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2011 - JESD22

Abstract: No abstract text available
Text: QUALIFICATION RESULTS: Test # Reference AC A3 JESD22 A02 Test # Reference TC A4 JESD22 A104 Test # Reference HTSL A6 JESD22 A103 Test Conditions Autoclave , ) HTOL B1 JESD22 A108 High Temp Operating Life (Test@Room/Hot/ Cold) 408 hrs;@ 105Â , GROUP E QUALIFICATION RESULTS: Test # Reference Test Conditions HBM E1 JESD22 A114 , #18-1185 +500V 1/6 AM AEC Q100 GROUP E QUALIFICATION RESULTS: (cont.) MM E2 JESD22 A115


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PDF KSZ8842PMBL KSZ8842PMQL JESD22 121C/100% -50C/ KSZ8842PMBL GFS0028 JESD22
Sumitomo 6730B

Abstract: JESD22-A114 transistor A114 XR5488EID-F JESD22-78 100PF A114 JESD22 07eV
Text: TEST (HBM) JESD22 A114 1500 OHM, 100PF +/-2000V +/-15000V 0/3 0/3 Passed Passed (note 1) Latch-up Test JESD22 78- STATIC +/- 200mA or 2X Vcc @ 25C As required 0/6 , ) JESD22 A114 1500 OHM, 100PF +/-2000V +/-15000V 0/3 0/3 Passed Passed (note 1) LATCH-UP TEST JESD22 78- STATIC +/- 200mA or 2X Vcc @ 25C As required 0/6 Passed ESD TEST , Passed TEMPERATURE CYCLING JESD22 A104 500 Cyc 1000 Cyc 0/25 0/25 Passed Passed


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PDF XR5486EID-F XR5488EID-F XR5486EID-F 14Lds epi-5X-sc12 /-8000V* /-15000V* Mil-Std-883 JESD22 Sumitomo 6730B JESD22-A114 transistor A114 XR5488EID-F JESD22-78 100PF A114 JESD22 07eV
2013 - Not Available

Abstract: No abstract text available
Text: Conditions HTOL B1 JESD22 A108 High Temp Operating Life (Test@Room/Hot +105C and Cold -40C , HAST A2 JESD22A110 Highly Accelerated Stress Test 130C/ 85% R.H (Test@Room/Hot +105C) Test # Reference Test Conditions AC A3 JESD22 A02 Test # Reference TC A4 JESD22 A104 Test # Reference Autoclave 121C/100% RH (Test@Room) Test , WBP C2 Mil-STD883 Method 2011 Wire Bond Pull SD C3 JESD22 B102 Solderability


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PDF KSZ8864RMN/RMNI/RMNU KSZ8864RMNU JESD22 AEC-Q100008 AEC-Q100002 AEC-Q100001 Mil-STD883
2006 - MacAdam

Abstract: CLD-AP06 MacAdam LED JESD22 A108-C MacAdam 5 step
Text: ) JESD22 A108-C : · · · 1 : · 2 · 2 : 45°C : : 1008 : > 200 mV ­ InGaN LEDs ­ AlInGaP LEDs 4 3 · · 6 5 (HTOL) JESD22 A108-C : · · · 1 : · 2 · 2 : 85°C : : 1008 : > 200 mV ­ InGaN LEDs ­ AlInGaP LEDs 4 3 · · 6 5 (WHTOL) JESD22 A101-B , LEDs ­ AlInGaP LEDs 4 3 · · 6 5 (LTOL) JESD22 A108-C : > 15% : > 25% : > 10 µA , ) WHTOL · JEDCE - - MIL-STD-202G 107G JESD22 B104-C B : · ·


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PDF CIE1931 CLD-AP06 MacAdam MacAdam LED JESD22 A108-C MacAdam 5 step
2014 - Not Available

