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Part Manufacturer Description Datasheet Download Buy Part
LT1017MJ8/883 Linear Technology LT1017 - Micropower Dual Comparator; Package: CERDIP; Pins: 8; Temperature: Military
LT1018MJ8/883 Linear Technology LT1018 - Micropower Dual Comparator; Package: CERDIP; Pins: 8; Temperature: Military
LM108AJ8 Linear Technology LM108A - Operational Amplifiers; Package: CERDIP; Pins: 8; Temperature: Military
LTC1041MJ8/883 Linear Technology LTC1041 - BANG-BANG Controller; Package: CERDIP; Pins: 8; Temperature: Military
RH137KDICE Linear Technology IC VREG ADJUSTABLE NEGATIVE REGULATOR, UUC3, DIE-3, Adjustable Negative Single Output Standard Regulator
RH137HDICE Linear Technology IC VREG ADJUSTABLE NEGATIVE REGULATOR, UUC3, DIE-3, Adjustable Negative Single Output Standard Regulator

Mil-Std-202F 215j Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
2006 - Mil-Std-202F 215j

Abstract: Polyimide
Text: shall meet requirements for MIL-STD- 202F , Notice 12 Method 215J . Polyimide Component Labels Size .25" , meet the print performance requirements for MIL-STD- 202F , Notice 12 Method 215J . w w w. p a n d u i


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PDF IDSP02 SA-IDSP02 Mil-Std-202F 215j Polyimide
2006 - M200X100Y

Abstract: No abstract text available
Text: designated for use and shall meet requirements for MIL-STD- 202F , Notice 12 Method 215J . Thermal Transfer , desktop printer utilizing the resin ribbon designated to meet print performance requirements for MIL-STD- 202F , Notice 12 Method 215J . w w w. p a n d u i t . c o m Thermal Transfer Marker Plates Width `A'


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PDF MIL-STD-202F, M300X100Y6T com/idsp05 IDSP05 SA-IDSP05 M200X100Y
RW-2513

Abstract: B033B SAE-AS81531 HX-SCE HS032WE2NF038B RW2514 Transparent, Extended ribbon cable 8 x 8 DOT MATRIX 32mm RW25244 RPS heat-shrinkable sleeves
Text: permanence: SAE AS81531 4.6.2 Solvent resistance: MIL-STD- 202F Method 215J n n n n Temperature , Electronics Military TTDS-037 SAE AS81531 4.6.2 MIL-STD- 202F Method 215J Industry UL 224 (clause 14) ASTM D , 81531 4.6.2 MIL-STD- 202F Method 215J Printer information Tyco Electronics printer Tyco Electronics , 81531 4.6.2 MIL-STD- 202F Method 215J Printer information Tyco Electronics printer Tyco Electronics , AS81531 4.6.2 Solvent resistance: MIL-STD- 202F Method 215J n Printer information Tyco Electronics


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PDF DTL-23053/5 RW-2513 B033B SAE-AS81531 HX-SCE HS032WE2NF038B RW2514 Transparent, Extended ribbon cable 8 x 8 DOT MATRIX 32mm RW25244 RPS heat-shrinkable sleeves
delco

Abstract: Mil-Std-202F 215j JIS-C-6429 28F0818 28F0448-6T0 Q-1000-211 28R3149-000 28c0236 0bw 10 laird 6429 HZ0603A601R
Text: JESD22 Meth. B-100 23. Resistance to Solvents Mil-Std- 202F Meth. 215J 24. Mechanical Shock Mil-Std- 202F Meth. 213 Condition C 25. Vibration Mil-Std- 202F Meth. 204 26. Resistance to Solder Heat Mil-Std- 202F Meth. 210 , Mil-Std- 202F Meth. 108 18. Temperature Cycle JESD22 JA 104-B 19. Moisture Resistance Mil-Std- 202F Meth. 106 20. Bias Humidity Mil-Std- 202F


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PDF SIP-BRO-15-0208 25D0889-010 25S0670-000 28B0375-400 28B1020-100 28C0236-0BW 28F0121-0S0 delco Mil-Std-202F 215j JIS-C-6429 28F0818 28F0448-6T0 Q-1000-211 28R3149-000 28c0236 0bw 10 laird 6429 HZ0603A601R
1999 - ocxo cts

