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AFE58JD28ZAV Texas Instruments 16-Ch Ultrasound AFE With 102mW/Ch Power, Digital Demodulator, and JESD or LVDS Interface 289-NFBGA -40 to 85

JESD-22-B Datasheets Context Search

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2004 - Solder bar of Senju M705

Abstract: senju M31 GRN360 Senju senju m31 Senju 7100 reflow profile JESD 16QN50T23030 JESD 51-7, ambient measurement qfn 32 land pattern Senju paste 7100
Text: . 5 2.2 QFN Pinout , . 22 Figure 21. Modeled 16-Pin Package-Parasitics Comparison . 23 Figure 22 . Modeled 14-Pin Package-Parasitics Comparison , .21 Modeled 14-Pin QFN Package-Parasitics Comparison. 22 , Solutions 10 Quad Flatpack No-Lead Logic Packages SCBA017D 2.2 QFN Pinout The standard


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PDF SCBA017D 14/16/20-terminal MO-241, Solder bar of Senju M705 senju M31 GRN360 Senju senju m31 Senju 7100 reflow profile JESD 16QN50T23030 JESD 51-7, ambient measurement qfn 32 land pattern Senju paste 7100
2013 - JESD 201 class 1A

Abstract: No abstract text available
Text: protection applications. • Very low profile -DATA height of 1.1 mm For use in and JESD 22 , solderable per J-STD-002 VRRM - halogen-free, RoHS-compliant, and 22 -B102 Base P/N-M3 0.40 V VF atJ F , 22 -B102 solderable per 260 °C TJIFSM 2 150 °C J-STD-002 and JESD tin plated 1A whisker test , reverse voltage 150 °C TJ max. J-STD-002 and JESD 22 -B102 Maximum repetitive A V suffix at I V , Maximum average forward rectified current (fig. 1) J-STD-002 and JESD 22 -B102 V10PN50 (TA = 25 °C unless


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PDF O-277A V10PN50 V15PN50 VMN-PT0378-1308 91000TO JESD 201 class 1A
2012 - marking CODE 15

Abstract: CDR33 Reliability data 22-B102 CDR06BX PACKAGECDR01BP470B jf27
Text: , 270 "R",p " B " 22 nF F 1.0 n 1PARAMETER THERMAL CHARACTERISTICS (TA = 25 °C unless otherwise , 260 °C Vishay Vitramon CDR HN TM BX CDR02 (1805) 100 3.9 nF 22 nF CDR-MIL-PRF-55681 eSMP Series · , ) CAGE CODE SHV71 F 1.0 p F 2.2 n 1 9 39 100 F 4.7 n 10 s, F n 2 · Solder dip 265 °C max. per JESD 22 -A111 62 -201 100 1.0 nF 3.3 nF 10 nF Qualified, Surface Mount Schottky Barrier Rectifiers , accordance to WEEE 2002/96/EC Multilayer Ceramic Chip Capacitors, BP CDR34 (1812) 100 2.2 nF · Compliant


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PDF MIL-PRF-55681 SHV71 CDR01, CDR02, CDR03, CDR04, CDR06, CDR31, CDR32, CDR33, marking CODE 15 CDR33 Reliability data 22-B102 CDR06BX PACKAGECDR01BP470B jf27
AOZ1022DIL

Abstract: 22-A115-A JESD A114 84-3J AOZ1360AIL 2P3M UMC A115A AOZ1360DI aoz1016 bd001
Text: . Qualification Tests Requirments · · 1 lot of AOZ1360 up to 500 hrs of B /I for initial New Product conditional , manufacturing. IV. Qualification Tests Result Test Item HTOL Test Condition Per JESD 22 -A108_B Vdd=28V Temp = 125 °C Per JESD 22 -A114, JESD 22 -A115-A, Sample Size Result 3 lots (60 /lot) pass , AOZ1016AIL/1056AIL pkg data (cf. PQ-00809C) PreConditioning Per JESD 22 -A113 0 85 C /85%RH, 3 cyc 0


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PDF AOZ1360AIL/DIL, AOZ1360AI/AIL AOZ1360DI/DIL AOZ1360AI/AIL AOZ1360DI/DIL AOZ1022DIL PQ-01143C) AOZ1360AIL AOZ1360DIL -105D 22-A115-A JESD A114 84-3J 2P3M UMC A115A AOZ1360DI aoz1016 bd001
ablebond 8006ns

