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MtL-STD-883 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
MIL-STD-883 Method 2010

Abstract: No abstract text available
Text: / operation Standard product I lilia iilllil lllliipsliili Hi-rel A Hi-rel B MIL-STD- 883 Class B MtL-STD-883 Class Wafer-lot accept Method 5007 Wafer-fab Probe test 100% 100% 100 , Semiconductors (GPS) have the following factory approvals: AQAP1 BS9450 (Capability Approval) MIL-STD- 883 Class B (In conformance with the requirements of MIL-STD- 883 , paragraph 1.2.1) DESC (Department of , Group B Group C Group D Table 1 1. MIL-STD- 883 Class S/ESA SCC9000: GPS has supplied numerous


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PDF 160Hrs MIL-STD-883 Method 2010
UNITED TECHNOLOGIES MICROELECTRONICS CENTER

Abstract: ut28f256 Mtl-Std-883 United Technologies Microelectronics
Text: Radiation-hardened process and design; total dose irradiation testing to MtL-STD-883 , Method 1019 - Tbtaldose: 1.0E6


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PDF UT28F256 155mA MtL-STD-883, UNITED TECHNOLOGIES MICROELECTRONICS CENTER Mtl-Std-883 United Technologies Microelectronics
Not Available

Abstract: No abstract text available
Text: L7C108DM 25 L7C108DM 20 -M>°Cto+12S°C- MtL-STD-883 C ompliant 25 ns 20 ns L7C108DMB25 L7C108DMB20 , - MtL-STD-883 Cow tw rr 25 ns 20 ns L7C109KMB25 L7C109KMB20 'The Low Power version is specified , Battery Backup Operation DECC SMD No. 5962-89598 Available 100% Screened to MIL-STD- 883 , Class B Plug , 25 ns 20 ns L7C109DM 25 L7C109DM 20 -5 5 "C to + 1 2 5 "C - MtL-STD-883C0MPUAHT 25 ns 20 ns


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PDF MIL-STD-883, IDT71024/71B024, MT5C1008, MCM6226A 62L26A, CXK581020 32-pin L7C108
SNJ54LS629W

Abstract: 54LS629
Text: method BÙ05 of MtL-STD-883 including groups A, B, C, and D inspections. The following additional , requirements for class B microcircuits in accordance with 1.2.l of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN devices". 1.2 Part number. The complete part number , Microcircults, General Specification for. STANDARD MILITARY MIL-STD- 883 - Test Methods and Procedures for , requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD- 883 , "Provisions


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PDF 8102101EX SMJ54LS629J SNJ54LS629W 81021012X SNJ54LS629FK 54LS629
Q3036

Abstract: Q3036M16L Q3036M-16L
Text: sealed ceramic leaded chip carrier (CLDCC). The device is screened in accordance with MTL-STD-883 , class


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PDF Q3036M-16L Q3036 swallo0555 Q3036M16L
5962-8684901PX

Abstract: ca6E 2N2222 S500
Text: drawing describes device requirements for class B microcircuits in accordance with 1.2.1 oT~ MTL-STD-883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAil devices". 1.2 Part number. The , Microcircuits, General Specification for STANOARD MILITARY MlL-STt)- 883 - Test Methods and Procedures for , requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN devices" and as specified herein


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PDF MTL-STD-883, MIL-STD-883 MIL-M-38510 5962-8684901PX SG1549Y/883B ca6E 2N2222 S500
sxxxx

Abstract: No abstract text available
Text: Accordance to Mtl-Std-883 and Is Fully Conformant Under the Provisions of Paragraph 1.2.1. · Fast Access , 16K x 1 Asynchronous CMOS Static RAM Pinouts HM1-65262/ 883 (CERAMIC DIP) TOP VIEW A0 E A1 [ Ï A2 , Description The HM-65262/ 883 is a CMOS 16384 x 1 bit Static Random Access Memory manufactured using the , ease of use. The HM-65262/ 883 is available in both JEDEC standard 20 pin, 0.300 inch wide DIP and 20 , also elminate the need for pull-up or pull-down resistors. The HM-65262/ 883 , a full CMOS RAM, utilizes


