The Datasheet Archive

Top Results (4)

Part Manufacturer Description Datasheet Download Buy Part
DG306AAK/883 Atmel Corporation DG306AAK/883
RN2108ACT(TPL3) Toshiba America Electronic Components PRE-BIASED DIGITAL TRANSISTOR,50V V(BR)CEO,80MA I(C),SOT-883
CEDM8001 TR Central Semiconductor Corp MOSFET P-CH 20V 0.1A SOT-883
CEDM8001 BK Central Semiconductor Corp MOSFET P-CH 20V 0.1A SOT-883
SF Impression Pixel

Search Stock (38)

  You can filter table by choosing multiple options from dropdownShowing 38 results of 38
Part Manufacturer Supplier Stock Best Price Price Each Buy Part
AD1674TD/883 Analog Devices Inc New Advantage Corporation 1 - -
AD1674TD/883B Analog Devices Inc Richardson RFPD - $202.76 $197.13
AD390TD/883B Analog Devices Inc Richardson RFPD - $2975.10 $2892.46
AD394TD/883B Analog Devices Inc Rochester Electronics 1 $2085.70 $1694.63
AD5212TD/883 Analog Devices Inc Bristol Electronics 11 - -
AD5212TD/883B Analog Devices Inc Richardson RFPD - $1028.63 $1000.06
AD5214TD/883B Analog Devices Inc Rochester Electronics 5 $366.52 $297.79
AD534TD/883B Analog Devices Inc Richardson RFPD - $235.57 $229.03
AD534TD/883B Analog Devices Inc New Advantage Corporation 5 - -
AD558TD/883B Analog Devices Inc Richardson RFPD - $84.07 $81.74
AD558TD/883B Analog Devices Inc Bristol Electronics 3 - -
AD558TD883B Analog Devices Inc ComS.I.T. 7 - -
AD561TD/883B Analog Devices Inc Rochester Electronics 328 $449.65 $365.34
AD565ATD/883B Analog Devices Inc Richardson RFPD - $350.44 $340.71
AD565ATD/883B Analog Devices Inc Rochester Electronics 458 $510.35 $414.66
AD574ATD/883B Analog Devices Inc Richardson RFPD - $304.97 $296.50
AD632TD/883B Analog Devices Inc Richardson RFPD - $131.66 $128.00
AD674BTD/883B Rochester Electronics - - -
AD674BTD/883B Analog Devices Inc Richardson RFPD - $256.17 $249.06
AD677TD/883B Analog Devices Inc Rochester Electronics 126 $363.29 $295.18
AD677TD/883B Analog Devices Inc Richardson RFPD - $249.47 $242.54
AD678TD/883B Analog Devices Inc Richardson RFPD - - -
AD678TD/883B Analog Devices Inc Rochester Electronics 138 $581.30 $472.31
AD679TD/883B Analog Devices Inc Richardson RFPD - $466.20 $453.25
AD679TD/883B Analog Devices Inc Rochester Electronics 193 $678.91 $551.62
AD774BTD/883B Analog Devices Inc Richardson RFPD - $281.86 $274.03
AD9002TD/883B Analog Devices Inc Rochester Electronics 200 $869.23 $706.25
AD9034TD/883B Analog Devices Inc Rochester Electronics 29 $5122.28 $4161.85
AD9058ATD/883B Analog Devices Inc Richardson RFPD - $591.20 $574.78
AD9058ATD/883B Analog Devices Inc Rochester Electronics 356 $860.96 $699.53
HI1-565ATD/883 Harris Semiconductor Rochester Electronics 29 $100.04 $81.28
HI1-574ATD/883 Rochester Electronics - - -
HI1-574ATD/883 Intersil Corporation Rochester Electronics 274 $92.22 $74.93
HI1-574ATD/883B Rochester Electronics - - -
HI1-674ATD/883 Renesas Electronics Corporation Avnet - $261.39 $236.09
HI1-674ATD/883 Harris Semiconductor Bristol Electronics 2 - -
MP7683TD883 Micro Power Electric New Advantage Corporation 11 - -
RM555TD/883B Raytheon Bristol Electronics 25 $36.00 $33.23

