2013  Not Available
Abstract: No abstract text available
Text: purpose of MILHDBK217 to provide a common basis for reliability prediction, MS Kennedy does not modify , the MILHDBK217 method, where base failure rates are imported from the software, and are not , rates were calculated based on the following formula from MILHDBK217 : Î»P = [Î£NCÎ»C](1 + .2ÏE) ÏF ÏQ ÏL Failures/106 hrs Given from MILHDBK217 : NC = Number of each particular component Î»C , assumptions for our standard voltage regulator product MTBF reports. Method I  MILHDBK217 / Windchill

Original

PDF

MILHDBK217F
MILHDBK217,
MILHDBK217
MILSTD756B,
AN001

1962  Hybrid Microcircuits 1976
Abstract: lm741 die LM741A LM106 MILHDBK217C MILHDBK217D MILHDBK217A MILHDBK217 GaAs wafer r7521
Text: .146 2.1 MILHDBK217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL.147 2.2 MILHDBK217 , .153 3.2 NOTES ON USING MILHDBK217 PREDICTION MODELS. 156 3.2.1 OUTLINE (REVISIONS TO MILHDBK217 ). 156 3.2.2 CAUTIONS FOR USE OF MILHDBK217. 157 , and quality level are also taken into account3)6). MILHDBK217 is the most commonly used prediction

Original

PDF

MILHDBK217
MILHDBK217F
R7648,
MILHDBK217B,
R757,
R7521,
R7622,
Hybrid Microcircuits 1976
lm741 die
LM741A
LM106
MILHDBK217C
MILHDBK217D
MILHDBK217A
GaAs wafer
r7521

MILHDBK217
Abstract: 500VDC
Text:  =500VDC  =500VDC 10+60 0+85 MTBF MILHDBK217 (25 , MILHDBK217 (25) *: 55 0.35W/ mm 1 +Vin 2 Vin 3 +Vout , 40+105 0 MTBF MILHDBK217 (25) 8*105h Guoyao Technologies

Original

PDF

260KHz
200mV
100mV
200us
500VDC
MILHDBK217
100000h
300KHz
500VDC

2006  hcpl 731
Abstract: Optocoupler 601 HCPL 601 MILHDBK217 Optocoupler 721 HCPL2300 optocoupler avago 601 optocoupler OPTOCOUPLER 436 MILSTD217 FIT
Text: using MILHDBK217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MILHDBK217. , carefully considered when comparing Table 2 to predictions using MILHDBK217. Table 1. Demonstrated , energy is used as in the hybrid section of MILHDBK217. Table 2. Reliability Projections (per , 3,650,155 5,721,351 9,224,902 11,848,531 99,888 115,803 217 ,325 305,248 436,731 637,480

Original

PDF

HCPL2300
59891824EN
AV010487EN
hcpl 731
Optocoupler 601
HCPL 601
MILHDBK217
Optocoupler 721
HCPL2300
optocoupler avago
601 optocoupler
OPTOCOUPLER 436
MILSTD217 FIT

2005  JESDB102
Abstract: AVAGO DIP JESDA102 JA113
Text: relationship, where a 0.43 eV activation energy is used as in the hybrid section of MILHDBK217. OTHER , necessary to adjust for the time when the system is not in operation. Note that if you are using MILHDBK217 , to different conditions and factors that have been accounted for in MILHDBK217. For example it is , carefully considered when comparing Table 2 to predictions using MILHDBK217. Application Information

Original

PDF

ACPLM71U,
ACPLM72U
JESDA110
15psig
JESDA102
JESDA103
AV023713EN
JESDB102
AVAGO DIP
JESDA102
JA113

signetics linear package marking
Abstract: MILSTD480 signetics military marking
Text: quality Levels Sand B of MILHDBK217 (jcq  0.25 for Class S, 1.0 for Class B). · 100% final electrical , conforms to quality level B1 of MILHDBK217 (JC q = 2.0). Standard M ilitary Drawing (SMD) DESC , standard product part num ber. This category of product conforms to Quality Level B1 of MILHDBK217 (no = , by MILSTD454, Requirement 64 and by MILHDBK217 , and are recommended for use in the most critical , product conforms to quality level D of MILHDBK217 (7 Iq = 10.0). workinprocess by customer). For

