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Accuprobe (26)

Probe Ring Metal Ceramic Blades Z Adjustable Blade Spring Probes

Accuprobe, founded in 1976, develops, manufactures, and markets high performance probing and interface products for use in the testing of integrated and hybrid circuits. This company's proprietary products are used by manufacturers of semiconductors and hybrid circuits to electronically screen their products for defects before they are incorporated into electronics systems. Such screening is accomplished in conjunction with automated test equipment (ATE) which transmits electrical signals through interface circuitry to probe cards which make the electrical/mechanical contact with each circuit under test.

Showing 1 to 26 of 26 entries
Datasheet PDF or ZIP
PT01 Glossary - Glossary of Terms PT01 Glossary : Glossary of Terms (PDF)
PT02 Fixed Pattern Probe Cards - Fixed Pattern Probe Card PT02 Fixed Pattern Probe Cards : Fixed Pattern Probe Card (PDF)
PT03 Kelvin Probing - Measuring Accuracy and Kelvin Probing PT03 Kelvin Probing : Measuring Accuracy and Kelvin Probing (PDF)
PT04 GaAs & High Frequency - Speed Devices PT04 GaAs & High Frequency : Speed Devices (PDF)
PT05 Probe Card Wiring - Probe Card Wiring PT05 Probe Card Wiring : Probe Card Wiring (PDF)
PT06 Card Handling & Care - Probe Card Care and Handling PT06 Card Handling & Care : Probe Card Care and Handling (PDF)
PT07 Edge Sensors - Edge Sensors for Fixed Pattern Probes PT07 Edge Sensors : Edge Sensors for Fixed Pattern Probes (PDF)
PT08 Contact Resistance - Probe Contact Resistance PT08 Contact Resistance : Probe Contact Resistance (PDF)
PT09 High Frequency Probing - High Frequency Probing PT09 High Frequency Probing : High Frequency Probing (PDF)
PT10 Tip Material Size and Shape - Tip Material, Shape and Size PT10 Tip Material Size and Shape : Tip Material, Shape and Size (PDF)
PT11 Probe Mark Analysis - Probe Mark Analysis PT11 Probe Mark Analysis : Probe Mark Analysis (PDF)
PT12 Probing Power Devices - Probing Power Devices PT12 Probing Power Devices : Probing Power Devices (PDF)
PT13 Planarization - The Importance of Probe to probe Planerization PT13 Planarization : The Importance of Probe to probe Planerization (PDF)
PT14 Over Travel & Laser Trim - Overtravel and Laser Trimming PT14 Over Travel & Laser Trim : Overtravel and Laser Trimming (PDF)
PT15 Tips Flat vs Round - Tip Shape: Flat vs. Radius PT15 Tips Flat vs Round : Tip Shape: Flat vs. Radius (PDF)
PT16 High Temperature Probing - Probe Cards and High Temperature PT16 High Temperature Probing : Probe Cards and High Temperature (PDF)
PT19 Epoxy Ring Replacement - Epoxy Ring Probe Array Replacement PT19 Epoxy Ring Replacement : Epoxy Ring Probe Array Replacement (PDF)
PT20 Minimizing Probe Scrub - Minimizing Probe Scrub PT20 Minimizing Probe Scrub : Minimizing Probe Scrub (PDF)
PT21 Probing Flip Chips and Bumps - Probing Flip Chips and Bumps PT21 Probing Flip Chips and Bumps : Probing Flip Chips and Bumps (PDF)
Probity vol1 no1 - Volume 1, Issue 1 - April 2002 - Newsletters Probity vol1 no1 : Volume 1, Issue 1 - April 2002 (PDF)
Probity Vol1 No2 - Volume 1, Issue 2 - August 2002 - Newsletters Probity Vol1 No2 : Volume 1, Issue 2 - August 2002 (PDF)
Probity Vol2 No1 - Volume 2, Issue 1 - August 2003 - Newsletters Probity Vol2 No1 : Volume 2, Issue 1 - August 2003 (PDF)
HF Applications - High Frequency Probing HF Applications : High Frequency Probing (PDF)
Probing Optical Components - Probing Optical Components Probing Optical Components : Probing Optical Components (PDF)
Probity Vol4 No1 - Volume 4, Issue 1 - June 2005 - Newsletters Probity Vol4 No1 : Volume 4, Issue 1 - June 2005 (PDF)
Embedded Passive - Embedded Passives Embedded Passive : Embedded Passives (PDF)

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