Abstract: No abstract text available
Text: NO. HTOL High Temperature Operating Life Test JESD22-A108 TJ = 140 C, Vcc TEST DESCRIPTION METHOD/ CONDITIONS PART NO. JESD22 A114 KSZ8864RMNU ESD-HBM Electrostatic Discharge, Human Body Model KSZ8864RMNU (DONGBU 0.11um) TA = + 25°C ESD-MM JESD-22 , DESCRIPTION METHOD/ CONDITIONS JESD22- A110, 130C/ 85% R.H, w/bias HAST Highly Accelerated Stress , 0/3 TA = +25C (DONGBU 0.11um) + 150V 0/3 + 200V 0/3 + 500V 0/3 JESD-22


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PDF KSZ8864CNXCA/CNXIA/RMNU KSZ8864RMNU 37x10E7 M129V051MNF JESD22-A108 JESD22 Delta65ï M1010
JESD22

Abstract: W3H32M72E-XSBX A104 A108 A113
Text: 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp. Range 125°C -55°C to


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PDF W3H32M72E-XSBX W3H32M72E-XSBX Sn63/Pb37 EIA/JESD22 200A00004-45) AN0044 JESD22 A104 A108 A113
2014 - KSZ8895MQXCA

Abstract: KSZ8895 mtbf
Text: 0.11um) M129V0511MNA 0/77 0/77 HTOL High Temperature Operating Life Test JESD22-A108 , / CONDITIONS PART NO. HAST JESD22- A110, KSZ8895MQXCA Highly Accelerated Stress Test 130C , JESD22 A114 KSZ8895MQXCA + 500V 0/3 + 1000V 0/3 + 1500V 0/3 + 2000V 0/3 + , Body Model JESD-22 ESD-MM KSZ8895MQXCA Method A115 Electrostatic Discharge, Machine Model TA = +25C JESD-22 ESD-CDM Electrostatic Discharge, Charged Device Model Latch-up


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PDF KSZ8895FQXCA/FQXIA KSZ8895MQXCA/MQXIA KSZ8895RQXCA/RQXIA KSZ8895MQXCA 37x10E7 KSZ8895 M129V0511MNA JESD22-A108 JESD22 KSZ8895MQXCA KSZ8895 mtbf
2012 - Not Available

Abstract: No abstract text available
Text: : Reference Test Conditions B1 JESD22 A108 High Temp Operating Life (ATE Test @Room/Hot +95C , °C HAST # A2 Reference JESD22A110 Test Conditions Highly Accelerated Stress Test 130C , 0 D/C QTY 96 HRS rejects DEVICE LOT ID. # Reference AC A3 JESD22 A02 Test # Reference TC A4 JESD22 A104 FORM #18-1185 REV: J Test Conditions , wires SD C3 JESD22 B102 Solderability KSZ8873MLL AM M111W471MEA 1117 KSZ8873MLL


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PDF KSZ885116MLL/MLLI/MLLU KSZ8851-16MLLU CEL9200HF JESD22 AEC-Q100008 AEC-Q100002 Mil-STD883 M111W471MEA
JESD22

Abstract: SN63 PB37 A104 A108 A113 W332M64V-XSBX
Text: 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/ JESD22 Method A113 (level 3) EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp. Range 125


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PDF W332M64V-XSBX W332M64V-XSBX Sn63/Pb37 EIA/JESD22 200A00004-X) AN0045 W223M64V-XSBX JESD22 SN63 PB37 A104 A108 A113
A104

Abstract: A108 A113 W332M64V-XBX W332M72V-XBX W3E32M64S-XBX W3E32M72S-XBX Qual 0004x
Text: Reliability Report 200 A 0004-X January 2005 Rev. 0 Reference Standards Temp. Range EIA/ JESD22 Method A113 (level 3) EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition C EIA/ JESD22 Method 101


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PDF W332M64V-XBX W332M72V-XBX W3E32M64S-XBX W3E32M72S-XBX 256MB Sn63/Pb37 762mm 0004-X EIA/JESD22 A104 A108 A113 W332M64V-XBX W332M72V-XBX W3E32M64S-XBX W3E32M72S-XBX Qual 0004x
Qual

Abstract: A104 A108 A113
Text: . 1000 cycles 15 1000 hrs. Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp. Range 125°C -55°C to +125°C