OCR Scan

PDF

MILSTD883,
MILM38510
signetics linear package marking
MILSTD480
signetics military marking

calculating rectifier circuits MTBF
Abstract: bimetal transformer mtbf MILHDBK217F CAPACITOR chip mtbf 217F MILHDBK217E ART2815T AN1078 MILHDBK217F
Text: .4 Changes to the model incorporated in Revision F of MILHDBK217 for estimation of hybrid failure rates , results that do not agree with those based on models presented in Revision E of MILHDBK217. To , model incorporated in Revision F of MILHDBK217 for estimation of hybrid failure rates result in a , results that do not agree with those based on models presented in Revision E of MILHDBK217. To , MILHDBK217F Notice 2 and using MILHDBK217E. In addition, calculations are presented including

Original

PDF

AN1078
calculating rectifier circuits MTBF
bimetal
transformer mtbf
MILHDBK217F
CAPACITOR chip mtbf
217F
MILHDBK217E
ART2815T
AN1078
MILHDBK217F

2006  MILHDBK217
Abstract: No abstract text available
Text: system is not in operation. Note that if you are using MILHDBK217 for predicting component reliability , that have been accounted for in MILHDBK217. For example it is unlikely that your application will , Table 2 to predictions using MILHDBK217. Definition of Failure Inability to switch, i.e. "functional , as in the hybrid section of MILHDBK217. Application Information The data of Table 1 and 2 were

Original

PDF

HCPL7601/7611
245oC
MILSTD883
1000hrs
121oC,
168hrs
59893533EN
MILHDBK217

2007  MILHDBK217
Abstract: HCPL 454
Text: using MILHDBK217 for predicting component reliability, the results may not be comparable to those given in Table 2 due to different conditions and factors that have been accounted for in MILHDBK217. , and duty cycle must be carefully considered when comparing Table 2 to predictions using MILHDBK217. , 0.43 eV activation energy is used as in the hybrid section of MILHDBK217. Application Information

Original

PDF

HCPL4200
specification009
59887900EN
MILHDBK217
HCPL 454

2006  AVAGO DIP
Abstract: 0133E MILSTD217 FIT
Text: to adjust for the time when the system is not in operation. Note that if you are using MILHDBK217 , to different conditions and factors that have been accounted for in MILHDBK217. For example it is , carefully considered when comparing Table 2 to predictions using MILHDBK217. Stress Test Condition Ta = , 0.43 eV activation energy is used as in the hybrid section of MILHDBK217. Table 3. Mechanical Tests

Original

PDF

HCNW138
HCNW139
MILSTD883
1000hrs
AV010133EN
AVAGO DIP
0133E
MILSTD217 FIT

2005  JA113
Abstract: JESDA103 JESDA102 JESDA103 avago MSL 1 optocoupler MTTF
Text: section of MILHDBK217. OTHER MANUFACTURERS' SIMILAR PART TYPES. Operating Life Test For valid , operation. Note that if you are using MILHDBK217 for predicting component reliability, the results may not , accounted for in MILHDBK217. For example it is unlikely that your application will exercise all available , using MILHDBK217. Application Information The data of Table 1 and 2 were obtained on devices with

Original

PDF

ACPLK49T
20kBd
JESDA110
96hrs
1000hrs
15psig
JESDA103
JESDA102
AV023187EN
JA113
JESDA103
JESDA102
JESDA103
avago MSL 1
optocoupler MTTF

2006  MILSTD217 FIT
Abstract: No abstract text available
Text: necessary to adjust for the time when the system is not in operation. Note that if you are using MILHDBK217 , to different conditions and factors that have been accounted for in MILHDBK217. For example it is , carefully considered when comparing Table 2 to predictions using MILHDBK217. Definition of Failure , 0.43 eV activation energy is used as in the hybrid section of MILHDBK217. Table 2. Reliability

