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Part Manufacturer Description Datasheet Download Buy Part
HFA1130IBZ-T Intersil Corporation 850MHz, Output Limiting, Low Distortion Current Feedback Operational Amplifier; SOIC8; Temp Range: -40° to 85°C
HFA1130IBZ Intersil Corporation 850MHz, Output Limiting, Low Distortion Current Feedback Operational Amplifier; SOIC8; Temp Range: -40° to 85°C
HFA1135IBZ96 Intersil Corporation 360MHz, Low Power, Video Operational Amplifier with Output Limiting; SOIC8; Temp Range: -40° to 85°C
HFA1135IB Intersil Corporation VIDEO PREAMPLIFIER, PDSO8
HFA1135IBZ Intersil Corporation 360MHz, Low Power, Video Operational Amplifier with Output Limiting; SOIC8; Temp Range: -40° to 85°C
HFA1135IB96 Intersil Corporation 1 CHANNEL, VIDEO PREAMPLIFIER, PDSO8, PLASTIC, MS-012AA, SOIC-8

JESD22-A113 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
JESD22-A118

Abstract: SUMITOMO G631H cel9220 Ablebond 8600 sumitomo g770hcd SUMITOMO CRM1076 SUMITOMO G700 G631H sumitomo g770 sumitomo G700ly
Text: requires moisture pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity , Note: * Test requires moisture pre-conditioning sequence per JESD22-A113 and will use the existing , 77/0 Note: * Test requires moisture pre-conditioning sequence per JESD22-A113 and will use the , JESD22-A113 and will use the existing moisture sensitivity level that has been qualified for this material , requires moisture pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity


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PDF A1004-01 2-Apr-2010 VFQFP-N-32 2-Jul-2010 S395CKLF 9LVRS395CKLFT 9LVRS395ENGKLF 9LVRS395ENGKLFT 9LVRS396AKLF 9LVRS396AKLFT JESD22-A118 SUMITOMO G631H cel9220 Ablebond 8600 sumitomo g770hcd SUMITOMO CRM1076 SUMITOMO G700 G631H sumitomo g770 sumitomo G700ly
SUMITOMO CRM1076

Abstract: JESD22-A113 sumitomo g770hcd SUMITOMO G631H cel9220 JESD22-A118 JESD22-A103 Ablebond 8600 sumitomo g770 G631H
Text: JESD22-A113 and will use the existing moisture sensitivity level that has been qualified for this material , pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity level that has been , pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity level that has been , requires moisture pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity , ) JESD22-A103 45/0 Note: * Test requires moisture pre-conditioning sequence per JESD22-A113 and will use


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PDF A1004-01R1 4-Jun-2010 VFQFP-N-32 2-Jul-2010 S395CKLF 9LVRS395CKLFT 9LVRS395ENGKLF 9LVRS395ENGKLFT 9LVRS396AKLF 9LVRS396AKLFT SUMITOMO CRM1076 JESD22-A113 sumitomo g770hcd SUMITOMO G631H cel9220 JESD22-A118 JESD22-A103 Ablebond 8600 sumitomo g770 G631H
JESD22-A114F

Abstract: JESD47 JESD-47 JEDEC JESD22-B116 free download JESD22-A102C JESD22-A108B JESD22-B116A JESD22-A114-F JESD78B JESD22-A102-C
Text: Temperature Cycle, samples have been subjected to pre-conditioning per JESD22-A113 Page 3 of 7 , JESD22-A113 Page 4 of 7 ATTACHMENT II ­ PCN# : W-1002-01 (R4) TSMC Transfer Qualification Test , pre-conditioning per JESD22-A113 Page 5 of 7 ATTACHMENT II ­ PCN# : W-1002-01 (R4) TSMC Transfer , pre-conditioning per JESD22-A113 Page 6 of 7 ATTACHMENT II ­ PCN# : W-1002-01 (R4) TSMC Transfer , JESD22-A113 Page 7 of 7 Integrated Device Technology