No Results Found

Show More

TD-883 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
Not Available

Abstract: No abstract text available
Text: requirements for a microprocessor monitor. This circuit is processed in accordance with MIL-STD- 883 and is , extent specified, with MIL-STD- 883 . 3.2 Screening shall be in accordance with Method 5004 of MIL-STD- 883 , inspection shall be in accordance with Method 5005 of MIL-STD- 883 includ­ ing groups A, B, C, and D , , Method 5005 of MIL-STD- 883 shall be omitted. 3.4 Groups C and D inspections: a. End-point electrical parameters shall be as specified in Table 1. b. Steady-state life test (Method 1005 of MIL-STD- 883 ): (1


OCR Scan
PDF MIL-STD-883 MAX1232M /883B 20-Pin 150ms 250ms 260ms 600ms 1000ms 625ms
li19

Abstract: No abstract text available
Text: Ordering Information PACKAGE Ceramic DIP / 883 * TEMPERATURE RANGE 90ns -40°C to +85°C / 883 * HM1-6617B/ 883 5962-8954001JA HM6-6617B-9 HM6-6617-9 -55°C to +125°C HM6-6617B/ 883 HM6-6617/ 883 5962-8954002LA HM4-6617-9 HM4-6617B/ 883 HM4-6617/ 883 5962-8954002XA -55°C to +125°C SMD# 5962-8954001 LA HM4-6617B-9 -40°C to +85°C / 883 * HM1-6617/ 883 , HM1-6617B-9 5962-8954001XA Respective / 883 specifications are included at the end of this data


OCR Scan
PDF HM-6617 90/120ns HM-66ITIONS HM-6617 li19
6617

Abstract: smd hm6
Text: Ordering Information PACKAGE Ceramic DIP / 883 * SMD# SLIM / 883 * SMD# LCC / 883 * SMD# -40°C to +85°C -55°C to , -6617B-9 HM1-6617B/ 883 5962-8954002JA HM6-6617B-9 HM6-6617B/ 883 5962-8954002LA HM4-6617B-9 HM4-6617B/ 883 5962-8954002XA 120ns HM1-6617-9 HM1-6617/ 883 5962-8954001JA HM6-6617-9 HM6-6617/ 883 5962-8954001 LA HM4-6617-9 HM4-6617/ 883 5962-8954001XA * Respective /8B3 specifications are included at the end of this data


OCR Scan
PDF HM-6617 HM-6617 ide120 6617 smd hm6
2002 - Not Available

Abstract: No abstract text available
Text: and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in MilStd- 883 . Screening shall be in accordance with Method 5004 of Mil-Std- 883 . Burn-in test Method 1015: 1. Test , specified in Table 2. Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std- 883 , . Selected subgroups in Table 1, Method 5005 of Mil-Std- 883 shall be omitted. Group C and D inspections: a , Mil-Std- 883 : 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except


Original
PDF MAX1232MJA/883B MAX1232MLP/883B 5962-9451401MPA 5962-9451401M2C Mil-Std-1835 CQCC1-N20 Mil-Std-883: Mil-Std-883. Mil-Std-883
2000 - 5962-9451401MPA

Abstract: smd diode t8 power t8 smd transistor CDIP2-T8 MAX1232MJA 5962-9451401M2C CQCC1-N20 smd ja
Text: specified in MilStd- 883 . Screening shall be in accordance with Method 5004 of Mil-Std- 883 . Burn-in test , with Method 5005 of Mil-Std- 883 , including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std- 883 shall be , . Steady-state life test, Method 1005 of Mil-Std- 883 : 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std- 883 . TABLE 2. ELECTRICAL


Original
PDF MAX1232MJA/883B MAX1232MLP/883B 5962-9451401MPA 5962-9451401M2C Mil-Std-1835 Mil-Std-1835 CQCC1-N20 Mil-Std-883: Mil-Std-883. Mil-Std-883 5962-9451401MPA smd diode t8 power t8 smd transistor CDIP2-T8 MAX1232MJA 5962-9451401M2C CQCC1-N20 smd ja
2005 - Not Available

Abstract: No abstract text available
Text: : MIL-STD- 883 , Method 2002, Condition B MIL-STD- 883 , Method 2003 MIL-STD- 883 , Method 2007, Condition A , : Moisture Resistance: MIL-STD- 883 , Method 1011, Condition A MIL-STD- 883 , Method 1004 Packaging: Tape


Original
PDF CVCSO-914-1000 200ppm 50ppm 10dBm -20dBc -15dBc 12KHz 80MHz 20KHz 10KHz
2005 - Not Available

Abstract: No abstract text available
Text: : Resistance to Soldering Heat: MIL-STD- 883 , Method 2002, Condition B MIL-STD- 883 , Method 2003 MIL-STD- 883 , Environmental: Thermal Shock: Moisture Resistance: MIL-STD- 883 , Method 1011, Condition A MIL-STD- 883


