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HOLOGENIX (72)

Integrated Device

Hologenix first introduced the Magic Mirror surface inspection method to the semiconductor industry it became a standard in silicon wafer manufacturing. By 1995 the major silicon suppliers and many integrated device manufacturers were using this novel technology in QC/QA.

Showing 1 to 72 of 72 entries
Datasheet PDF or ZIP
NGS-2011 - NGS Presentation - NGS - Automated Defect Detection, Classification, and Metrology System      NGS-2011 : NGS Presentation (PDF)
NGS3500L-2010 - NGS Brochure - NGS - Automated Defect Detection, Classification, and Metrology System      NGS3500L-2010 : NGS Brochure (PDF)
SlipFinder - YIS-HM SlipfinderSystem Presentation - YIS-HM SlipFinder - Crystal Slip Defect Detection      SlipFinder : YIS-HM SlipfinderSystem Presentation (PDF)
YIS300SlipFinder-2011 - YIS-300HM Slipfinder System Brochure - YIS-HM SlipFinder - Crystal Slip Defect Detection      YIS300SlipFinder-2011 : YIS-300HM Slipfinder System Brochure (PDF)
COREMA-WT 150 mm Spec - COREMA-WT Specification - COREMA - WT System COREMA-WT 150 mm Spec : COREMA-WT Specification (PDF)
COREMA-RM spec - COREMA - RM Specification - COREMA - WT System COREMA-RM spec : COREMA - RM Specification (PDF)
COREMA-VTFlyer 2011-2 - COREMA - VT Flyer - COREMA - WT System COREMA-VTFlyer 2011-2 : COREMA - VT Flyer (PDF)
COREMA-ER spec - COREMA - ER Specifcation - COREMA - WT System COREMA-ER spec : COREMA - ER Specifcation (PDF)
SolarSimulatorCatalog - Solar Simulator Catalog for PV Cells - Pulse Solar Simulator for PV Modules SolarSimulatorCatalog : Solar Simulator Catalog for PV Cells (PDF)
PBS-Measurements-for-CMP - CMP Measurements - Subsurface & Surface Defect Detection and Characterization      PBS-Measurements-for-CMP : CMP Measurements (PDF)
MagicMirror-2016 - Magic Mirror Presentation - Defect Detection for Ultra-Flat Wafers      MagicMirror-2016 : Magic Mirror Presentation (PDF)
STRASBAUGHarticle - Article: Fine grinding of silicon wafers: a mathematical model for grinding marks - Defect Detection for Ultra-Flat Wafers      STRASBAUGHarticle : Article: Fine grinding of silicon wafers: a mathematical model for grinding marks (PDF)
MMpaperRiesz - Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography - Defect Detection for Ultra-Flat Wafers      MMpaperRiesz : Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography (PDF)
BACKSIDE GRINDING - Sample Magic Mirror Images Backside Grinding - Defect Detection for Ultra-Flat Wafers      BACKSIDE GRINDING : Sample Magic Mirror Images Backside Grinding (PDF)
200mm Batch Wafer Edge Inspection System-5 - Technical Specifications - Wafer Edge Inspection 200mm Batch Wafer Edge Inspection System-5 : Technical Specifications (PDF)
Yieldwerx - YieldWerx Brochure - Yield and Test Analysis Software Yieldwerx : YieldWerx Brochure (PDF)
ORC Pulse Analysis Spectro-Radiometer - Technical Specifications - Pulse Analysis Spectro-Radiometer ORC Pulse Analysis Spectro-Radiometer : Technical Specifications (PDF)
HyperCureBrochure-OCR - Technical Specifications - UV Curing System  HyperCureBrochure-OCR : Technical Specifications (PDF)
NGS-2011 - NGS Presentation - Latest Products NGS-2011 : NGS Presentation (PDF)
NGS3500L-2010 - NGS Brochure - Latest Products NGS3500L-2010 : NGS Brochure (PDF)
NGS-2011 - NGS Presentation NGS-2011 : NGS Presentation (PDF)
NGS3500L-2010 - NGS Brochure NGS3500L-2010 : NGS Brochure (PDF)
NGS-2011 - NGS Presentation NGS-2011 : NGS Presentation (PDF)
NGS3500L-2010 - NGS Brochure NGS3500L-2010 : NGS Brochure (PDF)
SlipFinder - YIS-HM SlipfinderSystem Presentation - Latest Products SlipFinder : YIS-HM SlipfinderSystem Presentation (PDF)
YIS300SlipFinder-2011 - YIS-300HM Slipfinder System Brochure - Latest Products YIS300SlipFinder-2011 : YIS-300HM Slipfinder System Brochure (PDF)
SlipFinder - YIS-HM SlipfinderSystem Presentation SlipFinder : YIS-HM SlipfinderSystem Presentation (PDF)
YIS300SlipFinder-2011 - YIS-300HM Slipfinder System Brochure YIS300SlipFinder-2011 : YIS-300HM Slipfinder System Brochure (PDF)
SlipFinder - YIS-HM SlipfinderSystem Presentation SlipFinder : YIS-HM SlipfinderSystem Presentation (PDF)
YIS300SlipFinder-2011 - YIS-300HM Slipfinder System Brochure YIS300SlipFinder-2011 : YIS-300HM Slipfinder System Brochure (PDF)
COREMA-WT 150 mm Spec - COREMA-WT Specification - Latest Products COREMA-WT 150 mm Spec : COREMA-WT Specification (PDF)
COREMA-RM spec - COREMA - RM Specification - Latest Products COREMA-RM spec : COREMA - RM Specification (PDF)
COREMA-VTFlyer 2011-2 - COREMA - VT Flyer - Latest Products COREMA-VTFlyer 2011-2 : COREMA - VT Flyer (PDF)
COREMA-ER spec - COREMA - ER Specifcation - Latest Products COREMA-ER spec : COREMA - ER Specifcation (PDF)
