The Datasheet Archive

SmartDie Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
1998 - intel 4040

Abstract: VCC3 2456 23 INTEL 1980 TMS 3529 V 454 SmartDie pentium VCC3 2456 59 78/VCC3 2456 59 A23 851 diode TRANSISTOR 4558
Text: Mobile Pentium® Processor with MMXTM Technology (0.25 Micron Process) SmartDie ® Product , and names are the property of their respective owners. Preliminary SmartDie ® Product Specification , . 20 Tables 2 Preliminary SmartDie ® Product Specification 3 Mobile Pentium® Processor , SmartDie ® Product Specification 5 Mobile Pentium® Processor with MMXTM Technology (0.25 Micron , 248 323 1 247 Y 106 173 107 172 X 6 Preliminary SmartDie ® Product


Original
PDF 32-Bit 64-Bit 16-Kbyte X80503CS66166 X80503CS66200 X80503CS66233 intel 4040 VCC3 2456 23 INTEL 1980 TMS 3529 V 454 SmartDie pentium VCC3 2456 59 78/VCC3 2456 59 A23 851 diode TRANSISTOR 4558
1998 - VCC3 2456 23

Abstract: VCC3 2456 59 VCC3 2456 56 VCC3 2456 73 273154 SmartDie pentium
Text: Mobile Pentium® Processor with MMXTM Technology (0.25 Micron Process) SmartDie ® Product , and names are the property of their respective owners. Preliminary SmartDie ® Product Specification , . 20 Tables 2 Preliminary SmartDie ® Product Specification 3 Mobile Pentium® Processor , SmartDie ® Product Specification 5 Mobile Pentium® Processor with MMXTM Technology (0.25 Micron , 248 323 1 247 Y 106 173 107 172 X 6 Preliminary SmartDie ® Product


Original
PDF 32-Bit 64-Bit 16-Kbyte X80503CS66166 X80503CS66200 X80503CS66233 VCC3 2456 23 VCC3 2456 59 VCC3 2456 56 VCC3 2456 73 273154 SmartDie pentium
1998 - p54CSLM

Abstract: SmartDie pentium smartdie X80502
Text: ® Processor P54CSLM 133/150MHz SmartDie ® Product Discontinuance Date of PCN Publication: October 27 , discontinuing these products because demand for the P54CSLM SmartDie ® product has shifted to the Mobile Pentium , Mobile Pentium® processor with MMXTM technology SmartDie ® product at 200 MHz (1.8/2.5V) Mobile Pentium® processor with MMXTM technology SmartDie ® product at 233 MHz (1.8/2.5V) Material Master # 815935 , MMXTM technology Product Specification SmartDie web page: http://www.intel.com/design/ smartdie


Original
PDF X80503CS66200 X80503CS66233 p54CSLM SmartDie pentium smartdie X80502
1996 - ARCHITECTURE OF 80186 PROCESSOR

Abstract: 188EB 80186 80186 architecture 80186 addressing intel 80186 instruction set intel 80c186 8086 instruction set 8259A 80C186EA
Text: SmartDieTM Products * For further information, please call 1 (800) 548-4725 and ask to receive the SmartDie Product Literature Kit No. G1B03. Intel SmartDie Products are functionally equivalent die-level silicon versions of standard Intel products. All SmartDie products are tested to meet commercial specifications to ensure the same quality and reliability levels of packaged products. SmartDie Products offer the user a


Original
PDF 80186/80C186 16-Bit 80C186XL 80C186EA 80C186EB 80C186EC 80L18No. G1B03. 80C186/80C186 ARCHITECTURE OF 80186 PROCESSOR 188EB 80186 80186 architecture 80186 addressing intel 80186 instruction set intel 80c186 8086 instruction set 8259A 80C186EA
intel 8086

Abstract: control unit of intel 8086 SmartDie pentium
Text: intei SmartDieTM Product Specification IPfôgyiMDGMW Pentium® PROCESSORS AT iCOMP® INDEX 735\90, 610\75 MHz WITH VOLTAGE REDUCTION TECHNOLOGY Compatible with Large Software Base - MS-DOS , Core / 60 MHz Bus Intel SmartDie Product - Full AC/DC Testing at Die Level - 0°C to 105°C (Junction , features, 2.9V core operation along with 3.3V I/O buffer operation, and the availability of a SmartDie product version, which are not available in the Pentium processor (510\60, 567\66), make the SmartDie