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PDF HM1-65262/883 Mtl-Std-883 7CV85nsMax HM-65262/883 MIL-M38510 MIL-STD-1835, GDIP1-T20 L-M38510 sxxxx
Mtl-Std-883

Abstract: GENERAL MICROCIRCUITS CORP
Text: Requirements Standard model plus 100% MTL-STD-883 Class B screening, with 5% PDA, plus Quality Conformance , : 90nVrms(10Hz to 10kHz) MIL-STD- 883 COMPLIANT APPLICATIONS · · · · · · · · · MULTIPLICATION DIVISION , to the requirements of MDL-STD- 883 , for a Class B device. The MPY100/883B's operation is specified , formed as required by MIL-STD- 883 . 1.2.3 Case Outline. Two case outlines are available. a. The "H" , specification for. STANDARD MILITARY MIL-STD- 883 - Test methods and procedures for microcircuits. 2.2 Order of


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PDF 17313bS n01S2bA MPY100SH/883B MPY100/883B MPY100SG/883B 90nVrms 10kHz) MIL-STD-883 10Hzto5M Mtl-Std-883 GENERAL MICROCIRCUITS CORP
54FCT827ADB

Abstract: srl 5005 5962-E1175 5962-8950601LX
Text: recrements for class 0 »ierocircuits in accordance Kith 1.8.1 pf MtL-STD-883 , "Provisions ftjr thf we of , MILITARY MIL-M-38510 STANDARD MILITARY MIL-STD- 883 - Test Methods and Procedures for Microelectronics , requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN devices" arid as specified herein , Its Respective Manufacturer 3.4 Harking. Marking shall be in accordance with MIL-STD- 883 (see 3.1


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PDF 5962-E1175 It2-8950601KX 54FCT827AEB 5962-8950601LX 54FCT827ADB 5962-89506013X 54FCT827ALB 5962-8950602KX 54FCT827BEB 5962-8950602LX 54FCT827ADB srl 5005 5962-E1175
uncompensated operational amplifier

Abstract: HA2-5112 ltzt
Text: ® HARRIS HA-5112/ 883 Dual, Low Noise, High Performance January 1989 Uncompensated Operational Amplifier Features • This Circuit is Processed In Accordance to Mtl-Std-883 and is Fully Conformant , Description Low noise and high performance are key words describing the dual, uncompensated HA-5112/ 883 . This , and 100dB channel separation (typ). The HA-5112/ 883 also consumes a very modest amount of supply power , for immediate interchangeability with most other dual operational amplifiers. HA-5112/ 883 is available


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PDF HA-5112/883 Mtl-Std-883 60MHz 100kV/V 250kV/V 100dB 200mV 10kHz uncompensated operational amplifier HA2-5112 ltzt
CY74FCT162373T

Abstract: CY74FCT16373T
Text: . . LOW Static Discharge Voltage . >200IV (per MTL-STD-883 , Method 3015


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PDF CY74FCT16373T CY74FCT162373T 16-Bit 25-mil Y7-trcrto237 CY74FCT162373CTPAC 48-Lead 240-Mil) CY74FCT162373CTP
54AC540

Abstract: No abstract text available
Text: accordance with 1.2*.l oT~ MTL-STD-883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant , screening conditions in accordance with method 5004 of MIL-STD- 883 . MILITARY DRAWING DEFENSE , , General Specification for. SPECIFICATION MILITARY MIL-M-38510 STANDARD MILITARY MIL-STD- 883 - Test , specified ¡erei^0"5 °f MIL"STD' 883 conjunction with compliant non-JAN devices" and di^si^lir^Sua , recommended case operating temperature range. 3.4 Marking. Marking shall be in accordance with MIL-STD- 883


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PDF 5962-8769501RX 54AC540 M38510/75710BRX b4ACb40 5962-87695012X b4AC54Q M38blà /7b/10B2X
C22V10