Original

PDF

HCPL3140
MILSTD883
121oC
AV010659EN
MILSTD217 FIT

2005  785e
Abstract: HCPL7851 MILHDBK217
Text: the system is not in operation. Note that if you are using MILHDBK217 for predicting component , comparing Table 2 to predictions using MILHDBK217. Table 1. Demonstrated Operating Life Test , section of MILHDBK217. Environmental Testing All high reliability hermetic optocouplers listed meet

Original

PDF

ACPL785E
59629755701EPx
HCPL7851,
59629755701HPx
MILPRF38534.
Fail/109hr)
MILSTD883
59629755701HPx,
HCPL7851
785e
MILHDBK217

1998  quality assurance for semiconductor devices
Abstract: MILHDBK217 Semiconductor Devices mitsubishi packaging
Text: SEMICONDUCTOR DEVICES 1. INTRODUCTION 2. METHODS OF RELIABILITY PREDICTION 2.1 MILHDBK217 DISCRETE SEMICONDUCTOR DEVICE PREDICTION MODEL 2.2 MILHDBK217 MICROCIRCUIT PREDICTION MODEL 3. MILHDBK217F RELIABILITY PREDICTION 3.1 HYBRID MICROCIRCUIT FAILURE RATE PREDICTION 5) 3.2 NOTES ON USING MILHDBK217

Original

PDF



GYD0112RD12
Abstract: 12RD08 500VDC MILHDBK217 GYD0105RD05 GYD0105RD12 GYD0105RS03 GYD0105RS05 GYD0105RS08 GYD0112RS03
Text: =500VDC  =500VDC 70KHz 10 +60 30+85 MTBF 6W MILHDBK217 (25 , %) =25mS =20KHz MTBF 10+60 30+85 MILHDBK217 (25) 8×100000h

Original

PDF

GYD0105RS03
GYD0105RS05
GYD0105RS08
GYD0105RS12
GYD0105RD05
GYD0101RD08
GYD0105RD12
GYD0112RS03
GYD0112RS05
GYD0112RS08
GYD0112RD12
12RD08
500VDC
MILHDBK217
GYD0105RD05
GYD0105RD12
GYD0105RS03
GYD0105RS05
GYD0105RS08
GYD0112RS03

2013  PSC20
Abstract: No abstract text available
Text: : 40mA 120.4K HRS MILHDBK217 (25ËC) 131.3K HRS MILHDBK217 (25ËC) 23x90x99 mm (WxHxD) 0.14Kg/48 pcs./7.92Kg I/P 3 poles, O/P: 3 poles screw DIN terminal Free air convection 125.9K HRS MILHDBK217

Original

PDF

PSC20
E361935
E205412
8264V
UL1310
UL508
PSC2012
PSC2015
PSC2024

1998  TRNWT000332
Abstract: MILHDBK217F fixed film resistor circuit board mtbf MILHDBK217
Text: several different cases that define the various conditions. MILHDBK217 , Reliability Prediction of , of operating power to rated power. The values are found in lookup tables within MILHDBK217. The , benign environment. See Table 19. The part quality factor used as stated in MILHDBK217 is equal to , applicable during early design phase and during proposal formulation. MILHDBK217F For a Part Stress , PREDICTED RELIABILITY FOR PT3100/4100 SERIES Parameter FITs (Failures in 109 hours) 250 MILHDBK217F

Original

PDF

PT3100/4100
MILHDBK217F
48VDC
TRNWT000332
MILHDBK217F
fixed film resistor
circuit board mtbf
MILHDBK217

WS6536
Abstract: Signetics MILSTD480 signetics linear package marking At 513 WS6536
Text: its date of publication. These categories of product conform to quality Levels S and B of MILHDBK217 , MILHDBK217 (* q = 2.0). Standard Military Drawing (SMD) DESC selected item drawings (minispecs) were , of product conforms to Quality Level B1 of MILHDBK217 ( jc q = 2.0) JAN Qualified Products , MILHDBK217 , and are recommended for use in the most critical of applications such as manned space and