OCR Scan
PDF 32-Bit 64-Bit intel 8086 control unit of intel 8086 SmartDie pentium
1995 - 8b123

Abstract: b1344 b774 equivalent transistor B1202 B555 architecture of 80486 microprocessor b774 transistor 80486 microprocessor description 240486 INTEL 80486 DX2
Text: Intel486 TM DX2 MICROPROCESSOR SmartDie TM Product Specification SL-Technology for Energy , SmartDie Product Full AC DC Testing at Die Level 0 C­80 C (Junction) Temperature Range 40 MHz and 50 , SmartDie product specification before finalizing a design REFERENCE INFORMATION The information in this , PROCEDURE Intel has instituted full-speed functional testing at the die level for all SmartDie TM products , Intel SmartDie Intel Part Number Spec Customer Part Number (if applicable) Fab Lot Number Quantity


Original
PDF Intel486 32-Bit Intel486 8b123 b1344 b774 equivalent transistor B1202 B555 architecture of 80486 microprocessor b774 transistor 80486 microprocessor description 240486 INTEL 80486 DX2
mobile MOTHERBOARD CIRCUIT diagram

Abstract: 1. Mobile Computing block diagram NORTHBRIDGE* reflow PC MOTHERBOARD CIRCUIT diagram mobile MOTHERBOARD parts diagram 1. Mobile Computing architecture 430TX smartdie block diagram of pentium PROCESSOR Intel Pentium 4 Processor PIN LAYOUT
Text: applications. The MCMs take full advantage of today's MCM technology and Intel's SmartDie ® products to , 430TX die in SmartDie form. Hence a MCM burn-in test is not required. The mini-temperature cycle test , technologies. www.fujitsumicro.com Pentium processor is a registered trademark of Intel Corporation. SmartDie


Original
PDF 430TX 280-pin APT-PMCMTB-20377-2 mobile MOTHERBOARD CIRCUIT diagram 1. Mobile Computing block diagram NORTHBRIDGE* reflow PC MOTHERBOARD CIRCUIT diagram mobile MOTHERBOARD parts diagram 1. Mobile Computing architecture smartdie block diagram of pentium PROCESSOR Intel Pentium 4 Processor PIN LAYOUT
1995 - B331 transistor

Abstract: B331 transistor datasheet B1434 a 4514 v B1186 transistor b331 transistor b616 B2716 b1328 B1861
Text: Intel486 TM SX MICROPROCESSOR SmartDie TM Product Specification Y SL Technology for Energy , Management IEEE 1149 1 Boundary Scan Compatibility Y Intel SmartDie Product Full AC DC Testing at , notice Verify with your local Intel Sales Office that you have the latest SmartDie product specification , functional testing at the die level for all SmartDie TM products This level of testing is ordinarily , then sealed and labeled with the following information Intel SmartDie Device


Original
PDF Intel486 32-Bit 16-Bit B331 transistor B331 transistor datasheet B1434 a 4514 v B1186 transistor b331 transistor b616 B2716 b1328 B1861
INTEL 80486 DX2 architecture

Abstract: INTEL 80486 DX2 SmartDie 242202 te 555-3 INTEL 2186 Intel 486 DX2
Text: intei SmartDie TM Product Specification SL-Technology for Energy Efficiency - Intel's System , for Second-Level Cache Intel SmartDie Product - Full AC/DC Testing at Die Level - 0< 'C -80°C , that you have the latest SmartDie product specification before finalizing a design. REFERENCE , instituted full-speed functional testing at the die level for all SmartDieTM products. This level of testing , the following information: · Intel SmartDie · Intel Part Number · Spec · Customer Part Number (if


OCR Scan
PDF /lntel386TM Intel486TM Intel486 INTEL 80486 DX2 architecture INTEL 80486 DX2 SmartDie 242202 te 555-3 INTEL 2186 Intel 486 DX2
intel 28F001BXT

Abstract: SmartDie 29040 28F001BX-T AP-341 Designing an Updatable BIOS
Text: intei. 28F001BX-T/B 1M (128K x 8) CMOS FLASH MEMORY SmartDie Product Specification m High Integration Blocked Architecture - One 8 KByte Boot Block with Lock Out - Two 4 KByte Parameter Blocks - One 112 KByte Main Block - T = Top Boot, B = Bottom Boot 100,000 Erase/Program Cycles Per Block , - High-Volume Manufacturing Experience Intel SmartDie Product - Full AC/DC Testing at Die Level - , instituted fuil-speed functional testing at the die level for all SmartDie products. This level of testing is