Original
PDF CVCSO-914-1000 200ppm 50ppm 10dBm -20dBc -15dBc 12KHz 80MHz 20KHz 10KHz
21CFR1040

Abstract: M103 SDM7104-XC
Text: -000983 Issue 2, December 1993 Heading Test Mechanical Mechanical Integrity Shock Reference MIL-STD- 883 , 500G, 1.0 ms 1,500G, 0.5ms 11 11 0 0 -11 -0 MIL-STD- 883 Condition A 20% 11 , % 11 11 0 0 - - - 25 - 25 0 Thermal Shock MIL-STD- 883 Method 1011 Solderability MIL-STD- 883 Method 2003 Fiber Pull Endurance Accel. Aging (High Temp , Storage Temperature Cycling Special Tests MIL-STD- 883 Method 1018 Flammability TR357:Sec


Original
PDF TS-S98D009B 25Gbps SDM7104-XC 52Mb/s 08Mb/s 25Gb/s SDM7104-XC) 21CFR1040 M103 SDM7104-XC
21CFR1040

Abstract: M103 SCM7104-XC
Text: Mechanical Mechanical Integrity Shock Reference MIL-STD- 883 Method 2002 Condition Sampling LTPD , Thermal Shock MIL-STD- 883 Method 1011 Solderability MIL-STD- 883 Method 2003 Fiber Pull Endurance , times;5sec. 2 Kg; 3 times; 5sec. MIL-STD- 883 Method 2007 20% 20% 20% 20% 11 11 0 0 , - -6 - -6 OK 0 Storage Temperature Cycling Special Tests MIL-STD- 883


Original
PDF TS-S98D008D 25Gbps SCM7104-XC 52Mb/s 08Mb/s 25Gb/s SCM7104-XC) 21CFR1040 M103 SCM7104-XC
AT28C256

Abstract: No abstract text available
Text: 2 150 80 0.3 AT28C256(E,F)-15DM/ 883 AT28C256(E,F)-15FM/ 883 AT28C256(E,F)-15LM/ 883 AT28C256(E,F)-15UM/ 883 28D6 28F 32L 28 U Military/883C Class B, Fully Compliant (-55°C to 125 , 80 0.3 AT28C256(E,F)-20DM/ 883 AT28C256( E,F)-20FM/ 883 AT28C256(E,F)-20LM/ 883 AT28C256(E,F)-20UM/ 883 28D6 28 F 32L 28 U Military/883C Class B, Fully Compliant (-55°C to 125°C) 250 , °C) 250 80 0.3 AT28C256(E,F)-25DM/ 883 AT28C256( E, F) -25FM/ 883 AT28C256(E,F)-25LM/ 883


OCR Scan
PDF AT28C256 AT28C256
1995 - 8001301ZX

Abstract: ELH0032 ELH0032G MIL-I-45208A high power fet amplifier schematic eb2 SMD fast Operational Amplifier
Text: compensation required for gains above 50 Peak output current to 100 mA MIL-STD- 883 devices 100 , 883 8001301ZX ELH0032G 883 8001301ZX The ELH0032's wide bandwidth high input impedance and high , 1991 Rev F 0032 ­ 2 ELH0032G 883 8001301ZX Fast Operational Amplifier Absolute Maximum Ratings , 70 TD is 3 7in Parameter ELH0032G 883 8001301ZX Fast Operational Amplifier DC Electrical , Parameter ELH0032G 883 8001301ZX Fast Operational Amplifier Typical Performance Curves Maximum Power


Original
PDF ELH0032 1012X 50are 8001301ZX ELH0032G MIL-I-45208A high power fet amplifier schematic eb2 SMD fast Operational Amplifier
1999 - Hitachi DSA002719

Abstract: TRW7403
Text: Shock Reference MIL-STD- 883 Method 2002 MIL-STD- 883 Method 2007 Condition Condition B 14,710 m/s2, 0.5 , Pull (b) Accelerated Aging (High Temp.) Temperature Cycling (biased test is recommended) MIL-STD- 883 Method 1011 MIL-STD- 883 Method 2003 Bellcore 983 Bellcore 983 20 20 11 11 11 0 0 0 7 , 983 Damp Heat (If using epoxy) Internal Moisture Flammability ESD Threshold MIL-STD- 883 Method 103 MIL-STD- 883 Method 1018 TR-TSY-000357 Bellcore 983 1 kg, 3 times Life time assured temperature