Abstract: Mil-Std-202F 215j 106F 204D 213B cts REEVES cts ovenized cts REEVES crystal
Text: direction, Per MIL-STD- 202F , Method 213B, Test Condition D Sinusoidal Vibration 0.06" D.A. or 10G's Peak, 10 to 500 Hz Per MIL-STD- 202F , Method 204D, Test Condition A Random Vibration 5.35 G's rms. 20 to 2000 Hz, Per MIL-STD- 202F Method 214 Test Condition 1A, 15 minutes each axis Moisture 10 cycles, 95% RH, per MIL-STD- 202F , Method 106F Seal Condition D Bath @ 90°C ±5°C MIL-STD- 202F Method 112 Marking Permanency Per MIL-STD- 202F , Method 215J Attachment Method PCB Through Hole Mounted Resistance


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PDF
Technical Brochure

Abstract: Mil-C-55681 EIA-469 EIA-198-1-E EIA-469-C Mil-Std-202F 215j EIA-198 method 103 MIL-C55681 210E MIL-PRF-49467
Text: ) 215J (2001.2) 304 301 302 303 Vibration Solderability Resistance to Solder Heat Terminal , Specification Test Category EIA-198-1-E MIL-C-55681: MIL-STD- 202F (MIL-STD-883E) EIA-198-1-E MIL-C-55681: MIL-STD- 202F (MIL-STD-883E) 305 210 306 (EIA-469-C) EIA-198-1-E MIL-C-55681: MIL-STD- 202F


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PDF MIL-C-55681 MIL-C-55681 EIA-198-1-E MIL-C-55681: MIL-STD-202F MIL-STD-883E) Technical Brochure EIA-469 EIA-198-1-E EIA-469-C Mil-Std-202F 215j EIA-198 method 103 MIL-C55681 210E MIL-PRF-49467
2009 - Mil-Std-202F 215j

Abstract: No abstract text available
Text: Solder Heat Solder Process 500 G's 1ms, Half sine, 3 shocks per direction, per MIL- STD 202F , Method 213B Test Condition D. 0 .06" D.A. or 10G's Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. 5.35 G's rms. 20 to 2000 Hz per MIL-STD- 202F , Method 214,Test Condition 1A, 15 minutes each axis. 10 cycles, 95% RH, Per MIL-STD- 202F , Method 112. Per MIL-STD- 202F , Method 215J . Through Hole Mounted Per MIL-STD- 202F , Method 210, Condition E. RoHS compliant, lead free. See solder profile. 0


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PDF MIL-STD-202F, 127mm) Cx072 Mil-Std-202F 215j
2014 - Not Available

Abstract: No abstract text available
Text: Solder Heat Solder Process 500 G’s 1ms, Halfsine, 3 shocks per direction, per MIL- STD 202F , Method 213B Test Condition D. 0.06” D.A. or 10G’s Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. 5.35 G’s rms. 20 to 2000 Hz per MIL-STD- 202F , Method 214,Test Condition 1A, 15 minutes each axis. 10 cycles, 95% RH, Per MIL-STD- 202F , Method 112. Per MIL-STD- 202F , Method 215J . Through Hole Mounted Per MIL-STD- 202F , Method 210, Condition E. RoHS compliant, lead free. See


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PDF OX200-SC OX200-SC Cx194
2014 - Not Available

Abstract: No abstract text available
Text: sine, 3 shocks per direction, per MIL- STD 202F , Method 213B Test Condition D. 0.06” D.A. or 10G’s Peak, 10 to 500 Hz, per MIL-STD 202F , Method 204D, Test Condition A. 5.35 G’s rms. 20 to 2000 Hz per MIL-STD- 202F , Method 214,Test Condition 1A, 15 minutes each axis. 10 cycles, 95% RH, Per MIL-STD- 202F , Method 112. Per MIL-STD- 202F , Method 215J . RoHS compliant, lead free. See solder profile on page 3


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PDF DOT050F DOT050V DOT050V 9x14mm, DOT050F SM-MECH42 J-STD-020C
2009 - Not Available

Abstract: No abstract text available
Text: MILSTD 202F , Method 213B Test Condition D. 0.06” D.A. or 10G’s Peak, 10 to 500 Hz, per MIL-STD202F, Method 204D, Test Condition A. 5.35 G’s rms. 20 to 2000 Hz per MIL-STD- 202F , Method 214,Test Condition 1A, 15 minutes each axis. 10 cycles, 95% RH, Per MIL-STD- 202F , Method 112. Per MIL-STD- 202F , Method 215J . Through Hole Mounted Per MIL-STD- 202F , Method 210, Condition E. RoHS compliant, lead free


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PDF OX200-SC OX200-SC Cx194
2009 - 119b3

