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Part Manufacturer Description Datasheet Download Buy Part
LT1017MJ8/883 Linear Technology LT1017 - Micropower Dual Comparator; Package: CERDIP; Pins: 8; Temperature: Military
LT1018MJ8/883 Linear Technology LT1018 - Micropower Dual Comparator; Package: CERDIP; Pins: 8; Temperature: Military
LM108AJ8 Linear Technology LM108A - Operational Amplifiers; Package: CERDIP; Pins: 8; Temperature: Military
LTC1041MJ8/883 Linear Technology LTC1041 - BANG-BANG Controller; Package: CERDIP; Pins: 8; Temperature: Military
LM399H#40057 Linear Technology LM399 - Precision Reference; Package: METAL CAN; Pins: 4; Temperature: Military
LTC1100MD#40167 Linear Technology LTC1100 - Precision, Zero-Drift Instrumentation Amplifier; Package: ; Pins: 0; Temperature: Military

MIL-HDBK-217 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
2013 - Not Available

Abstract:
Text: purpose of MIL-HDBK-217 to provide a common basis for reliability prediction, MS Kennedy does not modify , the MIL-HDBK-217 method, where base failure rates are imported from the software, and are not , rates were calculated based on the following formula from MIL-HDBK-217 : λP = [ΣNCλC](1 + .2πE) πF πQ πL Failures/106 hrs Given from MIL-HDBK-217 : NC = Number of each particular component λC , assumptions for our standard voltage regulator product MTBF reports. Method I - MIL-HDBK-217 / Windchill


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PDF MIL-HDBK-217F MIL-HDBK-217, MIL-HDBK-217 MIL-STD-756B, AN001
1962 - Hybrid Microcircuits 1976

Abstract:
Text: .146 2.1 MIL-HDBK-217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL.147 2.2 MIL-HDBK-217 , .153 3.2 NOTES ON USING MIL-HDBK-217 PREDICTION MODELS. 156 3.2.1 OUTLINE (REVISIONS TO MIL-HDBK-217 ). 156 3.2.2 CAUTIONS FOR USE OF MIL-HDBK-217. 157 , and quality level are also taken into account3)-6). MIL-HDBK-217 is the most commonly used prediction


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PDF MIL-HDBK-217 MIL-HDBK-217F R76-48, MIL-HDBK-217B, R75-7, R75-21, R76-22, Hybrid Microcircuits 1976 lm741 die GaAs wafer MIL-HDBK-217D MIL-HDBK-217C MIL-HDBK-217A LM741A LM106 r7521
MIL-HDBK-217

Abstract:
Text: - =500VDC - =500VDC -10+60 -0+85 MTBF MIL-HDBK-217 (25 , MIL-HDBK-217 (25) *: 55 0.35W/ mm 1 +Vin 2 -Vin 3 +Vout , -40+105 0 MTBF MIL-HDBK-217 (25) 8*105h Guoyao Technologies


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PDF 260KHz 200mV 100mV 200us 500VDC MIL-HDBK-217 100000h 300KHz 500VDC
2006 - hcpl 731

Abstract:
Text: using MIL-HDBK-217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MIL-HDBK-217. , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated , energy is used as in the hybrid section of MIL-HDBK-217. Table 2. Reliability Projections (per , 3,650,155 5,721,351 9,224,902 11,848,531 99,888 115,803 217 ,325 305,248 436,731 637,480


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PDF HCPL-2300 5989-1824EN AV01-0487EN hcpl 731 HCPL 601 Optocoupler 601 MIL-HDBK-217 601 optocoupler Optocoupler 721 OPTOCOUPLER 436 MIL-STD-217 FIT HCPL-2300 optocoupler avago
2005 - JESD-B-102

Abstract:
Text: relationship, where a 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. OTHER , necessary to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK-217 , to different conditions and factors that have been accounted for in MIL-HDBK-217. For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Application Information


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PDF ACPL-M71U, ACPL-M72U JESD-A110 15psig JESD-A102 JESD-A103 AV02-3713EN JESD-B-102 AVAGO DIP JA113 JESD-A102
signetics linear package marking

Abstract:
Text: quality Levels Sand B of MIL-HDBK-217 (jcq - 0.25 for Class S, 1.0 for Class B). · 100% final electrical , conforms to quality level B-1 of MIL-HDBK-217 (JC q = 2.0). Standard M ilitary Drawing (SMD) DESC , standard product part num ber. This category of product conforms to Quality Level B-1 of MIL-HDBK-217 (no = , by MIL-STD-454, Requirement 64 and by MIL-HDBK-217 , and are recommended for use in the most critical , product conforms to quality level D of MIL-HDBK-217 (7 Iq = 10.0). work-in-process by customer). For


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PDF MIL-STD-883, MIL-M-38510 signetics linear package marking MIL-STD-480 signetics military marking
calculating rectifier circuits MTBF