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PDF JESD22-A115B, JESD78B AV265 JESD22-B116-A, EIA/JESD22-A110B, EIA/JESD22-A102C, 168hrs JESD22-A113 JESD22-A114F JESD47 JESD-47 JEDEC JESD22-B116 free download JESD22-A102C JESD22-A108B JESD22-B116A JESD22-A114-F JESD78B JESD22-A102-C
JESD22-B101

Abstract: No abstract text available
Text: FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY , Total: TEMPERATURE HUMIDITY BIAS DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 , JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY) 60C/90% R.H., BATTERY BIAS 1000 HRS


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PDF DS2070W, JESD22-A113 60C/90% JESD22-B101
MTTF analysis data

Abstract: JESD22-B101
Text: Total: TEMPERATURE HUMIDITY BIAS DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 , FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY , DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY


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PDF DS3030W, JESD22-A113 60C/90% MTTF analysis data JESD22-B101
EN4900GC

Abstract: JESD22-A103 CEL9220HF JESD22-A113 CRM1076 Compound CEL9220HF cel-9220HF cel9220 JESD-22-A113 JESD22-A102
Text: sequence per JESD22-A113 and will use the existing moisture sensitivity level that has been qualified for , requires moisture pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity , Test Description Note: * Test requires moisture pre-conditioning sequence per JESD22-A113 and will , JESD22-A113 and will use the existing moisture sensitivity level that has been qualified for this material , moisture pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity level


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PDF A1007-02 2-Aug-2010 SSOP-28) 2-Nov-2010 JESD22-A113 LDS6000PYGI LDS6000PYGI8 LDS6003PYGI LDS6003PYGI8 EN4900GC JESD22-A103 CEL9220HF CRM1076 Compound CEL9220HF cel-9220HF cel9220 JESD-22-A113 JESD22-A102
JESD22-B101

Abstract: PHYSICAL DIMENSIONS JESD22-B100 JESD22-A113 JESD22-B107 ML2020R
Text: READPOINT FLUX DIP & H20 RINSE 0447 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 , FLUX DIP & H20 RINSE 0512 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS


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PDF DS2045W, JESD22-B101 JESD22-A113 60C/90% JESD22-B101 PHYSICAL DIMENSIONS JESD22-B100 JESD22-A113 JESD22-B107 ML2020R
JEDEC JESD22-B117

Abstract: JESD22-B107 JESD22-B101 JESD22-A113
Text: RINSE 0447 0447 JESD22-A113 1 HRS 77 77 0 BIASED MOISTURE (BATTERY) JESD22-A113 1 HRS 77 0 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H , QTY FAILS JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0


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PDF DS2045L, JESD22-B101 JESD22-A113 60C/90% JEDEC JESD22-B117 JESD22-B107 JESD22-B101 JESD22-A113
JESD22-B107

Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113
Text: READPOINT FLUX DIP & H20 RINSE 0447 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 , FLUX DIP & H20 RINSE 0512 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS


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PDF DS2030AB JESD22-B101 JESD22-A113 60C/90% JESD22-B107 JEDEC JESD22-B117 JESD22-B101 JESD22-A113 JESD22-B117 JESD22A-113
JESD22-B117

Abstract: JEDEC JESD22-B117 JESD22-B101 JESD22-A113 ML614R
Text: RINSE 0447 0447 JESD22-A113 1 HRS 77 77 0 BIASED MOISTURE (BATTERY) JESD22-A113 1 HRS 77 0 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H , QTY FAILS JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0


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PDF DS2030L, JESD22-B101 JESD22-A113 60C/90% JESD22-B117 JEDEC JESD22-B117 JESD22-B101 JESD22-A113 ML614R
JESD22-B101

Abstract: ML2020R JESD22-A113 JEDEC JESD22-B117 JESD22-B117
Text: READPOINT FLUX DIP & H20 RINSE 0447 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 , FLUX DIP & H20 RINSE 0512 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS


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PDF DS2030W, JESD22-B101 JESD22-A113 60C/90% JESD22-B101 ML2020R JESD22-A113 JEDEC JESD22-B117 JESD22-B117
JESD22-B101