Original
PDF TRW7403 PDF0002ceptable TRW7403M Hitachi DSA002719 TRW7403
1999 - Hitachi DSA002719

Abstract: tr-tsy-000357
Text: qualification test is scheduled. Table 9 Qualification Test Plan No. 1 Test Mechanical Shock Reference MIL-STD- 883 Method 2002 MIL-STD- 883 Method 2007 Condition Condition B 14,710 m/s2, 0.5 ms 5 times/axis Condition A , Temp.) Temperature Cycling (biased test is recommended) MIL-STD- 883 Method 1011 MIL-STD- 883 Method , ) Internal Moisture Flammability ESD Threshold MIL-STD- 883 Method 103 MIL-STD- 883 Method 1018 TR-TSY


Original
PDF TRW5403 PDF0001ceptable TRW5403M Hitachi DSA002719 tr-tsy-000357
5962-88525

Abstract: No abstract text available
Text: °C) 150 80 0.3 AT28C256(E,F)-15DM/ 883 AT28C256(E,F)-15FM/ 883 AT28C256{ E,F)-15LM/ 883 AT28C256(E,F)-15UM/ 883 AT28C256(E,F)-20DC AT28C256(E,F)-20JC AT28C256(E,F)-20PC AT28C256(E,F)-20UC AT28C256(E,F)-20DI , 0.3 AT28C256(E,F)-20DM/ 883 AT28C256(E,F)-20FM/ 883 AT28C256(E,F)-20LM/ 883 AT28C256(E,F)-20UM/ 883 , 0.3 AT28C256( E, F) -25DM/ 883 AT28C256( E,F) -25 FM/ 883 AT28C256(E,F)-25LM/ 883 AT28C256( E,F)-25UM/ 883 AT28C256(E,F)-30DM/ 883 AT28C256(E,F)-30FM/ 883 AT28C256(E,F)-30LM/ 883 AT28C256(E,F)-30UM/ 883


OCR Scan
PDF AT28C256 e-150 AT28C256 5962-88525
Not Available

Abstract: No abstract text available
Text: ) Operation Range 150 80 0.3 AT28C256(E,F)-15DM/ 883 AT28C256( E,F)-15FM/ 883 AT28C256(E,F)-15LM/ 883 AT28C256(E,F)-15UM/ 883 28D6 28F 32L 28 U Military/883C Class B, Fully Compliant , 85°C) 200 80 0.3 AT28C256(E,F)-20DM/ 883 AT28C256(E,F)-20FM/ 883 AT28C256(E,F)-20LM/ 883 AT28C256(E,F)-20UM/ 883 28D6 28F 32L 28U Military/883C Class B, Fully Compliant (-55°C to 125 , °C) 250 80 0.3 AT28C256(E,F)-25DM/ 883 AT28C256( E,F)-25FM/ 883 AT28C256(E,F) -25LM/ 883 AT28C256


OCR Scan
PDF AT28C256 256ed
gal 16v8 programming specification

Abstract: No abstract text available
Text: GAL 16V8/ 883 Lattica High Performance E2CMOS PLD Generic Array Logic™ Semiconductor , PIN CONFIGURATION The GAL16V8/ 883 is a high performance E2CMOS program ­ mable logic device , performance available in the 883 qualified PLD market. The GAL16V8C/ 883 , at 7.5ns maximum propagation delay , ­ ity by allowing the Output Logic Macrocell (OLMC) to be config­ ured by the user. The GAL16V8/ 883 is , ://www.latticesemi.com 16v8mil 02 1 July 1997 Lattice Specifications GAL16V8C/ 883 ; ; ; Semiconductor


OCR Scan
PDF 16V8/883 GAL16V8C-7 GAL16V8C-10) Tested/100% 100ms) V8B-15LD/883 5962-8983903RA 20-Pin 6V8B-15LR/883 962-89839032A gal 16v8 programming specification
al16v8d

Abstract: fuse 9 BJE
Text: Lattica I Semiconductor I Corporation GAL 16V8/ 883 High Performance E2CMOS PLD Generic Array , Upgrade ELECTRONIC SIGNATURE FOR IDENTIFICATION Description The GAL16V8/ 883 is a high performance E2CMOS program mable logic device processed in full compliance to MIL-STD- 883 . This military grade , to provide the highest speed/power performance available in the 883 qualified PLD market. The GAL16V8D/ 883 , at 7.5ns maxi mum propagation delay time, is the world's fastest military quali fied CMOS PLD