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PDF W3E64M72S-XSBX W3E64M72S-XSBX Sn63/Pb37 762mm EIA/JESD22 Qual A104 A108 A113
A104

Abstract: A108 A113 WEDPS512K32V-XBX WEDPS512K32-XBX
Text: °C 15 Pass 15 1000 cycles EIA/ JESD22 Method A104 Condition C -55°C to +125°C 15 Pass 15 1000 hrs. EIA/ JESD22 Method 101 EIA/ JESD22 Method A113 Results Pass EIA/ JESD22


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PDF WEDPS512K32-XBX WEDPS512K32V-XBX 835mm EIA/JESD22 A104 A108 A113 WEDPS512K32V-XBX WEDPS512K32-XBX
Sn63

Abstract: A104 A108 A113 WEDPN4M64V-XBX WEDPN4M72V-XB2X
Text: 1000 hrs. 1000 cycles 15 45 Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition C 1000 cycles 1000 hrs. Temp. Range 125°C -55°C to +125°C -65°C to +150°C EIA/ JESD22 Method 101 1 Results Pass 15 Pass 21 Pass 15 Pass 45 Pass


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PDF WEDPN4M72V-XB2X WEDPN4M64V-XBX Sn63/Pb37 762mm EIA/JESD22 Sn63 A104 A108 A113 WEDPN4M64V-XBX WEDPN4M72V-XB2X
2008 - A108-C

Abstract: MacAdam 4 step MacAdam JESD22 cree led mce mc-e B104-C
Text: Device Engineering Council) (RTOL) (HTOL) JESD22 A108-C JESD22 A108-C · , · 2 · 3 (WHTOL) (LTOL) JESD22 A108-C · · · 1 : · 2 · 2 · 3 , 200 JESD22 B104-C B · : 1500 G · : 0.5 ms · : 6 5 30 1 : · LED JESD22 A107-B B · · · 1 : · LED : 35°C : 30 g/m2 : 48 : 1. LED LED


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PDF 350mA 6500K 3500K CLD-AP23 A108-C MacAdam 4 step MacAdam JESD22 cree led mce mc-e B104-C
JESD22

Abstract: A104 A108 A113 W3H32M64E-XSBX
Text: 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp. Range 125°C -55°C to


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PDF W3H32M64E-XSBX W3H32M64E-XSBX Sn63/Pb37 EIA/JESD22 200A00004-46) AN0019 JESD22 A104 A108 A113
JESD22

Abstract: A104 A108 A113 W72M64V-XBX
Text: hrs. ( Per Reliability Report 200 A 0004-19 January 2004 Rev. 0 EIA/ JESD22 Method A113 (level 3) EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp


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PDF W72M64V-XBX Sn63/Pb37 762mm EIA/JESD22 C/85RH JESD22 A104 A108 A113 W72M64V-XBX
Shipping Trays

Abstract: A104 A108 A113 W72M64VK-XBX
Text: . Reference Standards EIA/ JESD22 Method A113 (level 3) EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp. Range 125°C -55°C to +125°C Results Pass 15 Pass 15 Pass


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PDF W72M64VK-XBX W72M64VK-XBX Sn63/Pb37 762mm EIA/JESD22 C/85RH Shipping Trays A104 A108 A113
JESD22

Abstract: A104 A108 A113 WEDPN8M64V-XB2X WEDPN8M72V-XB2X
Text: Samples 15 21 Duration 1000 hrs. 1000 cycles 15 45 Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition C 1000 cycles 1000 hrs. EIA/ JESD22 Method 101 1 Temp. Range 125°C -55°C to +125°C Results Pass 15 Pass 21 Pass -65°C


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PDF WEDPN8M72V-XB2X WEDPN8M64V-XB2X Sn63/Pb37 762mm EIA/JESD22 JESD22 A104 A108 A113 WEDPN8M64V-XB2X WEDPN8M72V-XB2X
A104

Abstract: A108 A113 W3E64M16S-XSBX
Text: 1000 hrs. 1000 cycles 15 1000 hrs. Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 Temp. Range 125°C -55°C to


