SN74BCT8373ADWE4 Search Results
SN74BCT8373ADWE4 Datasheets (2)
Part | ECAD Model | Manufacturer | Description | Curated | Type | |
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SN74BCT8373ADWE4 |
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SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Original | |||
SN74BCT8373ADWE4 |
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SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 | Original |