Abstract:
Text: .4 Changes to the model incorporated in Revision F of MIL-HDBK-217 for estimation of hybrid failure rates , results that do not agree with those based on models presented in Revision E of MIL-HDBK-217. To , model incorporated in Revision F of MIL-HDBK-217 for estimation of hybrid failure rates result in a , results that do not agree with those based on models presented in Revision E of MIL-HDBK-217. To , MIL-HDBK-217F Notice 2 and using MILHDBK-217E. In addition, calculations are presented including


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PDF AN-1078 calculating rectifier circuits MTBF bimetal transformer mtbf MIL-HDBK-217F CAPACITOR chip mtbf MIL-HDBK-217E 217F ART2815T AN-1078 MIL-HDBK217F
2006 - MIL-HDBK-217

Abstract:
Text: system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component reliability , that have been accounted for in MIL-HDBK-217. For example it is unlikely that your application will , Table 2 to predictions using MIL-HDBK-217. Definition of Failure Inability to switch, i.e. "functional , as in the hybrid section of MIL-HDBK-217. Application Information The data of Table 1 and 2 were


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PDF HCPL-7601/7611 245oC MIL-STD-883 1000hrs 121oC, 168hrs 5989-3533EN MIL-HDBK-217
2007 - HCPL 454

Abstract:
Text: using MIL-HDBK-217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MIL-HDBK-217. , and duty cycle must be carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. Application Information


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PDF HCPL-4200 specification009 5988-7900EN HCPL 454 MIL-HDBK-217
2006 - 0133E

Abstract:
Text: to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK-217 , to different conditions and factors that have been accounted for in MIL-HDBK-217. For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Stress Test Condition Ta = , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. Table 3. Mechanical Tests


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PDF HCNW138 HCNW139 MIL-STD-883 1000hrs AV01-0133EN 0133E AVAGO DIP MIL-STD-217 FIT
2005 - JA113

Abstract:
Text: section of MIL-HDBK-217. OTHER MANUFACTURERS' SIMILAR PART TYPES. Operating Life Test For valid , operation. Note that if you are using MIL-HDBK-217 for predicting component reliability, the results may not , accounted for in MIL-HDBK-217. For example it is unlikely that your application will exercise all available , using MIL-HDBK-217. Application Information The data of Table 1 and 2 were obtained on devices with


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PDF ACPL-K49T 20kBd JESD-A110 96hrs 1000hrs 15psig JESD-A103 JESD-A102 AV02-3187EN JA113 JESD-A103 JESD-A102 JESDA103 avago MSL 1 optocoupler MTTF
2006 - MIL-STD-217 FIT

Abstract:
Text: necessary to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK-217 , to different conditions and factors that have been accounted for in MIL-HDBK-217. For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK-217. Definition of Failure , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217. Table 2. Reliability


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PDF HCPL-3140 MIL-STD-883 121oC AV01-0659EN MIL-STD-217 FIT
2005 - 785e

Abstract:
Text: the system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , section of MIL-HDBK-217. Environmental Testing All high reliability hermetic optocouplers listed meet


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PDF ACPL-785E 5962-9755701EPx HCPL-7851, 5962-9755701HPx MIL-PRF-38534. Fail/109hr) MIL-STD-883 5962-9755701HPx, HCPL-7851 785e MIL-HDBK-217
1998 - quality assurance for semiconductor devices

Abstract:
Text: SEMICONDUCTOR DEVICES 1. INTRODUCTION 2. METHODS OF RELIABILITY PREDICTION 2.1 MIL-HDBK-217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL 2.2 MIL-HDBK-217 MICROCIRCUIT PREDICTION MODEL 3. MIL-HDBK-217F RELIABILITY PREDICTION 3.1 HYBRID MICROCIRCUIT FAILURE RATE PREDICTION 5) 3.2 NOTES ON USING MIL-HDBK-217


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GYD01-12RD12

Abstract:
Text: =500VDC - =500VDC 70KHz -10 +60 -30+85 MTBF 6W MIL-HDBK-217 (25 , %) =25mS =20KHz MTBF -10+60 -30+85 MIL-HDBK-217 (25) 8×100000h


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PDF GYD01-05RS03 GYD01-05RS05 GYD01-05RS08 GYD01-05RS12 GYD01-05RD05 GYD01-01RD08 GYD01-05RD12 GYD01-12RS03 GYD01-12RS05 GYD01-12RS08 GYD01-12RD12 12RD08 500VDC MIL-HDBK-217 GYD01-05RS12 GYD01-05RS08 GYD01-05RS05 GYD01-05RS03 GYD01-05RD12 MIL-HDBK217
2013 - PSC-20

Abstract:
Text: : 40mA 120.4K HRS MIL-HDBK-217 (25˚C) 131.3K HRS MIL-HDBK-217 (25˚C) 23x90x99 mm (WxHxD) 0.14Kg/48 pcs./7.92Kg I/P 3 poles, O/P: 3 poles screw DIN terminal Free air convection 125.9K HRS MIL-HDBK-217


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PDF PSC-20 E361935 E205412 8-264V UL1310 UL508 PSC-2012 PSC-2015 PSC-2024
1998 - TR-NWT-000332

