The Datasheet Archive

Top Results (6)

Part Manufacturer Description Datasheet Download Buy Part
RH137KDICE Linear Technology IC VREG ADJUSTABLE NEGATIVE REGULATOR, UUC3, DIE-3, Adjustable Negative Single Output Standard Regulator
RH137HDICE Linear Technology IC VREG ADJUSTABLE NEGATIVE REGULATOR, UUC3, DIE-3, Adjustable Negative Single Output Standard Regulator
LT1584 Linear Technology IC VREG FIXED POSITIVE REGULATOR, Fixed Positive Single Output Standard Regulator
LT1580 Linear Technology IC VREG FIXED POSITIVE REGULATOR, Fixed Positive Single Output Standard Regulator
LT1005CT-5 Linear Technology IC VREG 5 V FIXED POSITIVE REGULATOR, PSFM, Fixed Positive Single Output Standard Regulator
LM317HVH Linear Technology IC VREG 1.2 V-57 V ADJUSTABLE POSITIVE REGULATOR, MBCY3, TO-39, 3 PIN, Adjustable Positive Single Output Standard Regulator

M1L-STD-883 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
DS146

Abstract: Saronix xtal Oscillator
Text: id e - ±5% to 27 MHz, ±10% > 27 MHz @ 1.4V 10ns max 0.5V max 2.5V min 5 MTTL M1L-STD-883 , M IL-STD - 883 , M1L-STD-202, M IL-STD - 883 , M IL-STD -202, M ethod M ethod M ethod M ethod M ethod , , C ondition B M IL-STD - 883 , M IL-STD - 883 , <5 x 10'8 ATM M IL-STD - 883 , M IL-STD - 883 , M ethod


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PDF S1227 127-Type 14-pin DS-146 DS146 Saronix xtal Oscillator
Crystal oscillator S1100

Abstract: S1100
Text: MHz 2 TTL Gates over 80 MHz M1L-STD-883 , Method 2002, Condition B M IL-STD- 883 , Method 2003 M IL-STD-202, Method 211, Conditions A and C M IL-STD- 883 , Method 2007, Condition A M IL-STD-202, Method 215 M IL-STD-202, Method 210, Condition B M IL-STD- 883 , Method 1014, Condition C M IL-STD- 883 , Method 1014, Condition A2, <5 x 10`® ATM cc/sec M IL-STD- 883 , Method 1011, Condition A M IL-STD- 883 , Metod 1004 Maximum over


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PDF M1L-STD-883, IL-STD-883, IL-STD-202, DS-117 Crystal oscillator S1100 S1100
Saronix 48 MHz crystal

Abstract: No abstract text available
Text: esistance to Soldering Heat: M IL-STD - 883 , M1L-STD-883 , M IL-STD - 883 , M IL-STD -202, M ethod M ethod M , Test: Fine Leak Test: Therm al Shock: Hum idity: M IL-STD - 883 , M ethod 1014, C ondition C M IL-STD - 883 , M ethod 1014, C ondition A2 < 2 x 10 '8 ATM cc / sec M IL-STD - 883 , M ethod 1011, C ondition A M


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PDF S1603 S1603 DS-101 flGQ33Ec 000Q15Ö Saronix 48 MHz crystal
Saronix nct

Abstract: XTAL OSC 40.000 mhz Saronix XTAL OSC NCT SARONIX
Text: Strength: Vibration: Solvent Resistance: Resistance to Soldering Heat: M IL-STD- 883 , M1L-STD-883 , M IL-STD-202, M IL-STD- 883 , M IL-STD-202, M ethod Method M ethod Method M ethod 2002, Condition B 2003 211 , oisture Resistance: M IL-STD- 883 , M ethod M IL-STD- 883 , M ethod <5 x 10"8 ATM cc/sec M IL-STD- 883 , M ethod M IL-STD- 883 , Method 1014, Condition C 1014, Condition A 1011, Condition A 1004 Output Waveform


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PDF 14-pin hermetic010% DS-129 Saronix nct XTAL OSC 40.000 mhz Saronix XTAL OSC NCT SARONIX
BT459

Abstract: BT451
Text: Brocktree® Contents Bt450 Bt453 Bt453/ 883 Bt454 8 0 ,6 6 , 50, 35 MHz T riple 4-bit RAM DAC with 16 x 12 RAM 66, 40 M Hz Triple 8-bil RAM DAC with 256 x 24 RAM 40 MHz M1L-STD-883 Version o f Bt453 170, 135, 110 MHz T riple 4-bit RAM DAC with 16 x 12 RAM , 4:1 M ultiplexed Pixel Inputs 170, 135, 110 , , 80 MHz T riple 8-bit RAM DAC with 256 x 24 RAM , 4:1 or 5:1 M ultiplexed Pixel Inputs 110 MHz MIL-STD- 883 Version o f Bt458 4-23 B1 4 5 7 4-23 Bt458 4-23 Bt458/ 883 4 - 111 Bt459 Bt459 F a


