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    SN74BCT8373ADWE4 Search Results

    SN74BCT8373ADWE4 Datasheets (2)

    Part ECAD Model Manufacturer Description Curated Type PDF
    SN74BCT8373ADWE4 Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF
    SN74BCT8373ADWE4 Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF