1962 - Hybrid Microcircuits 1976
Abstract: lm741 die LM741A LM106 MIL-HDBK-217C MIL-HDBK-217D MIL-HDBK-217A MIL-HDBK-217 GaAs wafer r7521
Text: .146 2.1 MIL-HDBK- 217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL.147 2.2 MIL-HDBK- 217 , .153 3.2 NOTES ON USING MIL-HDBK- 217 PREDICTION MODELS. 156 3.2.1 OUTLINE (REVISIONS TO MIL-HDBK- 217 ). 156 3.2.2 CAUTIONS FOR USE OF MIL-HDBK- 217 . 157 , and quality level are also taken into account3)-6). MIL-HDBK- 217 is the most commonly used prediction
|
Original
|
PDF
|
MIL-HDBK-217
MIL-HDBK-217F
R76-48,
MIL-HDBK-217B,
R75-7,
R75-21,
R76-22,
Hybrid Microcircuits 1976
lm741 die
LM741A
LM106
MIL-HDBK-217C
MIL-HDBK-217D
MIL-HDBK-217A
GaAs wafer
r7521
|
calculating rectifier circuits MTBF
Abstract: bimetal transformer mtbf MIL-HDBK-217F CAPACITOR chip mtbf 217F MIL-HDBK-217E ART2815T AN-1078 MIL-HDBK217F
Text: .4 Changes to the model incorporated in Revision F of MIL-HDBK- 217 for estimation of hybrid failure rates , model incorporated in Revision F of MIL-HDBK- 217 for estimation of hybrid failure rates result in a , prepared the Rev F model created for hybrid microcircuits. MTBF calculations based on these models produce results that do not agree with those based on models presented in Revision E of MIL-HDBK- 217 . To , Rev F model created for hybrid microcircuits. MTBF calculations based on these models produce
|
Original
|
PDF
|
AN-1078
calculating rectifier circuits MTBF
bimetal
transformer mtbf
MIL-HDBK-217F
CAPACITOR chip mtbf
217F
MIL-HDBK-217E
ART2815T
AN-1078
MIL-HDBK217F
|
2013 - Not Available
Abstract: No abstract text available
Text: purpose of MIL-HDBK- 217 to provide a common basis for reliability prediction, MS Kennedy does not modify , the MIL-HDBK- 217 method, where base failure rates are imported from the software, and are not , rates were calculated based on the following formula from MIL-HDBK- 217 : λP = [ΣNCλC](1 + .2ÏE) ÏF ÏQ ÏL Failures/106 hrs Given from MIL-HDBK- 217 : NC = Number of each particular component λC , assumptions for our standard voltage regulator product MTBF reports. Method I - MIL-HDBK- 217 / Windchill
|
Original
|
PDF
|
MIL-HDBK-217F
MIL-HDBK-217,
MIL-HDBK-217
MIL-STD-756B,
AN001
|
Not Available
Abstract: No abstract text available
Text: , Matsuo is using Mil-HDBK-217-F , and the calculation method is explained as follows: MATSUO ELECTRIC , â Reliability (Failure Rate) of * i Solid Tantalum Capacitors » The Reliability of components is typically expressed in terms of failure rates. The formula for calculating an average failure rate is as follows: X n t f f t nx t = failure rate = number of tested units = operating , . ^ In estimating the failure rates, the US military specification, MIL-HDBK- 217 âEstimation of
|
OCR Scan
|
PDF
|
100x1000
/1000hrâ
105xl/hr,
0040X10
|
1998 - TR-NWT-000332
Abstract: MIL-HDBK-217F fixed film resistor circuit board mtbf MIL-HDBK-217
Text: several different cases that define the various conditions. MIL-HDBK- 217 , Reliability Prediction of , of operating power to rated power. The values are found in lookup tables within MIL-HDBK- 217 . The , benign environment. See Table 19. The part quality factor used as stated in MIL-HDBK- 217 is equal to
|
Original
|
PDF
|
PT3100/4100
MIL-HDBK-217F
48VDC
TR-NWT-000332
MIL-HDBK-217F
fixed film resistor
circuit board mtbf
MIL-HDBK-217
|
2013 - PSC-20
Abstract: No abstract text available
Text: : 40mA 120.4K HRS MIL-HDBK- 217 (25ËC) 131.3K HRS MIL-HDBK- 217 (25ËC) 23x90x99 mm (WxHxD) 0.14Kg/48 pcs./7.92Kg I/P 3 poles, O/P: 3 poles screw DIN terminal Free air convection 125.9K HRS MIL-HDBK- 217 , ¦ 1 Block Diagram DC O K DC O K R E C T IF IE R S & F I LT E R E MI F I LT E R I /P R E C T IF IE R S & F I LT E R P OWE R S W IT C H IN G +V -V O.C .P D E T E C T IO N