Abstract: CEL9220HF13 cel-9220HF AOZ8000HI cel-9220 marking A03 22A108-B CEL9220 22-A108-B A108-B
Text: Tests Requirments 2 · · · 2 lots of AOZ8000HI up to 168 hrs of B /I for New Product release. 2 additional lots of AOZ8000HI up to 168 hrs of B /I for New UH_EPI process release. 2 lots of package qual , Result Test Item PreConditioning Test Condition Per JESD 22 -A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C Per JESD 22 -A108_B Vdd=6V 0 Temp = 125 C Per JESD 22 -A108_B Vdd=6V Temp = 125 0C Per JESD 22


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PDF AOZ8000HI, AOZ8000HI. AOZ8000HI AB008) IEC-61000-4-2, JESD78A -105D ablebond 8006ns CEL9220HF13 cel-9220HF cel-9220 marking A03 22A108-B CEL9220 22-A108-B A108-B
2011 - apl1084

Abstract: TRANSISTOR apl1084
Text: verify before placing orders. Copyright © ANPEC Electronics Corp. Rev. B .13 - Jun., 2011 1 , Electronics Corp. Rev. B .13 - Jun., 2011 ∆VREF=1%, IOUT=3A,TJ =0~125°C - 1.2 1.4 ∆VREF , . B .13 - Jun., 2011 3 www.anpec.com.tw APL1084 Typical Operating Characteristics Dropout , -25 0 25 50 75 100 Temperature (°C) Copyright © ANPEC Electronics Corp. Rev. B .13 - Jun , 1k 10k 100k Frequency (Hz) Copyright © ANPEC Electronics Corp. Rev. B .13 - Jun., 2011


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PDF APL1084 APL1084 O-220, O-252, O-263 JESD-22, TRANSISTOR apl1084
2009 - ANPEC marking date code

Abstract: ANPEC JESD 51-7, ambient measurement APX9141
Text: | < 50 Gauss A : | Bop , Brp | < 65 Gauss; B : | Bop , Brp | < 90 Gauss Package Code E : TO - 92M4 , ) APX9141 Symbol VDD VSAT VClamp IDD ILeak a tr tf b b Parameter Supply Voltage Output Saturation Voltage Operating Test Conditions Min. 3 VDD=20V, Output Open VOUT=20V, VDD=20V, B B >Bop IOUT=200mA, B >Bop , Different 350 15 10 5 1 7 V mA µA µs µs µs t b Copyright © ANPEC Electronics Corp. Rev. A.10 - Mar


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PDF APX9141 400mA O-92M APX9141 O-92M-2000 JESD-22, ANPEC marking date code ANPEC JESD 51-7, ambient measurement
2009 - APX9131

Abstract: A102 A108 B102 JESD-22 J-STD-020D
Text: Leakage Current VOUT = 3.5V, BRPN< B B BRPS 0 OUTPUT ON + B , www.anpec.com.tw APX9131 Package Information SOT-23-3 D e E E1 SEE VIEW A c b 0.25 A L GAUGE PLANE SEATING PLANE 0 A1 A2 e1 VIEW A S Y M B O L SOT , 0.006 A2 0.90 1.30 0.035 0.051 b 0.30 0.50 0.012 0.020 c 0.08


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PDF APX9131 APX9131, JESD-22, MIL-STD-883-3015 VMM200V 1tr100mA APX9131 A102 A108 B102 JESD-22 J-STD-020D
2011 - AB SOT-23-6

Abstract: marking TC SOT-23-6 A104 transistor
Text: APL3216/A/ B /C VIN input pin fully supports the IEC61000-4-2. That means the VIN pin has immunity of ±15kV , TDFN2x2-8 D A E D2 A1 A3 Pin 1 Corner e S Y M B O L A A1 A3 b D D2 E E2 e L 0.30 0.18 1.90 , -3. Copyright © ANPEC Electronics Corp. Rev. A.4 - Apr., 2011 7 L E2 b www.anpec.com.tw APL3216 Package Information SOT-23-6 D e -T- SEATING PLANE < 4 mils SEE VIEW A E1 b e1 E c 0.25 GAUGE PLANE SEATING PLANE VIEW A 0 A2 A1 A L S Y M B O L A A1 A2 b c D E E1 e