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PDF Bt450 Bt453 Bt453/883 Bt454 M1L-STD-883 Bt477 Bt479 BT459 BT451
similar of AD534

Abstract: "Analog Multiplier" AD534 M1L-STD-883 AD534SH/883B HIGH accurate ANALOG MULTIPLIER ad534 application analog multiplier
Text: M1L-STD-883 , method 5005, Class B are performed on each inspection lot. Groups C and D inspections of , consists of the test subgroups and LTPD values shown in M1L-STD-883 , method 5005, and as specified in Table , AND RELIABLE MONOLITHIC CONSTRUCTION • MIL-STD- 883 COMPLIANT DESCRIPTION The AD534 883B is a high , feedback resistors. The AD534/ 883B is manufactured in full compliance with the requirements of MIL-STD- 883 , Product Designator Requirements /883B Standard model plus 100% MIL-STD- 883 Class B screening, with 5


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PDF AD534/883B AD534TD/883B AD534TH/883B AD534SD/883B AD534SH/883B 10MHz MIL-STD-883 AD534 O-100 15VDC similar of AD534 "Analog Multiplier" M1L-STD-883 AD534SH/883B HIGH accurate ANALOG MULTIPLIER ad534 application analog multiplier
Not Available

Abstract: No abstract text available
Text: contact your local G P S sales office for information. 11 Stage' operation M1L-STD-883 C la ss B Method 5004® G P S Hi-rei B (References are to MfL-STD- 883 ) Internal Visual Method 2010 Test , Semiconductors (G PS) have the following factory approvals: AQAP1 BS9450 (Capabilily Approval) MIL-STD- 883 C la ss B (In conformance with the requirements of MIL-STD- 883 , paragraph 1.2.1) D E S C (Department , lass S Group A Group B Group C Group D Table I 1. M IL-STD- 883 C lass S/ESA SC C 900C G P S


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PDF 160Hrs
Not Available

Abstract: No abstract text available
Text: y . h > ( ' l ' H- u ! . u w ^ i p ! i p u w B ] m i.iw in y ì FEATURES This custom -m ade tapped m egohm re sisto r chip extends th e resistan ce values tange to 10 M fl while maintaining a relatively small size. T h ese chips are m anufactured using state-of-the-art thin-film techn iqu es, are 100% electrically tested and visually inspected to M1L-STD-883. · Values to 10 , % visually inspected parts, per M IL-STD - 883 X for sam ple, visually inspected loaded in m atrix trays (4


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PDF M1L-STD-883.
AMP03

Abstract: No abstract text available
Text: Requirements for Class B Devices M1L-STD-883 Test Requirements Subgroups (See Table 1) Interim , : Device Part Num ber Package -1 AMP-03BJ/ 883 J 1.2.3 Case Outline. L etter Case , 4.2.1 Life Test/Bum-In Circuit. Steady state life test is per MIL-STD- 883 Method 1005. Bum-in is per MIL-STD- 883 Method 1015 test condition (C). +1SV REV. A INSTRUMENTATION AMPLIFIERS 10-39


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PDF AMP-03 AMP-03BJ/883 MIL-M-38510) MIL-STD-883 AMP03
Not Available

Abstract: No abstract text available
Text: perfor­ m ance. C om plem entary outputs are available.* M echanical: M IL-STD - 883 , M1L-STD-883 , M IL-STD -202, M IL-STD - 883 , M IL-STD -202, Shock: Solderability: Term inal Strength: V , Leak Test: M IL-STD - 883 , M IL-STD - 883 , <5 x 10'8 ATM M IL-STD - 883 , M IL-STD- 883 , Thermal


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PDF S1150
DS-102

Abstract: MMBD7000 40782 sta08
Text: Soldering Heat MIL-STD- 883 , Method 2002, Condition B MIL-STD- 883 , Method 2003 MIL-STD-202, Method 211, Conditions A and C MIL-STD- 883 , Method 2007, Condition A MIL-STD-202, Method 215 MIL-STD-202, Method 210, Condition B Output Waveform Environmental: Thermal Shock: Moisture Resistance: MIL-STD- 883 , Method 1011, Condition A M1L-STD-883 , Method 1004 CMOS Tr Tl SYMMETRY SYMMETRY DS-102 REV A February 1994 SaRoniX


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PDF S0-J-20 DS-102 MMBD7000 40782 sta08
1NA110