Abstract: 211624 DS1310
Text: Total: TEMPERATURE HUMIDITY BIAS DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 , FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY , DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY


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PDF DS3045W, JESD22-A113 60C/90% JESD22-B101 211624 DS1310
JESD22-B101

Abstract: MTTF analysis data
Text: Total: TEMPERATURE HUMIDITY BIAS DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 , FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY , DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY


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PDF DS3050W, JESD22-A113 60C/90% JESD22-B101 MTTF analysis data
JESD22-B117

Abstract: No abstract text available
Text: Total: TEMPERATURE HUMIDITY BIAS DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 , FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY , DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY


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PDF DS3065W, JESD22-A113 60C/90% JESD22-B117
Jesd22-A113

Abstract: JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107
Text: READPOINT FLUX DIP & H20 RINSE 0447 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 , FLUX DIP & H20 RINSE 0512 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS


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PDF DS2045AB JESD22-B101 JESD22-A113 60C/90% Jesd22-A113 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD22-B107
JESD22-B107

Abstract: JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113
Text: READPOINT FLUX DIP & H20 RINSE 0447 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 , FLUX DIP & H20 RINSE 0512 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS


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PDF DS2050W, JESD22-B101 JESD22-A113 60C/90% JESD22-B107 JESD22-B101 JESD22-A113 JESD22-B100 JEDEC JESD22-B117 PHYSICAL DIMENSIONS JESD22-B100 JESD-22-A113
JESD22-A113

Abstract: JEDEC JESD22-B117 JESD22A-113 ML2020R JESD22-B107 JESD22-B100
Text: READPOINT FLUX DIP & H20 RINSE 0447 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 0 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS 1000 HRS 77 , FLUX DIP & H20 RINSE 0512 JESD22-A113 1 HRS 77 0 60C/90% R.H., BATTERY BIAS


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PDF DS2065W, JESD22-B101 JESD22-A113 60C/90% JESD22-A113 JEDEC JESD22-B117 JESD22A-113 ML2020R JESD22-B107 JESD22-B100
JESD22-B101

Abstract: ML2020R
Text: Total: TEMPERATURE HUMIDITY BIAS DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 , FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY , DESCRIPTION FLUX DIP & H20 RINSE CONDITION JESD22-A113 READPOINT 1 HRS BIASED MOISTURE (BATTERY


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PDF DS3070W, JESD22-A113 60C/90% JESD22-B101 ML2020R
EN4900GC

Abstract: NC7720 CEL9220HF10 EME-G760L EME-G760 HL832nxa Yizbond Hitachi EN4900GC CEL9220 DS-7409HG
Text: -020D, 30°C / 60%RH, reflow 260°C Level* JESD22-A113 Temperature Cycling (TC) JESD22-A104 -65°C/150 , -020D, 30°C / 60%RH, reflow 260°C Level* JESD22-A113 Temperature Cycling (TC) JESD22-A104 -55°C/125


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PDF PCN1-110704 EFM32G890F128 J-STD-020D, JESD22-A113 JESD22-A104 C/125 JESD22-A103 JESD22-A102 JESD22-A110 EN4900GC NC7720 CEL9220HF10 EME-G760L EME-G760 HL832nxa Yizbond Hitachi EN4900GC CEL9220 DS-7409HG
HL832nxa

Abstract: HL832NX-A VPP1552BFG HL-832NXA HL832NXA-EX GE100LFCS HL832-NX-A HL832 KE1250LKDS HL832NX
Text: pre-conditioning sequence per JESD22-A113 and will use the existing moisture sensitivity level that has been , Note: * Test requires moisture pre-conditioning sequence per JESD22-A113 and will use the existing


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PDF A1004-04 26-Jul-2010 FPBGA-324 VPP1552BFG VPP1552BFG8 26-Oct-2010 JESD22-A113 LBGA-167 JESD22-A118 JESD22-A104 HL832nxa HL832NX-A VPP1552BFG HL-832NXA HL832NXA-EX GE100LFCS HL832-NX-A HL832 KE1250LKDS HL832NX
2007 - J-STD-002

