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    Part ECAD Model Manufacturer Description Download Buy
    SNJ54BCT8374AFK Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 Visit Texas Instruments Buy
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    Texas Instruments SNJ54BCT8374AFK

    SCAN TEST DEVICES WITH OCTAL D-T
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    SNJ54BCT8374AFK Datasheets (2)

    Part ECAD Model Manufacturer Description Curated Type PDF
    SNJ54BCT8374AFK Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 Original PDF
    SNJ54BCT8374AFK Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Original PDF