OCR Scan
PDF 16V8/883 GAL16V8D-7 GAL16V8D-10) Tested/100% 100ms) EmV8D-10LR/883 6V8D-15LD/883 6V8D-15LR/883 6V8D-20LD/883 6V8D-20LR/883 al16v8d fuse 9 BJE
1995 - transistor CB 945

Abstract: 10eb2 D3B operational amplifier MIL-I-45208A ELH0101K ELH0101AK ELH0101 8508902YX 8508901YX DCM4 SMD
Text: bandwidth MIL-STD- 883 devices 100% manufactured in U S A The ELH0101 is a wideband power operational , ELH0101 883 8508901 2YX ELH0101 883 8508901 2YX Equivalent Schematic Part No TAB WIDE , documentation Patent pending 1985 Elantec Inc December 1994 Rev H 0101 ­ 1 Top View ELH0101 883 , ELH0101 300 I nA TD is 2 3in Test Level I II ELH0101 883 8508901 2YX Power , 75 25 10 V % 10 75 TD is 2 2in IS TD is 3 5in CMRR ELH0101 883


Original
PDF MIL-STD-883 ELH0101 883are transistor CB 945 10eb2 D3B operational amplifier MIL-I-45208A ELH0101K ELH0101AK 8508902YX 8508901YX DCM4 SMD
pby 345

Abstract: SFP13 3050B IEC-825 SFP Transceiver Electrical Pad Layout
Text: Conditions Sample Size Reference Mechanical Shock 5 times/axis 500G , 1 .Oms 11 MIL-STD- 883 Method 2002 Vibration 20G , 20Hz - 2000HZ 4min/cycle ,4cycles/axis 11 MIL-STD- 883 Method 2007 Mechanical & Physical Thermal Shock Delta T=100 °C 11 MIL-STD- 883 Method 2003 Solderability - 11 MIL-STD- 883 Method 2007 , -202 Method 103 Internal Moisture <5000ppm water vapor 11 MIL-STD- 883 Method 1018 Special Test Flammability -


OCR Scan
PDF SFP1342-05AT 1310nm 25Gbps 20-pin IEC-825 MIL-STD-883 5000hrs pby 345 SFP13 3050B SFP Transceiver Electrical Pad Layout
atv750-30dc

Abstract: ATV750-35DC ATV750L-30KM AT22V10 ATV750 atv750-30dm ATV750-30YC ATV750-35DM ATV750-35YI
Text: (-55°C to 125SC) ATV750-20DM/ 883 ATV750-20FM/ 883 ATV750-20GM/ 883 ATV750-20KW883 ATV750-20LM/ 883 ATV750.20NM/ 883 ATV750-20YM/ 883 24DW3 24C 24D3 28KW 28LW 28L 24CW Military/883C (-55°C to 125°C) Class B, Fully , -25YM 24DW3 24C 24D3 28KW 28LW 28L 24CW Military (-55°C to 125°C) ATV750-25DM/ 883 ATV750-25FM/ 883 ATV750-25GM/ 883 ATV750-2SKW883 ATV750-25LM/ 883 ATV750-25NM/ 883 ATV750-25YM/ 883 24DW3 24C 24D3 28KW 28LW 28L 24CW , -30YM 24DW3 24C 24D3 28 KW 28LW 28L 24CW Military (-55°C to 125°C) ATV750-30DM/ 883 ATV750-30FM/ 883 ATV750


OCR Scan
PDF AT22V10 SurATV750L-30KM/883 ATV750L-30LM/883 ATV750L-30NM/883 ATV750L-30YM/883 24DW3 Miiitaiy/883C atv750-30dc ATV750-35DC ATV750L-30KM ATV750 atv750-30dm ATV750-30YC ATV750-35DM ATV750-35YI
1040-11

Abstract: GR-253-CORE
Text: Integrity Shock Reference MIL-STD- 883 Method 2002 Condition Sampling LTPD SS C SEI Result , MIL-STD- 883 Method 1011 Solderability MIL-STD- 883 Method 2003 Fiber Pull Endurance Accel. Aging , Kg; 3 times; 5sec. MIL-STD- 883 Method 2007 20% 20% 20% 20% 11 11 0 0 - , - -6 - -6 OK 0 Storage Temperature Cycling Special Tests MIL-STD- 883


Original
PDF TS-S97D019B SDT8262-T 52Mb/s 08Mb/s SDT8262-TC-QN SDT8262-TC-QW 1040-11 GR-253-CORE
ti 28j