Abstract: 1FN41 DD10 device marking 04l 5962-88670
Text: 1.2.1 of MIL-STD- 883 , "Provisions for the use of MtL-STD-883 in conjunction with compliant non-JAM , , General Specification for. STANDARD MILITARY MIL-STD- 883 - Test Methods and Procedures for , individual item requirements shall be in accordance with 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN devices" and as specified herein. 3.2 Design , ^004706 0010000 EID m 3.5 Marking. Marking shall be in accordance with MIL-STD- 883 (see 3.1 herein). The


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PDF 1FN41 51J-296-5375. MIL-BUL-103. MIL-BUI-103 C22V10 DD10 device marking 04l 5962-88670
Not Available

Abstract: No abstract text available
Text: 240AT 244AT 240CT 244CT -I 7 4 Military Temperature Commercial MtL-STD-883 , Class B Plastic DIP


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PDF FCT244T CY54/74FCT240T CY54/74FCT244T FCT240T 240AT 244AT 240CT 244CT MtL-STD-883,
TM509

Abstract: IEC512-2 102A IEC-68
Text: No file text available


Original
PDF SPEC0256 07-NOV-2006 C05-102-XXXX C05-102A-XXXX 102-XXXX 02A-XXXX 8F-01-R06 C05-102-XXXXC05-102A-XXXXC05 102-XXXXC05 TM509 IEC512-2 102A IEC-68
8406501JX

Abstract: 82C54 1431c
Text: in accordance with method 5ÔÔ5 of MtL-STD-883 including groups A, B, C, and D inspections. The , with 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN , herein. SPECIFICATION MILITARY MIL-M-38510 STANDARD MILITARY MIL-STD- 883 - Test Methods and , 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN , operating temperature range. 3.4 Marking. Marking shall be in accordance with MIL-STD- 883 (see 3.1 herein).


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PDF MIL-STD-883, MIL-STD-883 82C54 8406501JX MD82C54/883 MD82C54/B 84065013X MR82C54/883 1431c
Not Available

Abstract: No abstract text available
Text: A testing In accordance with Method 5005 of MtL-STD-883 may be exerclsed. TABLE 7. TOTAL DOSE


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PDF ACS245MS ACS245MS 10sA/cm2 110jim 110nm
til 702 datasheet

Abstract: til 702 sbc-80 AS8S512K32 seiv
Text: ACT) AUSTIN SEMICONDUCTOR, INC. AS8S512K32 512K x 32 SRAM SRAM MODULE AVAILABLE AS MILITARY SPECIFICATIONS • SMD 5962-94611* • MTL-STD-883 *Pending FEATURES Operation with single 5 V supply High speed: 20, 25 and 35ns Built in decoupling caps for low noise Organized as 512Kx32 , byte selectable Low power CMOS TTL Compatible Inputs and Outputs Theta JC =1.00oC/w Future offerings 3.3 V Power Supply 15,17 ns Ultra High Speed OPTIONS • Timing 20ns 25ns 35ns • Package Ceramic Quad Flatpack Pin


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PDF AS8S512K32 MTL-STD-883 512Kx32 00oC/w AS8S512K32 512Kx32 c512K AS8S512K32Q til 702 datasheet til 702 sbc-80 seiv
STA090C3

Abstract: ix800
Text: Test: Fine Leak Test: Thermal Shock: Moisture Resistance: MIL-STD- 883 , Method 2002, Condition B MlI^STD- 883 , Method 2003 MIL-STD- 883 , Method 211, Conditions A and C MIL-STD- 883 , Method 2007, Condition A MtL-STD-202, Method 215 MIL-STD-202, Meethod 210, Condition B MIL-STD- 883 , Method 1014, Condition C MIL-STD- 883 , Method 1014, Condition A2 <5 x 10"®ATM cc/sec MIL-STD- 883 , Method 1011, Condition A MIL-STD- 883 , Method