OCR Scan
PDF 28F001BX-T/B 28F001B 28F001BX-T/28F001BX-B ER-20, RR-60, AP-316, AP-341, intel 28F001BXT SmartDie 29040 28F001BX-T AP-341 Designing an Updatable BIOS
1995 - b982

Abstract: b1676 b896 SP 1191 B1328 B3045 FLASH TRANSLATION LAYER FTL 5498 transistor X28F008SA-120 b3305
Text: 28F008SA 8-MBIT (1-MBIT x 8) FLASH MEMORY SmartDie Product Specification Y Y Y Y High-Density Symmetrically Blocked Architecture Sixteen 64-Kbyte Blocks Y System Performance Enhancements RY BY Status Output Erase Suspend Capability Y Deep Powerdown Mode 0 2 mA ICC Typical , per Chip SRAM-Compatible Write Interface Y Intel SmartDie Product Full AC DC Testing at Die , level for all SmartDie products This level of testing is ordinarily performed only after assembly into


Original
PDF 28F008SA 64-Kbyte X28F008SA-120 AP-359 AP-360 25F008SA AP-364 b982 b1676 b896 SP 1191 B1328 B3045 FLASH TRANSLATION LAYER FTL 5498 transistor X28F008SA-120 b3305
ER-27

Abstract: 5498 transistor Intel Corporation esd testing flash memory SmartDie F008S
Text: in te i 28F008SA 8-MBIT (1-MBIT x 8) FLASH MEMORY SmartDie Product Specification High-Density Symmetrically Blocked Architecture - Sixteen 64-Kbyte Blocks Extended Cycling Capability - 100K Block Erase Cycles - 1.6M Block Erase Cycles per Chip Automated Byte Write and Block Erase - Command User Interface , - Microsoft* Flash File System (FFS) Intel SmartDie Product - Full AC/DC Testing at Die Level - 0 , for all SmartDie products. This level of testing is ordinarily performed only after assembly into a


OCR Scan
PDF 28F008SA 64-Kbyte F008S 120ns AP-359, AP-360, 25F008SA AP-364, ER-27 5498 transistor Intel Corporation esd testing flash memory SmartDie
1996 - b998

Abstract: B83 004 1024K b1545 28F010 b83 006 b1257 b175 transistor B1545 AP-325
Text: 28F010 1024K (128K x 8) FLASH MEMORY SmartDie Product Specification Y Flash Electrical Chip Erase 1 Second Typical Chip Erase Y Quick-Pulse Programming Algorithm 10 ms Typical Byte Program 2 Second Chip Program Y 12 0V g 5% VPP High-Performance Read 90 ns Access Time Noise , Experience Y Intel SmartDie Product Full AC DC Testing at Die Level 0 C to a 80 C (Junction , instituted full-speed functional testing at the die level for all SmartDie products This level of testing


Original
PDF 28F010 1024K X28F400BX-T80 ER-20 ER-24 RR-60 b998 B83 004 1024K b1545 b83 006 b1257 b175 transistor B1545 AP-325
2046K

Abstract: 28F020 SmartDie 29024
Text: in t e * 28F020 2048K (256K x 8) FLASH MEMORY SmartDie Product Specification Command Register Architecture for Microprocessor/Microcontroller Compatible Write Interface Noise Immunity Features - +10% Vcc Tolerance - Maximum Latch-Up Immunity through EPI Processing E T O X t m in Nonvolatile Flash Technology - EPROM-Compatible Process Base - Hlgh-Volume Manufacturing Experience Intel SmartDie Product - Full AC/DC Testing , instituted full-speed functional testing at the die level for all SmartDie products. This level of testing is


OCR Scan
PDF 28F020 2048K X28F020-90 ER-20, ER-24, RR-60, AP-316, AP-325, 2046K SmartDie 29024
1995 - B1560

Abstract: B1560 equivalent 28f020 transistor B1560 294005 B1205 b1770 b439 AP-316 AP-325
Text: 28F020 2048K (256K x 8) FLASH MEMORY SmartDie Product Specification Y Flash Electrical Chip Erase 2 Second Typical Chip Erase Y Quick-Pulse Programming Algorithm 1 ms Typical Byte Program 0 4 Second Chip Program Y 12 0V g 5% VPP High-Performance Read 90 ns Access Time Command , Experience Y Intel SmartDie Product Full AC DC Testing at Die Level 0 Ct a 80 C (Junction) o , instituted full-speed functional testing at the die level for all SmartDie products This level of testing