Abstract: AT22V10-20JI AT22V10-35YI AT22V10-20DC AT22V10-35PC AT22V10-30GM AT22V10L-25PI 5962-8753901LX atmel 22v10 AT22V10-20
Text: -2QDM/ 883 AT22V10-20FM/ 883 AT22V10-20GM/ 883 AT22.V10-20KM/ 883 AT22V10-20LM/ 883 AT22V10-20NM/ 883 AT22V10-20YM/ 883 24DW3 24C 2403 28KW 28LW 28L 24CW Military/883C (-55°C to 125°C) Class B, Fully Compliant 25 15 , Military (-55°C to 125°C) AT22V10-25DM/ 883 AT22V10-25FM/ 883 AT22V10-25GM/ 883 AT22V10-25KM/ 883 AT22V10-25LM/ 883 AT22V10-25NM/ 883 AT22V10-25YM/ 883 24DW3 24C 24D3 28KW 28LW 28L 24CW Military/883C (-55°C to 125 , Operation Range 30 20 20 AT22V10-30DM/ 883 AT22V10-30FM/ 883 AT22V1Ó-30GM/ 883 AT22V10-30KM/ 883 AT22V10


OCR Scan
PDF 1Q7417? AT22V10/L 200mA AT22V10 AT22V10L Military/883C 24DW3 ti 28j AT22V10-20JI AT22V10-35YI AT22V10-20DC AT22V10-35PC AT22V10-30GM AT22V10L-25PI 5962-8753901LX atmel 22v10 AT22V10-20
block diagram 8251

Abstract: 34 zbf Zbf 34 M103 PRBS223 SDM7102-XC
Text: Reference MIL-STD- 883 Method 2002 Condition Sampling LTPD SS C SEI Plan SS F/C Condition B 5 times/axis 500G, 1.0 ms 1,500G, 0.5ms Vibration Thermal Shock MIL-STD- 883 Method 1011 Solderability MIL-STD- 883 Method 2003 Fiber Pull Endurance Accel. Aging (High Temp.) 11 11 0 0 , aging not required) 20% 11 0 11 0 1 Kg; 3 times;5sec. 2 Kg; 3 times; 5sec. MIL-STD- 883 , Storage Temperature Cycling Special Tests MIL-STD- 883 Method 1018 Flammability TR357:Sec


Original
PDF TS-S97D023B SDM7102-XC 52Mb/s 08Mb/s SDM7102-XC) block diagram 8251 34 zbf Zbf 34 M103 PRBS223 SDM7102-XC
Not Available

Abstract: No abstract text available
Text: -15PI AT22V10-15SI AT22V10-15DM AT22V10-15GM AT22V10-15KM AT22V10-15LM AT22V10-15NM AT22V10-15DM/ 883 AT22V10-15GM/ 883 AT22V10-15KM/ 883 AT22V10-15LM/ 883 AT22V10-15NM/ 883 20 12 15 AT22V10-20DC AT22V10-20GC AT22V10 , (ns) 15 Ordering Code AT22V10-20DM/ 883 AT22V10-20GM/ 883 AT22V10-20KM/ 883 AT22V10-20LM/ 883 AT22V10-20NM/ 883 AT22V10-25DC AT22V10-25GC AT22V10-25JC AT22V10-25KC AT22V10-25LC AT22V10-25NC AT22V10-25PC AT22V10 , -25DM AT22V10-25GM AT22V10-25KM AT22V10-25LM AT22V10-25NM AT22V10-25DM/ 883 AT22V10-25GM/ 883 AT22V10-25KM/ 883


OCR Scan
PDF AT22V10/L 24DW3
M103

Abstract: SDM7392-XC TA-NWT-000253
Text: Mechanical Mechanical Integrity Shock Reference MIL-STD- 883 Method 2002 Condition Sampling LTPD , Thermal Shock MIL-STD- 883 Method 1011 Solderability MIL-STD- 883 Method 2003 Fiber Pull Endurance , Kg; 3 times;5sec. 2 Kg; 3 times; 5sec. MIL-STD- 883 Method 2007 20% 20% 20% 20% 11 11 , Tests MIL-STD- 883 Method 1018 Flammability TR357:Sec. 4.4.2.5 -ESD Threshold Section


Original
PDF TS-S97D017B SDM7392-XC 52Mb/s 08Mb/s SDM7392-XC) M103 SDM7392-XC TA-NWT-000253
Supplyframe Tracking Pixel