Abstract: marking 1be INA110AD AZK734 INA110 1na1 OA 95
Text: Option - /LAT - Lot Acceptance Testing (A grade only) -B - M1L-STD-883 , Method 5008, Class B Compliant (M grade only) -S - MIL-STD- 883 , Method 5008, Class S Compliant (M grade only) Ul Q Burr-Brown , INAI10AD dice are visually inspected to Mil-STD- 883 , Method 2010, Test Condition B (AD, AD/LAT, SD, and MD-B) or Condition A(MD-S). INA110MD-S wafer lots are visually inspected to MIL-STD- 883 , Method 2018


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PDF INA110 INA110 M1L-STD-883, MIL-STD-883, 1NA110 marking 1be INA110AD AZK734 1na1 OA 95
Not Available

Abstract: No abstract text available
Text: ) and 32-pin SOIC. · Military product is fully com pliant to M1L-STD-883 , Class B ADVANCE INFORMATION , is manufactured in compliance with the latest revision of MIL-STD- 883 , Class B, making It ideally


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PDF IDT71259S IDT71259L 32-pin M1L-STD-883, IDT71259 912-bit DSC-7044/- 32KxB
A19T

Abstract: transistor marking A19 a19 t
Text: t» MICRON TECHNOLOGY INC 17E D blllSMI QDG1Ö70 T I ADVANCE MICRON UCW*XCf.Y MC MT5C1001 883C MILITARY SRAM FEATURES · ·' · · · · · · High speed: 25,30,35,45 and 55ns Automatic chip enable power down All inputs and outputs are TTL compatible High performance, low power, CMOS process Single +5V (±10%) power supply Low power, ICC (max.) 70mÀ M1L-STD-883 Rev, C, Class B RAD-tolerant ( consult factory) 1MEG X 1 SRAM %-ii OS PIN ASSIGNMENT (Top View) 28L/400 DIP FAST SRAM OPTIONS


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PDF MT5C1001 M1L-STD-883 28L/400 A19T transistor marking A19 a19 t
Not Available

Abstract: No abstract text available
Text: -In Circuit. Steady state life test is per M1L-STD-883 Method 1005. Burn-in is per MIL-STD- 883 Method


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PDF AD2700/AD2701/AD2702 AD2700SD/883B AD2700UD/883B AD2701SD/883B AD2701UD/883B AD2702SD/883B AD2702UD/883B ADI-H-1000: DH-14C. AD2701
hos-100

Abstract: No abstract text available
Text: % processing to M1L-STD-883 per M ethod 5008. Figure 4. Mechanical Dimensions TO-8 Metal Can. Dimensions , IL-STD- 883 Processing Available Wide Bandwidth, High Speed Buffer Amplifiers APPLICATIONS Current , -55°C to +125°C (case). Further, the HOS-IOOSH may be processed to the requirements of MIL-STD- 883 . The , / 883 calculated using MIL H andbook 217. G round: I'ixed, T em perature (case) = 70°C. Specifications , INFORMATION Model HOS-lOOAll HOS-IOOSH HOS-lOOSH/ 883 T em perature Range Price $ 1-9, (100s) -25 C to +85


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PDF 125MHz 500V//US IL-STD-883 125MHz, 250mA HOS-lOOSH/883 M1L-STD-883 hos-100
Burr Brown 3500

Abstract: MIL-STD-883A C4AK d0117 CI 4001 Burr Brown part marking ISTD-883 3500 burn brown J500
Text: microcircuit without full or partial requalification. 3.9 Screening. Screening is in accordance with M1L-STD-883 , LTPD values shown in M1L-STD-883 , method 5005, and as follows: a. end point electrical parameters are , "built-in" quality. Each device is 100% internally visually inspected per MIL-STD- 883 method 2010 and after the cap is welded on, the balance of the MIL-STD- 883 method 5004 class B screening is completed. They , inspection lot and groups C and D inspections as required by MIL-STD- 883 . A report containing the most recent


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PDF J17313LS T-79-06-10 3500/883B 3500R/MIL 3500R/883B 3500U/883B 20ajV/Â 20VDC 17313bS DDI1701 Burr Brown 3500 MIL-STD-883A C4AK d0117 CI 4001 Burr Brown part marking ISTD-883 3500 burn brown J500
MArking 3A5

Abstract: No abstract text available
Text: cycle · M1L-STD-883 Rev. C, Class B 1MEG X 4 DRAM FAST PAGE MODE PIN ASSIGNMENT (Top View) 20L


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PDF MT4C4001 175mW M1L-STD-883 20L/400DIP MArking 3A5
a9ah