COREMA-WT 150 mm Spec - COREMA-WT Specification COREMA-WT 150 mm Spec : COREMA-WT Specification (PDF)
COREMA-RM spec - COREMA - RM Specification COREMA-RM spec : COREMA - RM Specification (PDF)
COREMA-VTFlyer 2011-2 - COREMA - VT Flyer COREMA-VTFlyer 2011-2 : COREMA - VT Flyer (PDF)
COREMA-ER spec - COREMA - ER Specifcation COREMA-ER spec : COREMA - ER Specifcation (PDF)
COREMA-WT 150 mm Spec - COREMA-WT Specification COREMA-WT 150 mm Spec : COREMA-WT Specification (PDF)
COREMA-RM spec - COREMA - RM Specification COREMA-RM spec : COREMA - RM Specification (PDF)
COREMA-VTFlyer 2011-2 - COREMA - VT Flyer COREMA-VTFlyer 2011-2 : COREMA - VT Flyer (PDF)
COREMA-ER spec - COREMA - ER Specifcation COREMA-ER spec : COREMA - ER Specifcation (PDF)
SolarSimulatorCatalog - Solar Simulator Catalog for PV Cells - Latest Products SolarSimulatorCatalog : Solar Simulator Catalog for PV Cells (PDF)
SolarSimulatorCatalog - Solar Simulator Catalog for PV Cells SolarSimulatorCatalog : Solar Simulator Catalog for PV Cells (PDF)
SolarSimulatorCatalog - Solar Simulator Catalog for PV Cells SolarSimulatorCatalog : Solar Simulator Catalog for PV Cells (PDF)
PBS-Measurements-for-CMP - CMP Measurements - Latest Products PBS-Measurements-for-CMP : CMP Measurements (PDF)
PBS-Measurements-for-CMP - CMP Measurements PBS-Measurements-for-CMP : CMP Measurements (PDF)
PBS-Measurements-for-CMP - CMP Measurements PBS-Measurements-for-CMP : CMP Measurements (PDF)
MagicMirror-2016 - Magic Mirror Presentation - Latest Products MagicMirror-2016 : Magic Mirror Presentation (PDF)
STRASBAUGHarticle - Article: Fine grinding of silicon wafers: a mathematical model for grinding marks - Latest Products STRASBAUGHarticle : Article: Fine grinding of silicon wafers: a mathematical model for grinding marks (PDF)
MMpaperRiesz - Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography - Latest Products MMpaperRiesz : Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography (PDF)
BACKSIDE GRINDING - Sample Magic Mirror Images Backside Grinding - Latest Products BACKSIDE GRINDING : Sample Magic Mirror Images Backside Grinding (PDF)
MagicMirror-2016 - Magic Mirror Presentation MagicMirror-2016 : Magic Mirror Presentation (PDF)
STRASBAUGHarticle - Article: Fine grinding of silicon wafers: a mathematical model for grinding marks STRASBAUGHarticle : Article: Fine grinding of silicon wafers: a mathematical model for grinding marks (PDF)
MMpaperRiesz - Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography MMpaperRiesz : Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography (PDF)
BACKSIDE GRINDING - Sample Magic Mirror Images Backside Grinding BACKSIDE GRINDING : Sample Magic Mirror Images Backside Grinding (PDF)
MagicMirror-2016 - Magic Mirror Presentation MagicMirror-2016 : Magic Mirror Presentation (PDF)
STRASBAUGHarticle - Article: Fine grinding of silicon wafers: a mathematical model for grinding marks STRASBAUGHarticle : Article: Fine grinding of silicon wafers: a mathematical model for grinding marks (PDF)
MMpaperRiesz - Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography MMpaperRiesz : Article: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography (PDF)
BACKSIDE GRINDING - Sample Magic Mirror Images Backside Grinding BACKSIDE GRINDING : Sample Magic Mirror Images Backside Grinding (PDF)
200mm Batch Wafer Edge Inspection System-5 - Technical Specifications 200mm Batch Wafer Edge Inspection System-5 : Technical Specifications (PDF)
200mm Batch Wafer Edge Inspection System-5 - Technical Specifications - Latest Products 200mm Batch Wafer Edge Inspection System-5 : Technical Specifications (PDF)
200mm Batch Wafer Edge Inspection System-5 - Technical Specifications 200mm Batch Wafer Edge Inspection System-5 : Technical Specifications (PDF)
Yieldwerx - YieldWerx Brochure - Latest Products Yieldwerx : YieldWerx Brochure (PDF)
Yieldwerx - YieldWerx Brochure Yieldwerx : YieldWerx Brochure (PDF)
ORC Pulse Analysis Spectro-Radiometer - Technical Specifications - Latest Products ORC Pulse Analysis Spectro-Radiometer : Technical Specifications (PDF)
Yieldwerx - YieldWerx Brochure Yieldwerx : YieldWerx Brochure (PDF)
ORC Pulse Analysis Spectro-Radiometer - Technical Specifications ORC Pulse Analysis Spectro-Radiometer : Technical Specifications (PDF)
ORC Pulse Analysis Spectro-Radiometer - Technical Specifications ORC Pulse Analysis Spectro-Radiometer : Technical Specifications (PDF)
HyperCureBrochure-OCR - Technical Specifications - Latest Products HyperCureBrochure-OCR : Technical Specifications (PDF)
HyperCureBrochure-OCR - Technical Specifications HyperCureBrochure-OCR : Technical Specifications (PDF)
HyperCureBrochure-OCR - Technical Specifications HyperCureBrochure-OCR : Technical Specifications (PDF)

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