OCR Scan

PDF

MILSTD883,
MILM38510
WS6536
Signetics
MILSTD480
signetics linear package marking
At 513
WS6536

array resistor mtbf
Abstract: No abstract text available
Text: 80 120 MILHDBK217 Plus Parts Count; 25Â°C Ground Benign, 91.3 5.0 MHrs 2 RVCINT , MILHDBK217 Plus Parts Count; 25Â°C Ground Benign, MTBF A kÎ© MVTM36 Series Model Specific , 3.00 MHz Switching frequency Output ripple frequency 40 60 MILHDBK217 Plus Parts Count , , Indoors / Computer Profile VC internal resistor 40 % MILHDBK217 Plus Parts Count; 25Â , Switching frequency Output ripple frequency 20 30 MILHDBK217 Plus Parts Count; 25Â°C Ground Benign

Original

PDF

MVTM36
array resistor mtbf

2006  6N137
Abstract: MTTF test data
Text: system is not in operation. Note that if you are using MILHDBK217 for predicting component , when comparing Table 2 to predictions using MILHDBK217. Table 1. Demonstrated Operating Life Test , hybrid section of MILHDBK217. Table 2. Reliability Projections (per channel) for Devices Listed

Original

PDF

HCPL2601/2611,
HCPL2630/2631/4661
6N137
59882651EN
AV010495EN
6N137
MTTF test data

2006  2430 avago
Abstract: HCPL2400 HCPL2430
Text: system is not in operation. Note that if you are using MILHDBK217 for predicting component , when comparing Table 2 to predictions using MILHDBK217. Table 1. Demonstrated Operating Life Test , section of MILHDBK217. Application Information The data of Tables 1 and 2 were obtained on devices

Original

PDF

HCPL2400
HCPL2430
59884129EN
AV010497EN
2430 avago
HCPL2430

2007  optocoupler MTTF
Abstract: HCPL7851 avago, hcpl 817 59629755701HPX MTTF test data
Text: the system is not in operation. Note that if you are using MILHDBK217 for predicting component , comparing Table 2 to predictions using MILHDBK217. Table 1. Demonstrated Operating Life Test , relationship, where a 0.43 eV activation energy is used as in the hybrid section of MILHDBK217.

Original

PDF

59629755701HPX,
HCPL7851
MILPRF38534.
syste/109hr)
Fail/109hr)
MILSTD883
HCPL7851
59629755701HPX
AV020316EN
optocoupler MTTF
avago, hcpl 817
MTTF test data

MILHDBK217
Abstract: No abstract text available
Text: 9810A Rev. B NEL CRYSTAL CLOCK OSCILLATORS SJ/HJX8XX series clock oscillators Reliability Calculations Based on MILHDBK217 F 1 . .01 2.2 jc 1 . .0035 .15 1 . .025 .64 1 . .025 .64 Silicon,epoxy,alumina,and alumina ( 0.05.0.05) jc = 42.402 junction to case thermal resistance Pd 0.450 power disapation in watts Tc 70 case temperature in °C Tj Tc ( jc .Pd , /HJX8XX series clock oscillators Reliability Calculations Based on MILHDBK217 F Continued: Quality

Original

PDF

MILHDBK217

PWR700A
Abstract: PWR700A/H PWR700A/T
Text: predicted MTTF of 1,371,486 hours (per MILHDBK217 Rev. E, circuitstress analysis method, +25°C, ground , predicted MTTF calcula tions per MILHDBK217 Rev. E, circuitstress analysis method. Some manufacturers

OCR Scan

PDF

MILI45208A,
PWR700A
MILHDBK217
PWR700A
PWR700A/H
PWR700A/T

2000  Not Available
Abstract: No abstract text available
Text: Komponenten (vereinfachtes Modell nach der Norm MILHDBK217 ). Nach einer Periode von Frühausfällen wird eine , Burnin. Das MILHDBK217 (eine Sammlung mit Angaben zu Ausfallraten, erstellt durch die US Army) nimmt , Stromversorgungen von PowerOne gemäss MILHDBK217 sind in den entsprechenden Datenblättern unter Beständigkeit , Technische Informationen Umgebungsbedingungen Umweltbedingungen gemäss MILHDBK 217 Ground, Benign: An

Original

PDF

