Film Thickness Measurement Instruments
Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, film-thickness measurement instruments.
|Datasheet||PDF or ZIP|
|05-4-Vertical Scanning.pptx - Vertical-scanning interferometry - surface roughness||05-4-Vertical Scanning.pptx : Vertical-scanning interferometry (PDF)|
|Phase-Shifting-Interferometry.nb - Phase-shifting interferometry - surface roughness||Phase-Shifting-Interferometry.nb : Phase-shifting interferometry (PDF)|
|Filmetrics Troubleshooting Guide - Power Cycling e7s - Here's how. - Support Developing a New Application (Trying to measure a new material or has your film stack changed?)||Filmetrics Troubleshooting Guide - Power Cycling e7s : Here's how. (PDF)|
No Results Found