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PDF W3E64M16S-XSBX W3E64M16S-XSBX Sn63/Pb37 EIA/JESD22 200A00004-42) AN0022 A104 A108 A113
ky 202

Abstract: jesd22-a103b A104B A103B JESD22-A101-B SN63 JESD22 A101B 213B MMIC VCO
Text: Biased, 1000hrs at Tj=150°C Wet High Temp Storage5 JESD22-A101b Unbiased, 85°C / 85% RH , (Au) evaluation board 10 Pass Burn-in (85°C,96hrs) JESD22 A103B1, Condition A, except 85 , +150°C, 30 Cycles) JESD22 A104B Condition C 10 Humidity & Temperature (85°C and 85%RH, 1000hrs) JESD22 A101B, except unbiased 10 Pass 7 Pass Results Random Vibration3 (X,Y , Test Standard Sample Size Aging JESD22 A103B 500hrs at 85°C 10 Resistance to Solder


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PDF 30minute 500hrs 1000hrs JESD22-A101b 1000hrs ky 202 jesd22-a103b A104B A103B JESD22-A101-B SN63 JESD22 A101B 213B MMIC VCO
EIA/JESD22

Abstract: A104 A108 A113 W764M32V-XSBX
Text: Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition B EIA/ JESD22 Method 101 1 Temp. Range 125°C -55°C to +125°C Results Pass 15 Pass 15 Pass


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PDF W764M32V-XSBX W764M32V-XSBX Sn63/Pb37 AN0021 EIA/JESD22 A104 A108 A113
2011 - TSMC 0.35Um

Abstract: No abstract text available
Text: COMMENTS With Preconditioning 3X Reflow JESD22-103 TEST DESCRIPTION TEMP CYCLE With , DATE CODE 1000H PACKATGE COMMENTS JESD22-A104 METHOD/ CONDITIONS TEST DESCRIPTION Humidity Bias Life Test With Preconditioning JESD22-101 Ta = +85°C/ 85%RH Reflow JESD22-101 FORM #18-1185 COMMENTS 15 PSIG JESD22-102 3X PACKATGE REV: J PAGE 2 OF 2 PART , / CONDITIONS PART NO. MIL-STD 883 MIC3003 Method 3015 TA = + 25°C JESD-22 , A115 ESD-MM


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PDF MIC3003GFL MIC3003GML MIC3003GFL 1000H GC68500 CV6209 JESD22-103 1000cyc TSMC 0.35Um
JESD22

Abstract: Sn46 PB46 7410E A104 A108 A113 WED3C7410E16M-400BX
Text: /85 Bias 15 pcs 1000 hrs. Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition C EIA/ JESD22 Method 101 Temp. Range Results Pass


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PDF WED3C7410E16M-400BX 7410E Sn46/Pb46/Bi8 835mm EIA/JESD22 200A0004-18 JESD22 Sn46 PB46 A104 A108 A113 WED3C7410E16M-400BX
JESD22

Abstract: A104 A108 A113 W364M72V-XSBX
Text: Duration 1000 hrs. 1000 cycles 15 Reference Standards EIA/ JESD22 Method A113 EIA/ JESD22 Method A108 EIA/ JESD22 Method A104 Condition C EIA/ JESD22 Method 101 1000 hrs. Temp. Range 125


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PDF W364M72V-XSBX Sn63/Pb37 762mm EIA/JESD22 JESD22 A104 A108 A113 W364M72V-XSBX
2011 - A108-C

Abstract: No abstract text available
Text: LED X10490 Technical Data Sheet 5. Reliability Stress Reference Specification JESD22 A-104 Test , Damage 0 Thermal Shock Temperature Cycling JESD22 A-104 1000 Cycle 0 Power and , ESD Characterization Vibration Variable Frequency Mechanical Shock JESD22 A-105 1000 Cycle 0 JESD22 A-108C 1000 hours 0 - Ta= 25° C, If = 350 mA 1000 hours 0 JESD22 A-108C Ta= 100° C, If = 350 mA 1000 hours 0 JESD22 A-101 85° C/85% RH, If = 350 mA 1000 hours 0


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PDF X10490 SPA08F0E A108-C
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