|
Original
|
PDF
|
PSC-20
E361935
E205412
8-264V
UL1310
UL508
PSC-2012
PSC-2015
PSC-2024
|
AME05
Abstract: zener 24v 5w AME05-12S AME05-5S
Text: Minimum Load 4% 1% 1% 0% 0% Maximum Capacitive Load 470-23,000m F depending on model Noise <0.5 , W x H) 2.17 x 1.77 x 0.81 inches (55.0 x 45.0 x 20.5 mm) Case Material Plastic resin + Fiberglass , Minimum Load 0% 0% 3% Maximum Capacitive Load 470-23,000m F depending on model Noise <0.5% Vout , ) 2.17 x 1.77 x 0.81 inches (55.0 x 45.0 x 20.5 mm) Case Material Plastic resin + Fiberglass
|
Original
|
PDF
|
AME05
AME05-3
AME05-5S
AME05-12S
AME05-15S
AME05-24S
110mA
1-888-9-AIMTEC
zener 24v 5w
AME05-12S
AME05-5S
|
MTTF
Abstract: ALD-310012PJ125 transistor 468 40E-05 4073
Text: CTR-4073-X PRODUCT NAME : ALD-310012PJ125 TEMPERATURES : (degC) 0 25 50 75 1,471 2,135 TOTAL : (fit) 723 1,031 MTTF : (hrs.) 1,383,524 969,522 679,986 468,457 FAILURE RATE TABLE : MIL-HDBK-217-F 1.6E+06 MTTF(hrs.) 1.2E+06 8.0E+05 4.0E+05 0.0E+00 0 20 40 60 80 TemperaturedegC PRODUCT NAME or MODEL, TITLE DC-DC CONVERTER UNIT ALD-310012PJ125 NAME OF DRAWING DRAWING No. PAGE MTTF DATA CTR-4073-X 1
|
Original
|
PDF
|
CTR-4073-X
ALD-310012PJ125
MIL-HDBK-217-F
TSB-08-01-05
MTTF
ALD-310012PJ125
transistor 468
40E-05
4073
|
MIL-HDBK-217
Abstract: No abstract text available
Text: Calculations Based on MIL-HDBK- 217 F 1 . .01 2.2 jc 1 . .0035 .15 1 . .025 .64 1 . .025 , /HJ-X8XX series clock oscillators Reliability Calculations Based on MIL-HDBK- 217 F Continued: Quality , /10^6 hours cap = 1.087 10 cap f 1.0 Circuit function factor for digital circuit l 1.0 , 1.0 Quality Factor , 1.0 for MIL and 2.1 for lower. I used 1.5 for something in between. f Frequency in MHz 100 b 0.23 0.013. f b = 0.037 xtal Base Failure Rate b . Q . E xtal =
|
Original
|
PDF
|
MIL-HDBK-217
|
MIL-HDBK-217
Abstract: 500VDC
Text: - =500VDC - =500VDC -10+60 -0+85 MTBF MIL-HDBK- 217 (25 , MIL-HDBK- 217 (25) *: 55 0.35W/ mm 1 +Vin 2 -Vin 3 +Vout , -40+105 0 MTBF MIL-HDBK- 217 (25) 8*105h Guoyao Technologies
|
Original
|
PDF
|
260KHz
200mV
100mV
200us
500VDC
MIL-HDBK-217
100000h
300KHz
500VDC
|
mosfet mttf
Abstract: ALD-214012PJ111 MIL-HDBK-217F 214012P 214012 MTTF ALD-214012
Text: CTR-4076-X PRODUCT NAME: ALD-214012PJ111 TEMPERATURES: (degC) 0 25 50 75 TOTAL: (fit) 532 649 889 1,493 MTTF: (hour) 1,880,639 1,541,359 1,125,289 669,698 MTTF [hour] FAILURE RATE TABLE: MIL-HDBK-217-F Data of MOSFET used the failure rate of obtaining from the manufacturer 2,000,000 1,800,000 1,600,000 1,400,000 1,200,000 1,000,000 800,000 600,000 400,000 200,000 0 0 20 40 Temperature [degC] 60 80 PRODUCT NAME or MODEL
|
Original
|
PDF
|
CTR-4076-X
ALD-214012PJ111
MIL-HDBK-217-F
TSB-08-01-05
mosfet mttf
ALD-214012PJ111
MIL-HDBK-217F
214012P
214012
MTTF
ALD-214012
|
2006 - hcpl 731
Abstract: Optocoupler 601 HCPL 601 MIL-HDBK-217 Optocoupler 721 HCPL-2300 optocoupler avago 601 optocoupler OPTOCOUPLER 436 MIL-STD-217 FIT
Text: using MIL-HDBK- 217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MIL-HDBK- 217 , carefully considered when comparing Table 2 to predictions using MIL-HDBK- 217 . Table 1. Demonstrated , energy is used as in the hybrid section of MIL-HDBK- 217 . Table 2. Reliability Projections (per , 3,650,155 5,721,351 9,224,902 11,848,531 99,888 115,803 217 ,325 305,248 436,731 637,480
|
Original
|
PDF
|
HCPL-2300
5989-1824EN
AV01-0487EN
hcpl 731
Optocoupler 601
HCPL 601
MIL-HDBK-217
Optocoupler 721
HCPL-2300
optocoupler avago