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PDF
54C906

Abstract: 54C906 similar ELITE EY MM54C906F
Text: of method SOOS of Mtl-STD-883 , class 8. 4.4.3 Grouo C and group 0 inspection. Group C and group 0 , -383 (class 3) and as follows: . 5SS^:S,lS.b!.*?.,S51i1S Ubffle0f^th0d 5005 of MIL-STD- 883 shall be omitted , the rough nandling ".est shall not apply. TABLE II. Electr'cal test r»guirements. mil-STO- 883 test


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PDF MIl-M-38510. 54C306 MIL-M-38510, 54C906 54C906 similar ELITE EY MM54C906F
18V04

Abstract: 62L26A
Text: 20 ns L7C108KM20 -55X to +125°C — MtL-STD-883 Compliant 25 ns L7C108KMB25 20 ns L7C108KMB20 , . 5962-89598 □ Available 100% Screened to MIL-STD- 883 , Class B □ Plug Compatible with Cypress CY7C108/109 , L7C108YM25 L7C108YM20 —55°C to +125°C — MIL-STD- 883 Compliant 25 ns 20 ns L7C108DMB25 L7C108DMB20 , +125°C — Commercial Screening 25 ns L7C109KM25 20 ns L7C109KM20 -55"C to +125°C — MIL-STD- 883


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PDF L7C108/109 128Kx MIL-STD-883, CY7C108/109, IDT71024/71B024, MT5C1008, MCM6226A/62L26A, CXK581020 32-pin 18V04 62L26A
IDT8M624

Abstract: 8M624 8M624S 64k dynamic RAM 8M612S100 IDT8M624S
Text: ) Semiconductor components compliant to the latest revision of MtL-STD-883 Class B Sidebrazed DIP 25 30 35 40 45 , components are manu factured in compliance with the latest revisionof MIL-STD- 883 Class B, making them


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PDF IDT8M624S IDT8M612S IDT8M624S) IDT8M612S) 40-pin IDT8M624S/IDT8M612S IDT8M624S, IDT8M612S 64K/32K MtL-STD-883 IDT8M624 8M624 8M624S 64k dynamic RAM 8M612S100
Not Available

Abstract: No abstract text available
Text: package select function. For devices processed In total compliance to MtL-STD-883 , add / 883 after part , * MUX16ET MUX16BT* MUX16FT _ - * t - - MUX168TC/ 883 - - MUX16FP MUX16FPC - - MUX28AT* MUX28ET MUX28BT MUX28FT * - - - - MUX28BTC/ 883 - - , MUX-16BTC/ 883 LCC (TC-Suffix) PLCC (PC-Suffix) Ì ¡7] AO N.C. [¡S i l l A1 N.C.  , MUX-28BTC/ 883 LCC (TC-Suffix) PLCC (PC-Sufflx) 7 H H 8 ï I #i i $ ✓ liM llÉ la


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PDF 16-Channel/Dual UX-16/M UX-28 290flTyplcal MUX-16 DG506, HI-506A, AD7506 MUX-28 DG507,
103 c1k

Abstract: HCTS273 T004 qml-38535 qml38535
Text: with MtL-STD-883 (see 3.1 herein) and as specified herein. Inspections to be performed fcr dcvice class , with 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN , 1.2.1 of MIL-STD- 883 0 or V Certification and qualification to MIL-I-38535 1.2.4 Case outline(s). The , lead finish shall be as specified in MIL-STD- 883 (see 3.1 herein) for class M or MIL-1-38535 for , for. STANDARDS MILITARY MIL-STD- 883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 -


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PDF MIL-BUL-103. MIL-BUL-103 103 c1k HCTS273 T004 qml-38535 qml38535
Not Available

Abstract: No abstract text available
Text: and Enhanced versions • Military product compliant to MIL-STD- 883 , Class B FUNCTIONAL B LO C K , XX Package Process/ Temperature Range Blank B MtL-STD' 883 , Class B P D SO L E


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PDF IDT54/74FCT648/A IDT54/74FCT646 IDT54/74FCT648 IDT54/74FCT646/A IDT54/74FCT648/A
Supplyframe Tracking Pixel