Abstract: cts ocxo 5 MHz cts ocxo CTS ocxo 125 ocxo cts 03 12M800 16M384 204D 213B
Text: 500 G's 1 ms, Halfsine, 3 shock per direction, per MIL-STD- 202F , Method 213B, Test Condition D. Sinusoidal Vibration : 0.06" D.A. or 10 G's Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. Random Vibration : 5.35 G's RMS. 20 to 200 Hz, per MIL-STD- 202F , Method 214, Test Condition 1A, 15 minutes each axis. Seal : Non hermetic Marking Permanency : per MIL-STD- 202F , Method 215J . Attachment Method : SMT Storage Temperature Range: -55°C to +125°C Document


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PDF 2002/95/EC 119B3HVR-16M384 10M000 12M800 13M000 16M384 19M440 20M000 25M600 26M000 119b3 cts ocxo 5 MHz cts ocxo CTS ocxo 125 ocxo cts 03 12M800 16M384 204D 213B
2010 - Not Available

Abstract: No abstract text available
Text: , per MIL-STD- 202F , Method 213B, Test Condition D. 0.06" D.A. or 10 G's Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. 5.35 G's RMS. 20 to 2000 Hz, per MIL-STD- 202F , Method 214, Test Condition 1A, 15 minutes each axis. Non hermetic per MIL-STD- 202F , Method 215J . Through-Hole Solder coated


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PDF 2002/95/EC 196B2HVR-16M384 10M000 12M800 13M000 16M384 19M440 20M000 25M600 26M000
Not Available

Abstract: No abstract text available
Text: Permanency Per MIL-STD- 202F , Method 215J Attachment Method PCB Through Hole Mounted lifetime , 's rms. 20 to 2000 Hz, Per MIL-STD- 202F Supply Voltage Option D VDD -0.5 7 Volts Supply , Voltage Control Storage Temperature Range Notes Per MIL-STD- 202F , Method 213B, Test Condition D Per MIL-STD- 202F , Method 204D, Test Condition A Method 214 Test Condition 1A, 15 minutes each axis , . Moisture 10 cycles, 95% RH, per MIL-STD- 202F , Method 106F Seal Condition D Bath @ 90°C Â


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PDF MIL-STD-202F, MIL-STD-202F
2013 - Not Available

Abstract: No abstract text available
Text: MIL-STD- 202F , Method 112. Marking Permanency Per MIL-STD- 202F , Method 215J . Solder Process , 1ms, Half sine, 3 shocks per direction, per MIL- STD 202F , Method 213B Test Condition D. Sinusoidal Vibration .06” D.A. or 10G’s Peak, 10 to 500 Hz, per MIL-STD 202F , Method 204D, Test Condition A. 0 Random Vibration 5.35 G’s rms. 20 to 2000 Hz per MIL-STD- 202F , Method 214


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PDF DOT050F DOT050V 9x14mm, DOT050F SM-MECH42 J-STD-020C TX395
2009 - ocxo cts 03

Abstract: cts ocxo
Text: -020C Level 1 500 G's 1 ms, Halfsine, 3 shock per direction, per MIL-STD- 202F , Method 213B, Test Condition D. 0.06" D.A. or 10 G's Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. 5.35 G's RMS. 20 to 200 Hz, per MIL-STD- 202F , Method 214, Test Condition 1A, 15 minutes each axis. Non hermetic per MIL-STD- 202F , Method 215J . SMT -55°C to +125°C Document No. 119 series Page 3 - 7 X12 CTS


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PDF 2002/95/EC 10M000 12M800 13M000 16M384 19M440 20M000 25M600 26M000 119B3HVR-16M384 ocxo cts 03 cts ocxo
2010 - Mil-Std-202F 215j

Abstract: cts ocxo CTS ocxo 125 12M800 204D 213B 196B5 32.768 CTS 196B2HVR-16M384
Text: , 3 shock per direction, per MIL-STD- 202F , Method 213B, Test Condition D. Sinusoidal Vibration : 0.06" D.A. or 10 G's Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. Random Vibration : 5.35 G's RMS. 20 to 2000 Hz, per MIL-STD- 202F , Method 214, Test Condition 1A, 15 minutes each axis. Seal : Hermetic Marking Permanency : per MIL-STD- 202F , Method 215J


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PDF 2002/95/EC 196B2HVR-16M384 10M000 12M800 13M000 16M384 19M440 20M000 25M600 26M000 Mil-Std-202F 215j cts ocxo CTS ocxo 125 12M800 204D 213B 196B5 32.768 CTS 196B2HVR-16M384
2014 - Not Available

Abstract: No abstract text available
Text: MIL-STD- 202F , Method 204D, Test Condition A. Random Vibration : 5.35 G’s RMS. 20 to 200 Hz, per MIL-STD- 202F , Method 214, Test Condition 1A, 15 minutes each axis. Seal : Non hermetic Marking Permanency : per MIL-STD- 202F , Method 215J . Attachment Method : SMT Storage Temperature Range , inverted reflow. Level 1 500 G’s 1 ms, Halfsine, 3 shock per direction, per MIL-STD- 202F , Method 213B