Original
PDF 28F020 2048K 8F020 X28F020-90 ER-20 ER-24 RR-60 AP-316 B1560 B1560 equivalent transistor B1560 294005 B1205 b1770 b439 AP-325
Not Available

Abstract: No abstract text available
Text: ß R lIÜ M M tf In te l 28F020 2048K (256K x 8) FLASH MEMORY SmartDie Product Specification Flash Electrical Chip Erase — 2 Second Typical Chip Erase Quick-Pulse Programming Algorithm — 10 ¡xs Typical Byte Program — 4 Second Chip Program 100K Erase/Program Cycles Typical 12.0V ±5% Vpp , Experience Intel SmartDie Product — Full AC/DC Testing at Die Level — 0°C to +80°C (Junction , Intel has instituted full-speed functional testing at the die level for all SmartDie products. This


OCR Scan
PDF 28F020 2048K X28F020-90 ER-20, ER-24, RR-60, AP-316, AP-325,
Not Available

Abstract: No abstract text available
Text: in te l 28F010 1024K (128K x 8) FLASH MEMORY SmartDie Product Specification Flash Electrical Chip Erase — 1 Second Typical Chip Erase Quick-Pulse Programming Algorithm — 10 |as Typical Byte Program — 2 Second Chip Program 100K Erase/Program Cycles Typical 12.0V +5% Vpp High-Performance , – Intel SmartDie Product — Full AC/DC Testing at Die Level — 0°C to + 80°C (Junction) Temperature , testing at the die level for all SmartDie products. This level of testing is ordinarily performed only


OCR Scan
PDF 28F010 1024K 28F400B EFt-20, ER-24, RR-60, AP-316, AP-325,
1995 - transistor b941

Abstract: transistor b561 transistor b1416 B941 b1416 B2269 data transistor type bf 224 242557 transistor bf 244 B1321
Text: Pentium PROCESSORS AT iCOMP INDEX 735T90 610T75 MHz WITH VOLTAGE REDUCTION TECHNOLOGY SmartDie TM , Bus 90 MHz Core 60 MHz Bus Y Intel SmartDie Product Full AC DC Testing at Die Level 0 C to , SmartDie product version which are not available in the Pentium processor (510T60 567T66) make the SmartDie product Pentium processor with voltage reduction technology ideal for enabling mobile Pentium , Pentium PROCESSORS AT iCOMP INDEX 735 90 610 75 MHz WITH VOLTAGE REDUCTION TECHNOLOGY SmartDie TM


Original
PDF 735T90 610T75 32-Bit 64-Bit X805025075 X805026090 AP-479 AP-480 transistor b941 transistor b561 transistor b1416 B941 b1416 B2269 data transistor type bf 224 242557 transistor bf 244 B1321
Intel 4001

Abstract: 4001 intel rom
Text: in tj 28F400BX-T 4-MBIT (256K x 16,512K x 8) BOOT BLOCK FLASH MEMORY SmartDie Product Specification m x8/x16 Input/Output Architecture ■■■■■■— 28F400BX-T — For High-Performance and HighIntegration 16-Bit and 32-Bit CPUs Optimized High-Density Blocked , SmartDie Product — Full AC/DC Testing at Die Level — 0°C to + 80°C (Junction) Temperature Range â , full-speed functional testing at the die level for all SmartDie products. This level of testing is


OCR Scan
PDF 28F400BX-T x8/x16 16-Bit 32-Bit X28F010-90 28F200BX-T/B, 28F200BX-T/B 28F400BX-T/B, 28F004BX-T/B Intel 4001 4001 intel rom
Not Available

Abstract: No abstract text available
Text: in te i • 28F001BX-T/B 1M (128K x 8) CMOS FLASH MEMORY SmartDie Product Specification ■High Integration Blocked Architecture — One 8 KByte Boot Block with Lock Out — Two 4 KByte Parameter Blocks — One 112 KByte Main Block — T = Top Boot, B = Bottom Boot ■100,000 Erase/Program Cycles , €” High-Volume Manufacturing Experience ■Intel SmartDie Product — Full AC/DC Testing at Die Level — 0 , full-speed functional testing at the die level for all SmartDie products. This level of testing is