601 optocoupler
OPTOCOUPLER 436
MIL-STD-217 FIT
|
2005 - JESD-B-102
Abstract: AVAGO DIP JESD-A102 JA113
Text: relationship, where a 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK- 217 . OTHER , necessary to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK- 217 , to different conditions and factors that have been accounted for in MIL-HDBK- 217 . For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK- 217 . Application Information
|
Original
|
PDF
|
ACPL-M71U,
ACPL-M72U
JESD-A110
15psig
JESD-A102
JESD-A103
AV02-3713EN
JESD-B-102
AVAGO DIP
JESD-A102
JA113
|
1999 - circuit board mtbf
Abstract: TR-NWT-000332 MIL-HDBK-217F
Text: several different cases that define the various conditions. MIL-HDBK- 217 , Reliability Prediction of , of operating power to rated power. The values are found in lookup tables within MIL-HDBK- 217 . The , benign environment. See Table 19. The part quality factor used as stated in MIL-HDBK- 217 is equal to
|
Original
|
PDF
|
PT3100/4100
circuit board mtbf
TR-NWT-000332
MIL-HDBK-217F
|
|
|
2006 - MIL-HDBK-217
Abstract: No abstract text available
Text: system is not in operation. Note that if you are using MIL-HDBK- 217 for predicting component reliability , that have been accounted for in MIL-HDBK- 217 . For example it is unlikely that your application will , Table 2 to predictions using MIL-HDBK- 217 . Definition of Failure Inability to switch, i.e. "functional , as in the hybrid section of MIL-HDBK- 217 . Application Information The data of Table 1 and 2 were
|
Original
|
PDF
|
HCPL-7601/7611
245oC
MIL-STD-883
1000hrs
121oC,
168hrs
5989-3533EN
MIL-HDBK-217
|
2007 - MIL-HDBK-217
Abstract: HCPL 454
Text: using MIL-HDBK- 217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MIL-HDBK- 217 , and duty cycle must be carefully considered when comparing Table 2 to predictions using MIL-HDBK- 217 , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK- 217 . Application Information
|
Original
|
PDF
|
HCPL-4200
specification009
5988-7900EN
MIL-HDBK-217
HCPL 454
|
1998 - quality assurance for semiconductor devices
Abstract: MIL-HDBK-217 Semiconductor Devices mitsubishi packaging
Text: SEMICONDUCTOR DEVICES 1. INTRODUCTION 2. METHODS OF RELIABILITY PREDICTION 2.1 MIL-HDBK- 217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL 2.2 MIL-HDBK- 217 MICROCIRCUIT PREDICTION MODEL 3. MIL-HDBK-217F RELIABILITY PREDICTION 3.1 HYBRID MICROCIRCUIT FAILURE RATE PREDICTION 5) 3.2 NOTES ON USING MIL-HDBK- 217
|
Original
|
PDF
|
|
array resistor mtbf
Abstract: No abstract text available
Text: VIEW 2 4 3 A Aâ +OUT Bâ E -OUT IM B C TM VC D E PC -IN F , VTM 36B F 015 M 080 A 00 VTM = VTM 36B = 26.0 to 50.0 V F = Full VIC SMD , 26.0 V to 50.0 V 1/12 3.00 V ( 2.17 V to 4.17 V) -55 to 125°C 40 A MVTM36BF045M027A00 , VOUT_PP VDC dVIN/dt Output voltage ripple Unit 1 COUT = 0 F , IOUT = Full Load, VIN = 48 V , 80 120 MIL-HDBK- 217 Plus Parts Count; 25°C Ground Benign, 91.3 5.0 MHrs 2 RVC-INT
|
Original
|
PDF
|
MVTM36
array resistor mtbf
|
2006 - AVAGO DIP
Abstract: 0133E MIL-STD-217 FIT
Text: to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK- 217 , to different conditions and factors that have been accounted for in MIL-HDBK- 217 . For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK- 217 . Stress Test Condition Ta = , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK- 217 . Table 3. Mechanical Tests
|
Original
|
PDF
|
HCNW138
HCNW139
MIL-STD-883
1000hrs
AV01-0133EN
AVAGO DIP
0133E
MIL-STD-217 FIT
|
2000 - DIN IEC 60068-2-52
Abstract: No abstract text available
