.download&path=51a Process Win : Process Window Centering for 22 nm Lithography (PDF)
Index.php?option=com Joomdoc&task=document.download&path=YMS08 New Decision - A New Decision Paradigm for Comparing Patterned Wafer Inspectors Index.php?option=com Joomdoc&task=document.download&path=YMS08 New Decision : A New Decision Paradigm for Comparing Patterned Wafer Inspectors (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Defect Monitoring On Memory Devices Using Broadband Brightfield Inspection - Defect Monitoring on Memory Devices Using Broadband Brightfield Inspection Index.php?option=com Joomdoc&task=document.download&path=Defect Monitoring On Memory Devices Using Broadband Brightfield Inspection : Defect Monitoring on Memory Devices Using Broadband Brightfield Inspection (PDF)
Index.php?option=com Joomdoc&task=document.download&path=YMS08 DBB English - Using Design Based Binning to Improve Defect Excursion Control for 45nm Production Index.php?option=com Joomdoc&task=document.download&path=YMS08 DBB English : Using Design Based Binning to Improve Defect Excursion Control for 45nm Production (PDF)
Index.php?option=com Joomdoc&task=document.download&path=YMS08 DCI English - Defect Criticality Index (DCI): A New Methodology to Improve DOI Sampling Rate Index.php?option=com Joomdoc&task=document.download&path=YMS08 DCI English : Defect Criticality Index (DCI): A New Methodology to Improve DOI Sampling Rate (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Advantages Of Broadband Illumination For Critical Defect Capture At The 65nm Node And Below - Advantages of Broadband Illumination for Critical Defect Capture at the 65nm Node and Below Index.php?option=com Joomdoc&task=document.download&path=Advantages Of Broadband Illumination For Critical Defect Capture At The 65nm Node And Below : Advantages of Broadband Illumination for Critical Defect Capture at the 65nm Node and Below (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Broadband Brightfield Inspection - Broadband Brightfield Inspection Enables Advanced Immersion Lithography Defect Detection Index.php?option=com Joomdoc&task=document.download&path=Broadband Brightfield Inspection : Broadband Brightfield Inspection Enables Advanced Immersion Lithography Defect Detection (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=KLA-Tencor KLARITY LED 022912 - Klarity LED Product Overview - KLARITY LED Index.php?option=com Joomdoc&task=document.download&path=KLA-Tencor KLARITY LED 022912 : Klarity LED Product Overview (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Comprehensive Inspection Techniques Can Underpin High-yield LED Manufacturing - Comprehensive inspection techniques can underpin high-yield LED manufacturing - KLARITY LED Index.php?option=com Joomdoc&task=document.download&path=Comprehensive Inspection Techniques Can Underpin High-yield LED Manufacturing : Comprehensive inspection techniques can underpin high-yield LED manufacturing (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Automated Defect Data Analysis Allows Comprehensive Yield Management In LED Manufacturing - Automated defect-data analysis allows comprehensive yield management in LED manufacturing - KLARITY LED Index.php?option=com Joomdoc&task=document.download&path=Automated Defect Data Analysis Allows Comprehensive Yield Management In LED Manufacturing : Automated defect-data analysis allows comprehensive yield management in LED manufacturing (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Klarity ACE XP Overview - Klarity ACE XP Product Overview - Klarity ACE XP Index.php?option=com Joomdoc&task=document.download&path=Klarity ACE XP Overview : Klarity ACE XP Product Overview (PDF)
Index.php?option=com Joomdoc&task=document.download&path=Klarity SSA Overview - Klarity SSA Product Overview - Klarity SSA Index.php?option=com Joomdoc&task=document.download&path=Klarity SSA Overview : Klarity SSA Product Overview (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=76381G - Use of Multiple Azimuthal Angles to Enable Advanced Scatterometry Applications - SpectraShape Family Index.php?option=com Joomdoc&task=document.download&path=76381G : Use of Multiple Azimuthal Angles to Enable Advanced Scatterometry Applications (PDF)
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Index.php?option=com Joomdoc&task=document.download&path=A New Decision Paradigm For Comparing Patterend Wafer Inspectors - A New Decision Paradigm For Comparing Patterned Wafer Inspectors - Puma Family Index.php?option=com Joomdoc&task=document.download&path=A New Decision Paradigm For Comparing Patterend Wafer Inspectors : A New Decision Paradigm For Comparing Patterned Wafer Inspectors (PDF)
Index.php?option=com Joomdoc&task=document.download&path=The Winning Streak - The Winning Streak: Advanced Darkfield Inspection for 65nm Design Rules and Below - Puma Family Index.php?option=com Joomdoc&task=document.download&path=The Winning Streak : The Winning Streak: Advanced Darkfield Inspection for 65nm Design Rules and Below (PDF)
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SensArray Diagnostics Collector V1.0.7 - SensArray Diagnostics Collector v.1.0.7 - Software Upgrades SensArray Diagnostics Collector V1.0.7 : SensArray Diagnostics Collector v.1.0.7 (ZIP)
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Index.php?option=com Joomdoc&task=document.download&path=2050 PO 120409 V1 - SensArray 2050 Product Overview - SensArray 2050 Index.php?option=com Joomdoc&task=document.download&path=2050 PO 120409 V1 : SensArray 2050 Product Overview (PDF)
Index.php?option=com Joomdoc&task=document.download&path=2070 PO 100710 - SensArray 2070 Product Overview - SensArray 2070 Index.php?option=com Joomdoc&task=document.download&path=2070 PO 100710 : SensArray 2070 Product Overview (PDF)
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