OCR Scan
PDF 28F001BX-T/B X28F001BX-T70 X28F001BX-B70 X28F001BX-T90 X28F001BX-B90 X28F001BX-T120 X28F001BX-B120 28F001BX-T/28F001BX-B ER-20, RR-60,
SmartDie

Abstract: 28F010
Text: intel PEHHLOIMOIiMIERf 28F010 1024K (128K x 8) FLASH MEMORY SmartDie Product Specification Noise Immunity Features - ± 10% Vcc Tolerance - Maximum Latch-Up Immunity through EPI Processing ETOXTM III Nonvolatile Flash Technology - EPROM-Compatible Process Base - High-Volume Manufacturing Experience Intel SmartDie Product - Full AC/DC Testing at Die Level - 0°C to + 80°C (Junction) Temperature , functional testing at the die level for all SmartDie products. This level of testing is ordinarily performed


OCR Scan
PDF 28F010 1024K ER-20, ER-24, RR-60, AP-316, AP-325, SmartDie
1995 - b1357

Abstract: tms 3874 B1238 b1099 transistor b1240 B1359 b1417 transistor b1099 diode B1238 B528
Text: WRITE-BACK ENHANCED IntelDX4 TM PROCESSOR SmartDie TM Product Specification Y Y Y High , Multiprocessor Support Multiprocessor Instructions Support for Second Level Cache Y Intel SmartDie TM , local Intel sales office that you have the latest SmartDie TM product specification before finalizing a , has instituted full-speed functional testing at the die level for all SmartDie products This level of , sales office that you have the latest SmartDie Product Specification before finalizing a design


Original
PDF 32-Bit X80486DX475 X80486DX4100 Intel486 b1357 tms 3874 B1238 b1099 transistor b1240 B1359 b1417 transistor b1099 diode B1238 B528
MCS15

Abstract: 80C251SB MCS251 272452 80C251SQ 83C251SA 83C251SB 83C251SP intel MCS-151 87C251SA
Text: = 48LD PDIP S = 44LD QFP (Quad Flat Pack) Sb = 100LD SQFP (Shrink Quad Flat Pack) X = SmartDieTM , Inline Package at express temp * Intel SmartDieTM : Products are functionally equivalent die-level silicon versions of standard Intel products. All SmartDie Products are tested to meet commercial specifications to ensure the same quality and reliability levels of packaged products. SmartDie Products offer


Original
PDF 87C251SA MCS251 87C251SB 87C251SP 87C251SQ 83C51xx 80C5x 87C51xx MCS15 80C251SB 272452 80C251SQ 83C251SA 83C251SB 83C251SP intel MCS-151 87C251SA
transistor t 2190

Abstract: intel 2114 SmartDie 28F010
Text: inte] 28F010 1024K (128K x 8) FLASH MEMORY SmartDie Product Specification Flash Electrical Chip Erase - 1 Second Typical Chip Erase Quick-Pulse Programming Algorithm - 10ns Typical Byte Program - 2 Second Chip Program 100K Erase/Program Cycles Typical 12.0V ± 5% VP P High-Performance Read - 90 ns Access Time CMOS Low Power Consumption - 10 mA Typical Active Current - 50 |iA Typical Standby Current , EPROM-Compatible Process Base - High-Volume Manufacturing Experience Intel SmartDie Product - Full AC/DC Testing


OCR Scan
PDF 28F010 1024K X2BF010-90 ER-20 ER-24, RR-60, AP-316, AP-325, USA/DP-019/694 transistor t 2190 intel 2114 SmartDie
ARCHITECTURE OF 80286

Abstract: Memory Management Unit for 8086 8086 microprocessor architecture intel microprocessor 80286 architecture INTEL386 microprocessor 80186 internal architecture 8086 Internal Architecture architecture 80286
Text: office that you have the latest SmartDie Product Specification before finalizing a design. REFERENCE


OCR Scan
PDF Intel386TM 32-Bit Intel386 16-Bit 2712M-O01 ARCHITECTURE OF 80286 Memory Management Unit for 8086 8086 microprocessor architecture intel microprocessor 80286 architecture microprocessor 80186 internal architecture 8086 Internal Architecture architecture 80286
Supplyframe Tracking Pixel