Abstract:
Text: several different cases that define the various conditions. MIL-HDBK-217 , Reliability Prediction of , of operating power to rated power. The values are found in lookup tables within MIL-HDBK-217. The , benign environment. See Table 19. The part quality factor used as stated in MIL-HDBK-217 is equal to , applicable during early design phase and during proposal formulation. MIL-HDBK-217F For a Part Stress , PREDICTED RELIABILITY FOR PT3100/4100 SERIES Parameter FITs (Failures in 109 hours) 250 MIL-HDBK-217F


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PDF PT3100/4100 MIL-HDBK-217F 48VDC TR-NWT-000332 MIL-HDBK-217F circuit board mtbf fixed film resistor MIL-HDBK-217
W-S-6536

Abstract:
Text: its date of publication. These categories of product conform to quality Levels S and B of MIL-HDBK-217 , MIL-HDBK-217 (* q = 2.0). Standard Military Drawing (SMD) DESC selected item drawings (mini-specs) were , of product conforms to Quality Level B-1 of MIL-HDBK-217 ( jc q = 2.0) JAN Qualified Products , MIL-HDBK-217 , and are recommended for use in the most critical of applications such as manned space and


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PDF MIL-STD-883, MIL-M-38510 W-S-6536 Signetics At 513 MIL-STD-480 signetics linear package marking WS6536
array resistor mtbf

Abstract:
Text: 80 120 MIL-HDBK-217 Plus Parts Count; 25°C Ground Benign, 91.3 5.0 MHrs 2 RVC-INT , MIL-HDBK-217 Plus Parts Count; 25°C Ground Benign, MTBF A kΩ MVTM36 Series Model Specific , 3.00 MHz Switching frequency Output ripple frequency 40 60 MIL-HDBK-217 Plus Parts Count , , Indoors / Computer Profile VC internal resistor 40 % MIL-HDBK-217 Plus Parts Count; 25 , Switching frequency Output ripple frequency 20 30 MIL-HDBK-217 Plus Parts Count; 25°C Ground Benign


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PDF MVTM36 array resistor mtbf
2006 - 6N137

Abstract:
Text: system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , hybrid section of MIL-HDBK-217. Table 2. Reliability Projections (per channel) for Devices Listed


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PDF HCPL-2601/2611, HCPL-2630/2631/4661 6N137 5988-2651EN AV01-0495EN 6N137 MTTF test data
2006 - 2430 avago

Abstract:
Text: system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , when comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , section of MIL-HDBK-217. Application Information The data of Tables 1 and 2 were obtained on devices


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PDF HCPL-2400 HCPL-2430 5988-4129EN AV01-0497EN 2430 avago HCPL-2430
2007 - optocoupler MTTF

Abstract:
Text: the system is not in operation. Note that if you are using MIL-HDBK-217 for predicting component , comparing Table 2 to predictions using MIL-HDBK-217. Table 1. Demonstrated Operating Life Test , relationship, where a 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK-217.


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PDF 5962-9755701HPX, HCPL-7851 MIL-PRF-38534. syste/109hr) Fail/109hr) MIL-STD-883 HCPL-7851 5962-9755701HPX AV02-0316EN optocoupler MTTF avago, hcpl 817 MTTF test data
MIL-HDBK-217

Abstract:
Text: 9810A Rev. B NEL CRYSTAL CLOCK OSCILLATORS SJ/HJ-X8XX series clock oscillators Reliability Calculations Based on MIL-HDBK-217 F 1 . .01 2.2 jc 1 . .0035 .15 1 . .025 .64 1 . .025 .64 Silicon,epoxy,alumina,and alumina ( 0.05.0.05) jc = 42.402 junction to case thermal resistance Pd 0.450 power disapation in watts Tc 70 case temperature in °C Tj Tc ( jc .Pd , /HJ-X8XX series clock oscillators Reliability Calculations Based on MIL-HDBK-217 F Continued: Quality


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PDF MIL-HDBK-217
PWR700A

Abstract:
Text: predicted MTTF of 1,371,486 hours (per MIL-HDBK-217 Rev. E, circuit-stress analysis method, +25°C, ground , predicted MTTF calcula tions per MIL-HDBK-217 Rev. E, circuit-stress analysis method. Some manufacturers


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PDF MIL-I-45208A, PWR700A MIL-HDBK-217 PWR700A PWR700A/H PWR700A/T
2000 - Not Available

Abstract:
Text: Komponenten (vereinfachtes Modell nach der Norm MIL-HDBK-217 ). Nach einer Periode von Frühausfällen wird eine , Burn-in. Das MIL-HDBK-217 (eine Sammlung mit Angaben zu Ausfallraten, erstellt durch die US Army) nimmt , Stromversorgungen von Power-One gemäss MIL-HDBK-217 sind in den entsprechenden Datenblättern unter Beständigkeit , Technische Informationen Umgebungsbedingungen Umweltbedingungen gemäss MIL-HDBK 217 Ground, Benign: An


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