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PDF APL3216 IEC61000-4-2 APL3216/A JESD-22, VMM200V 1tr100mA AB SOT-23-6 marking TC SOT-23-6 A104 transistor
2014 - 76129

Abstract: No abstract text available
Text: . 1 1 1 2 3 5 7 Detailed Description . 22 7.1 , . Register Maps . 22 22 23 31 39 41 , AVDD33 26 OVRC INCM 25 DC1M INCP 24 DC1P AVDD33 23 IOVDD 22 DC0M , channel A INBP, INBM 58, 59 I Differential analog input for channel B INCP, INCM 18, 19 I Differential analog input for channel C INDP, INDM 23, 22 I Differential analog


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PDF ADS58J89 SBAS659 ADS58J89 14-Bit 14bit, 250/500-MSPS 500MSPS 14-bit 76129
A194FH

Abstract: AOZ8000CI 84-3j mp8000ch4 A194-FH SS MARKING sot23 IEC-61000-4-2 2P3M a194 MP-8000CH4
Text: of B /I for New Product release. 2 lots of package qual testing (PCT, 250 cycles TC) for SOT-23 for , Size Result PreConditioning Per JESD 22 -A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C 2 lots , process) Per JESD 22 -A108_B Vdd=6V Temp = 125 0C 2 lots (80 /lot) pass HTOL (new UH_EPI process) Per JESD 22 -A108_B Vdd=6V Temp = 125 0C 2 lots (80 /lot) pass Lot 1 (wafer lot , = C+273 k = Boltznan's constant, 8.617x10-5 V / K B . Package Qualification Testing Package qual


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PDF AOZ8000CI, AOZ8000CI. AOZ8000CI 617x10-5 -105D A194FH 84-3j mp8000ch4 A194-FH SS MARKING sot23 IEC-61000-4-2 2P3M a194 MP-8000CH4
2011 - APX9136

Abstract: No abstract text available
Text: Cycle Chopping Frequency VOUT=3.5V, BRPN< B B 0 BRPS OUTPUT ON + B , APX9136 Package Information VTDFN1.6x1.6-6 D A Pin 1 b D2 A3 A1 Pin 1 Corner e S Y M B O L A A1 A3 b , Carrier Tape & Reel Dimensions OD0 P0 P2 P1 A E1 F K0 B SECTION A-A T B0 A0 OD1 B A SECTION B-B d , Test Program Test item SOLDERABILITY HOLT PCT TCT HBM MM Latch-Up Method JESD- 22 , B102 JESD- 22 , A108


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PDF APX9136 APX9136, JESD-22, MIL-STD-883-3015 VMM200V 1tr100mA APX9136
2009 - Not Available

Abstract: No abstract text available
Text: 8 µA Operating IOFF Output Leakage Current VOUT = 3.5V, BRPN< B B BRPS 0 OUTPUT ON + B MAGNETIC FLUX Pole-Independent The pole-independent , Information SOT-23 D e E E1 SEE VIEW A c b 0.25 A L GAUGE PLANE SEATING PLANE 0 A1 A2 e1 VIEW A S Y M B O L SOT-23 INCHES MILLIMETERS MIN. MIN , 0.035 0.051 b 0.30 0.50 0.012 0.020 c 0.08 0.22 0.003 0.009 D


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PDF APX9131 APX9131, JESD-22, MIL-STD-883-3015 100mA
2009 - 23gg

Abstract: No abstract text available
Text: VOUT=3.5V, BRPN< B B hys) of the device , magnetic switch points are stable. OUTPUT OFF 5V MAX OUTPUT VOLTAGE BOPN BOPS BRPN 0 - B 0 BRPS OUTPUT ON + B MAGNETIC FLUX Pole-independent The pole-independent sensing technique allows for , APX9132G Package Information SOT-23-3 D e SEE VIEW A E1 E b e1 c 0.25 VIEW A SOT


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PDF APX9132G APX9132G, JESD-22, MIL-STD-883-3015 VMM200V 1tr100mA 23gg
2009 - APL5523