Text: toevallige storing wordt een storing veroorzaakt door een fout of slijtage onder invloed van veroudering. f ) Foutwaarde voor Elektronische Componenten (vereenvoudigd model volgens MIL-HDBK 217 ). Na een periode van , MIL-handboek MIL-HDBK- 217 , wat een US-Army verzameling is van uitvalpercentages, beschouwt een constant , 3/4 Standaarden en reglementen Omgeving volgens MIL-HDBK 217 Technische informatie Device , voedingen volgens MILHDBK- 217 zijn aangegeven in de betreffende datasheet onder Immunity to Environmental
|
Original
|
PDF
|
|
2005 - JA113
Abstract: JESD-A103 JESD-A102 JESDA103 avago MSL 1 optocoupler MTTF
Text: section of MIL-HDBK- 217 . OTHER MANUFACTURERS' SIMILAR PART TYPES. Operating Life Test For valid , operation. Note that if you are using MIL-HDBK- 217 for predicting component reliability, the results may not , accounted for in MIL-HDBK- 217 . For example it is unlikely that your application will exercise all available , using MIL-HDBK- 217 . Application Information The data of Table 1 and 2 were obtained on devices with
|
Original
|
PDF
|
ACPL-K49T
20kBd
JESD-A110
96hrs
1000hrs
15psig
JESD-A103
JESD-A102
AV02-3187EN
JA113
JESD-A103
JESD-A102
JESDA103
avago MSL 1
optocoupler MTTF
|
2006 - MIL-STD-217 FIT
Abstract: No abstract text available
Text: necessary to adjust for the time when the system is not in operation. Note that if you are using MIL-HDBK- 217 , to different conditions and factors that have been accounted for in MIL-HDBK- 217 . For example it is , carefully considered when comparing Table 2 to predictions using MIL-HDBK- 217 . Definition of Failure , 0.43 eV activation energy is used as in the hybrid section of MIL-HDBK- 217 . Table 2. Reliability
|
Original
|
PDF
|
HCPL-3140
MIL-STD-883
121oC
AV01-0659EN
MIL-STD-217 FIT
|
2000 - Not Available
Abstract: No abstract text available
Text: Fehlern stehen Ausfälle, welche durch Fehler oder Abnützung auftreten. f ) Ausfallraten für elektronische Komponenten (vereinfachtes Modell nach der Norm MIL-HDBK- 217 ). Nach einer Periode von Frühausfällen wird eine , Burn-in. Das MIL-HDBK- 217 (eine Sammlung mit Angaben zu Ausfallraten, erstellt durch die US Army) nimmt , Technische Informationen Umgebungsbedingungen Umweltbedingungen gemäss MIL-HDBK 217 Ground, Benign: An , Stromversorgungen von Power-One gemäss MIL-HDBK- 217 sind in den entsprechenden Datenblättern unter Beständigkeit
|
Original
|
PDF
|
|
signetics linear package marking
Abstract: MIL-STD-480 signetics military marking
Text: quality Levels Sand B of MIL-HDBK- 217 (jcq - 0.25 for Class S, 1.0 for Class B). · 100% final electrical , conforms to quality level B-1 of MIL-HDBK- 217 (JC q = 2.0). Standard M ilitary Drawing (SMD) DESC , standard product part num ber. This category of product conforms to Quality Level B-1 of MIL-HDBK- 217 (no = , by MIL-STD-454, Requirement 64 and by MIL-HDBK- 217 , and are recommended for use in the most critical , product conforms to quality level D of MIL-HDBK- 217 (7 Iq = 10.0). work-in-process by customer). For
|
OCR Scan
|
PDF
|
MIL-STD-883,
MIL-M-38510
signetics linear package marking
MIL-STD-480
signetics military marking
|
2005 - 785e
Abstract: HCPL-7851 MIL-HDBK-217
Text: the system is not in operation. Note that if you are using MIL-HDBK- 217 for predicting component , comparing Table 2 to predictions using MIL-HDBK- 217 . Table 1. Demonstrated Operating Life Test , section of MIL-HDBK- 217 . Environmental Testing All high reliability hermetic optocouplers listed meet
|
Original
|
PDF
|
ACPL-785E
5962-9755701EPx
HCPL-7851,
5962-9755701HPx
MIL-PRF-38534.
Fail/109hr)
MIL-STD-883
5962-9755701HPx,
HCPL-7851
785e
MIL-HDBK-217
|