Abstract: JESD22-B104 JESD22-b103 20MHz quartz crystal JESD22-A109 JESD22B104 JESD22-B107 SARONIX RoHS NKS 2 NAD 20MHz Crystal SMD
Text: : JESD22-A109 (Condition C) · Fine Test Leak: JESD22-A109 (Condition A1) · Moisture Resistance: JESD22-A113 , C · Fine Test Leak: JESD22-A109, Condition A1 · Moisture Resistance: JESD22-A113 · Insulation


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PDF 10ppm, 20ppm, 30ppm J-STD-002( MIL-STD-883 JESD22-B103 JESD22-B107 MIL-STD-202, J-STD-020C JESD22-A109, J-STD-002 JESD22-B104 JESD22-b103 20MHz quartz crystal JESD22-A109 JESD22B104 JESD22-B107 SARONIX RoHS NKS 2 NAD 20MHz Crystal SMD
KE-G1250

Abstract: KE-G1250 mold compound KEG1250LKDS PI7C8150BNDIE-33 JESD22-A-113-E JESD22-A113E PI7C8150BND reflow profile PI7C8150BNDE PBGA 256 reflow profile QA-1800
Text: moisture performance; this package still meets MSL 3 as per JESD22-A113. Products built with copper bond , XX Physical Dimensions PD JESD22-B100 B XX Preconditioning PRE JESD22-A113 , ) 22 88 5/0 5/0 5/0 5/0 PASS Yes G PRE JESD22-A113 J-STD-020 JEDEC , REFLOW JESD22-A113 J-STD-020 Reflow Profiles: J-STD-020, Profile: Figure 5-1 Table 4.2. Peak , -020D.1; JESD22-A113E # of Lots: Sample Size: Result: PASS 3Cu+1Au 5 Stress / Test: DECAP after 96 hrs


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PDF PI7C8150x KE-G1250 PD-2016 MS-034B/AAF-1 256-Pin, KE-G1250 mold compound KEG1250LKDS PI7C8150BNDIE-33 JESD22-A-113-E JESD22-A113E PI7C8150BND reflow profile PI7C8150BNDE PBGA 256 reflow profile QA-1800
Moisture Sensitivity Level Rating

Abstract: JESD22-A113 moisture sensitive handling and packaging moisture sensitivity s2083 JEDEC J-STD-033 moisture handling and packaging S2080 J-STD-033
Text: IPC/JEDEC J-STD020, J-STD-033 and JESD22-A113 for detailed explanation of test procedures and failure , moisture sensitivity, see IPC/JEDEC J-STD-020, J-STD-033 and JESD22-A113 , available at www.jedec.org


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PDF S2080 Moisture Sensitivity Level Rating JESD22-A113 moisture sensitive handling and packaging moisture sensitivity s2083 JEDEC J-STD-033 moisture handling and packaging S2080 J-STD-033
S2080

Abstract: No abstract text available
Text: JESD22-A113 for detailed explanation of test procedures and failure criteria. For information on surface , J-STD-020, J-STD-033 and JESD22-A113 , available at www.jedec.org 1.  30°C / 85 percent relative


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PDF S2080 S2080
AEC-Q100-006

Abstract: aec-q100 001 NC7SP125P5X b0332 NC7SV86P5X 0.35 tsmc cmos front of fabrication process aec-q100 NC7WV04P6X JESD22-A110
Text: ) (Precondition) Lot Device Industry Standard Test Conditions Q20030061AAPC1AA NC7SV125P5X JESD22-A113 Read Points Q20030061ABPC1AA NC7SV125P5X JESD22-A113 Test: (Autoclave) Lot


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PDF Q20030061 FS35C SC-70 NC7SP00P5X NC7SP05P5X NC7SP126P5X NC7SP158P6X NC7SP32P5X NC7SP57P6X NC7SPU04P5X AEC-Q100-006 aec-q100 001 NC7SP125P5X b0332 NC7SV86P5X 0.35 tsmc cmos front of fabrication process aec-q100 NC7WV04P6X JESD22-A110
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