Abstract: No abstract text available
Text: MICRON TECHNOL OGY INC 17E D biiisMT Gooiaaa i ADVANCE M IC R O N JEOVWtOf.Y INC MT5C1008 883C MILITARY SRAM FEATURES · « · · · · · · High speed: 25,30,35,45, and 55ns. Automatic chip enable power down All inputs and outputs are TTL compatible High performance, low power, CMOS process Single +5V (±10%) power supply Low power, ICC (max.) 70mA M1L-STD-883 Rev. C, Class B RAD tolerant (consult factory) 128Kx 8 SRAM _ T - % - Z 3 "I 4 ; P IN A S S IG N M E N T (T o p V


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PDF MT5C1008 M1L-STD-883 128Kx a9ah
Not Available

Abstract: No abstract text available
Text: ULTRA-BROADBAND DROP-IN REMOVABLE CONNECTORS SPST DIODE SWITCH REFLECTIVE WITH DRIVER GENERAL INFORMATION: The Model SWM-1100-1 SPST PIN Diode switch operates over the full frequency range 0.25-18.0 GHz in a single unit. KDl/Triangle has integrated microstrip soft substrate with thick film hybrid dri vers, which are designed and fabricated "in-house." The housing is epoxy sealed to meet the gross leak requirements of M1L-STD-883. SMA connectors are removable. MODEL SWM-1 1OO-1 0.25-18.0 GHz GENERAL


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PDF SWM-1100-1 M1L-STD-883. SWM-1100-1
54ACS34

Abstract: qml-38535 54ACS
Text: M1L-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management , conformance inspection. For device class M, screening shall be in accordance with method 5004 of M1L-STD-883 , requirements documentation Vendor self-certification to the requirements for NIL-STD- 883 compliant, non-JAN , criteria for device class M. a. Burn-in test, method 1015 of MIL-STD- 883 . (1) Test conditi on A, B, C or D , , as applicable, in accordance with the intent specified in test method 1015 of MIL-STD- 883 . b. Interim


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PDF 5962-E321-96 MIL-HDBK-103. MIL-HDBK-103 54ACS34 qml-38535 54ACS
vqe 14 display

Abstract: rkm 21 va12s rkm, device marking rkm 24 MARKING rkm C5T MARKING DAC87 DAC870U DAC870UL
Text: specified in Table II. b. Burn-in test ( M1L-STD-883. method 1015) conditions: (1) Test condition D (2 , electrical test in accordance with M1L-STD-883 , method 5004, and with no intervening electrical measurements , guaranteeing monotonicity from —55°C to +125° C. • MIL-STO- 883 SCREENING • DAC87 PIN-COMPATIBLE â , MIL-STD- 883 . See paragraph 1.2.2 for more details. Each device is manufactured in a Hi-Rel environment , Standard model plus 100% MIL-STD- 883 class B screening, with 5% PDA, plus quality conformance inspection


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PDF DAC870/883B DAC870V/883B DAC870U/883B DAC870VL/883B DAC870UL/883B DAC870V DAC870U DAC870VL DAC870UL 12-Bit vqe 14 display rkm 21 va12s rkm, device marking rkm 24 MARKING rkm C5T MARKING DAC87 DAC870U DAC870UL
Not Available

Abstract: No abstract text available
Text: , C l = 50 pF, RL = 499 il. NOTE: 1. Method 3011 of M1L-STD-883 shall be used, except the output


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PDF 54ALS08 MPG54ALS08 54ALS08/BXAJC M1L-STD-883
Not Available

Abstract: No abstract text available
Text: REQUIREMENTS M1L-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLES 1 AND 2) 1 Interim Electrical , HA-5177/ 883 Í H R I H A RS S E M I C O N D U C T O R Ultra Low Offset Voltage Operational , Conformant Under the Provisions of Paragraph 1.2.1. The HA-5177/ 883 is a monolithic, all bipolar , ­ width (2MHz) and high speed (0.5V/|is min) and is an improved version of the HA-5135/ 883 . • Low , . OPERATIONAL AMPLIFIERS • The HA-5177/ 883 uses advanced matching techniques and laser trimming to


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PDF HA-5177/883 MIL-STD883 HA-5177/883 HA-5135/883. M3Q2271 483jim 04A/cm2
qml-38535

Abstract: 54ABT646
Text: Continued. Test and M1L-STD-883 test 1 1 Symbol 1 Test conditions 2/ -55°C s T £ +125°C 4.5 V s Vcc s 5.5 , 10,11 j 1 1 I 1.2 j 1 6.7 1/ For tests not listed in the referenced M1L-STD-883 (e.g. Alcc), utilize , inspection. Quality conformance inspection for device class M shall be in accordance with M1L-STD-883 (see , microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD- 883 , "Provisions for the use of MIL-STD- 883 in conjunction with compliant non-JAN devices". When available, a choice of


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PDF 5962-E185-94 QML-38535. QML-38535 MIL-BUL-103. MIL-BUL-103 1DD470Ã 54ABT646
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