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MIL-PRF-38535. Datasheets Context Search

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qml38535

Abstract: MAX1044MJA 5962-3870702
Text: . Replaced reference to MIL-STD-973 w ith reference to MIL-PRF-38535. Draw ing updated to reflect current , device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall , device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be


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PDF MIL-STD-973 MIL-PRF-38535. CJA/883B 1ES66 qml38535 MAX1044MJA 5962-3870702
2013 - Not Available

Abstract: No abstract text available
Text: 03-06-03 R. MONNIN D Update drawing to current requirements of MIL-PRF-38535. -rrp 11-06-22 , . Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M , certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed


Original
PDF MIL-PRF-38535. LM126H/883
5962-9559601M2A

Abstract: qml-38535
Text: shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. , MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall , device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be , manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document


Original
PDF MIL-PRF-38535 5962-9559601M2A qml-38535
qml-38535

Abstract: CQCC1-N20
Text: shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with , Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The


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PDF T0GM70a qml-38535 CQCC1-N20
SMD 6 PIN IC MARKING CODE z1

Abstract: QML-38535 AD534T 5962-9053701VCA
Text: accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a , 's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under , and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified , device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained


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PDF MIL-PRF-38535 SMD 6 PIN IC MARKING CODE z1 QML-38535 AD534T 5962-9053701VCA
QML-38535

Abstract: CQCC1-N20 TL5001 TL5001A
Text: shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. , MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed , manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document


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PDF
MIL-PRF-38535, appendix A

Abstract: No abstract text available
Text: to MIL-PRF-38535. -rrp Make change to the AVS, +VOP, and -VOP test subgroups from 4, 5, and 6 to 1, 2 , accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , appendix , "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as , as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test , device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be


Original
PDF 5962-R036-97. MIL-STD-973 MIL-PRF-38535. MIL-PRF-38535, appendix A
Not Available

Abstract: No abstract text available
Text: still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking , MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. , . Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be , with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the


Original
PDF MIL-PRF-38535
qml38535

Abstract: qml-38535 CQCC1-N20 DS90C031 GDFP2-F16 SMD marking code 55B
Text: MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , appendix A. 3.5.1 , required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , with MIL-PRF-38535. The bum-in test circuit shall be maintained under document revision level control , classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. , specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be


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PDF 2-9583301Q2A DS90C031E-QML TD047GÃ qml38535 qml-38535 CQCC1-N20 DS90C031 GDFP2-F16 SMD marking code 55B
CDFP2-F14

Abstract: CQCC1-N20 GDFP1-F14 TLV2354 qml38535 qml-38535
Text: . Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M , certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The , 's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document , with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF- 38535 and herein , approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535.


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PDF
qml-38535

Abstract: 300C CQCC1-N20 TQD470
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit , classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those , shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test


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PDF 5962-E193-97 T0047GÃ DD3D721 D030731 qml-38535 300C CQCC1-N20 TQD470
qml-38535

Abstract: AD872ASD AD872ASE GDIP1-T28
Text: MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , appendix A. 3.5.1 , required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control , classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. , shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test


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PDF 5962-R288-94. AD872ASE/883B qml-38535 AD872ASD AD872ASE GDIP1-T28
5962-8851301GA

Abstract: clc200a1 5962-88513012A qml-38535 CDFP2-F10 CQCC1-N20 OP-42A OP-42B e507
Text: MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , appendix A. 3.5.1 , required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed , shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test


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PDF T0G47DÃ 5962-8851301GA clc200a1 5962-88513012A qml-38535 CDFP2-F10 CQCC1-N20 OP-42A OP-42B e507
2006 - Not Available

Abstract: No abstract text available
Text: accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a , 's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under , and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The


Original
PDF 1ES66
Not Available

Abstract: No abstract text available
Text: accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , appendix , "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed , approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535.


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PDF
qml-38535

Abstract: GDIP1-T16 LM2595-12 5962-9650201QEA
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control , classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. , approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535.


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PDF A962-9650201QEA LM2595J-12-QML 003b74S qml-38535 GDIP1-T16 LM2595-12 5962-9650201QEA
GDIP1-T16

Abstract: LM2595 qml38535 qml-38535
Text: MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , appendix A. 3.5.1 , required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be , be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF- 38535 , shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test


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PDF 5962-E051-97 T0047QÃ GDIP1-T16 LM2595 qml38535 qml-38535
AD648S

Abstract: AD648T 5962-9753502VPA qml38535
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control , classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. , specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be


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PDF TD0M70Ã AD648S AD648T 5962-9753502VPA qml38535
qml-38535

Abstract: HA-4741
Text: shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. , MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The bum-in test circuit shall , accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF- 38535 and , manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document


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PDF HA1-4741/883 qml-38535 HA-4741
5962-98651

Abstract: QML-38535 DS90LV031A GDFP2-F16 990526
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control , classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. , shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test


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PDF DS90LV031AW-QML 5962-98651 QML-38535 DS90LV031A GDFP2-F16 990526
2013 - Not Available

Abstract: No abstract text available
Text: accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF- 38535 , be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed , 's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document


Original
PDF MIL-PRF-38535
qml-38535

Abstract: No abstract text available
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall , device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be , 's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document


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PDF
Defense/MIL-PRF-123

Abstract: No abstract text available
Text: shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. , MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF- 38535 , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall , device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be , specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be


Original
PDF 5962-R229-94. Defense/MIL-PRF-123
5962-9953101MUA

Abstract: QML-38535 5962-99531 OM3958
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall , classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those , specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be


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PDF MONOL883B OM3958NM/883B OM3958ST/883B 5962-9953101MUA QML-38535 5962-99531 OM3958
QML-38535

Abstract: AD677
Text: classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in , device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for , for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed , alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The , in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall


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PDF 16-BIT, 5962-E259-96 MIL-HDBK-1331. QML-38535. QML-38535 MIL-HDBK-103. MIL-HDBK-103 10047GÃ AD677
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