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PDF 2002/95/EC 119B3HVR-16M384 10M000 12M800 13M000 16M384 19M440 20M000 25M600 26M000
2002 - FT600-0500

Abstract: GR-1089
Text: MIL-STD-202, Method 210, Test Condition J Per MIL-STD- 202F , Method 215J -40/+85°C Per MIL-STD- 202F


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PDF FT600 UL60950, GR-1089 RCP0049 FT600-0500 GR-1089
2002 - GR1089

Abstract: FT600-0500 GR-1089
Text: MIL-STD-202, Method 210, Test Condition J Per MIL-STD- 202F , Method 215J -40/+85°C Per MIL-STD- 202F


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PDF FT600 UL60950, GR-1089 RCP0049 GR1089 FT600-0500 GR-1089
2012 - smd marking code pJ

Abstract: HM78D-128C800ALFTR HM78D-128C800ALF TB2285 78d12
Text: alcohol with 3 parts of mineral spirit. Brush 10 strokes on marking. Repeat 3 cycles per MIL-STD- 202F , method 215J . Accept criteria: Markings are still legible after test 8.3 OPERATING TEMPERATURE 8.3.1 , minutes, +150°C for 15 minutes, 5 cycles. 8.6 HUMIDITY 8.6.1 96 hours at 40°C±2°C at 90-95% RH per MIL-STD- 202F


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PDF HM78D-128C800ALFTR C00065 C10033 C12088 78D-128C800ALFTR smd marking code pJ HM78D-128C800ALF TB2285 78d12
2010 - CTS ocxo 125

Abstract: 204D 5MHz OCXO MHzor10 CTS ocxo cts ocxo 5 MHz ocxo 5mhz
Text: Marking Permanency : per MIL-STD- 202F , Method 215J . Attachment Method : Through-Hole Lead , : 0.06" D.A. or 10 G's Peak, 10 to 500 Hz, per MIL-STD- 202F , Method 204D, Test Condition A. Random


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PDF 2002/95/EC CTS ocxo 125 204D 5MHz OCXO MHzor10 CTS ocxo cts ocxo 5 MHz ocxo 5mhz
2010 - CTS ocxo

Abstract: ocxo cts 03 1190100-XXX
Text: three perpendicular directions 5.35 G's RMS. 20 to 200 Hz, per MIL-STD- 202F , Method 214, Test Condition 1A, 15 minutes each axis. Non hermetic per MIL-STD- 202F , Method 215J . SMT -40°C to +85°C


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PDF 1190100-XXX GR-1244-Core GR-253-Core 2002/95/EC 100mm 250mm FROM10 CTS ocxo ocxo cts 03 1190100-XXX
2010 - ocxo cts 03

Abstract: 1180026 CTS ocxo 125 1180026-018 cts ocxo ocxo cts 03 214 1180026-XXX CRYSTAL marking 20.000 cts ocxo 5 MHz GR-1244-CORE
Text: MIL-STD- 202F , Method 215J . Surface Mount Base High Temperature FR-4 Storage Temperature -55°C , each of three perpendicular directions Random Vibration 5.35 G's RMS. 20 to 500 Hz, per MIL-STD- 202F


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PDF 1180026-XXX GR-1244-Core GR-253-Core SONET/SDH/10GbE 2002/95/EC ocxo cts 03 1180026 CTS ocxo 125 1180026-018 cts ocxo ocxo cts 03 214 1180026-XXX CRYSTAL marking 20.000 cts ocxo 5 MHz GR-1244-CORE
2006 - 0204 footprint

Abstract: No abstract text available
Text: Conditions Per MIL-STD-202, Method 210, Test Condition J Per MIL-STD- 202F , Method 215J -40/+85°C Per MIL-STD- 202F


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PDF FT600 GR1089, TIA-968-A UL60950 0204 footprint
2010 - Mil-Std-202F 215j

Abstract: CTS ocxo GR-1244 GR-1244-CORE GR-253-CORE CTS ocxo 5 mhz
Text: perpendicular directions Random Vibration : 5.35 G's RMS. 20 to 500 Hz, per MIL-STD- 202F , Method 214, 15 minutes each axis. Seal : Non hermetic Marking Permanency : per MIL-STD- 202F , Method 215J


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PDF 1190100-XXX GR-1244-Core GR-253-Core 2002/95/EC 100mm 250mm FROM10 Mil-Std-202F 215j CTS ocxo GR-1244 GR-1244-CORE GR-253-CORE CTS ocxo 5 mhz
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