Abstract: A102 TRANSISTOR JESD A114 MOS marking JC transistor 8P TRANSISTOR A104 A104 A108 A114 APL5223
Text: Output Capacitor - dB 0.9 1 V - 2.2 - µF 0.01 ESR 55 - 0.1 1 , c A 0.25 b L 0 GAUGE PLANE SEATING PLANE A1 A2 e VIEW A S Y M B , 0.006 0.000 0.15 0.00 0.049 A2 1.25 b 0.31 0.51 0.012 0.020 c , SEE VIEW A h X 45 ° c A 0.25 b GAUGE PLANE SEATING PLANE A1 A2 e L VIEW A S Y M B O L SOP-8 MILLIMETERS MIN. INCHES MAX. A MIN. MAX. 1.75


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PDF APL5523 V/500mA V/300mA APL5523 V/500mA V/300mA APL5223 500mA) 300mA JESD-22, A102 TRANSISTOR JESD A114 MOS marking JC transistor 8P TRANSISTOR A104 A104 A108 A114
2011 - Not Available

Abstract: No abstract text available
Text: ., 2011 6 www.anpec.com.tw APL3216 Package Information TDFN2x2-8 A b E D D2 A1 E2 A3 L Pin 1 Corner e S Y M B O L MIN. MAX. MIN. MAX. A 0.70 , INCHES 0.20 REF 0.008 REF b 0.18 0.30 0.007 0.012 D 1.90 2.10 0.075 , SEE VIEW A b c 0.25 A L 0 GAUGE PLANE SEATING PLANE A1 A2 e1 VIEW A S Y M B O L SOT-23-6 MILLIMETERS MIN. INCHES MAX. A MAX. MIN. 0.057


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PDF APL3216 APL3216 IEC61000-4-2 JESD-22, 100mA
2009 - JESD-22

Abstract: A108 APM9984C APM9984CCG B102 GEM2928
Text: VDS=16V, VGS=0V V Gate Threshold Voltage IGSS RDS(ON) VGS=0V, IDS=250µA m V b , 44 75 - 25 - nS - 13 - nC b RG Gate Resistance Ciss Input , : Pulse test ; pulse width300µs, duty cycle2%. Note b : Guaranteed by design, not subject to production , .) Output Characteristics Drain-Source On Resistance 23 20 VGS=2,3,4,5,6,7,8,9,10V 22 RDS(ON , Threshold Voltage RDS(ON) - On - Resistance (m) 1.4 22 20 18 16 14 12 1 2 3


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PDF APM9984CCG JESD-22, JESD-22 A108 APM9984C APM9984CCG B102 GEM2928
2011 - Not Available

Abstract: No abstract text available
Text: VACIN Decreasing 2.2 125 -50 -25 0 Junction Temperature (° C) 50 75 100 , www.anpec.com.tw APL3213/A Package Information TDFN2x2-8 D b E A A1 D2 E2 A3 L K Pin 1 Corner e TDFN2x2-8 S Y M B O L MIN. MAX. MIN. MAX. A 0.70 0.80 , 0.008 REF b 0.18 0.30 0.007 0.012 D 1.90 2.10 0.075 0.083 D2 1.00 , K0 A0 A OD1 B B T SECTION A-A SECTION B-B H A d T1 Application H


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PDF APL3213/A APL3213/A IEC61000-4-2 JESD-22, MIL-STD-883-3015 100mA
2013 - Not Available

Abstract: No abstract text available
Text: IOUT=0mA - - 20 µA VIN=5.5V, IOUT=3A - 22 - VIN=5.5V, IOUT=2A - 21.5 , www.anpec.com.tw APL3222 Package Information E b WLCSP0.8x1.2-6 PIN 1 A2 D A1 A NX aaa C e SEATING PLANE e WLCSP0.8x1.2-6 S Y M B O L MIN. TYP MAX. MIN , 0.006 0.0079 0.010 b 0.23 0.26 0.29 0.009 0.0102 0.011 D 1.16 1.20 , P1 A B0 W F E1 OD0 K0 A0 A OD1 B B T SECTION A-A SECTION


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PDF APL3222 APL3222 JESD-22, MIL-STD-883-3015 100mA
2010 - APL1582

Abstract: No abstract text available
Text: TO-252-5 E A c2 E1 H D D1 L3 b3 c b e SEE VIEW A 0 SEATING PLANE L A1 0.25 GAUGE PLANE VIEW A TO-252-5 S Y M B O L MIN. A 2.18 INCHES MILLIMETERS MAX. MIN. MAX. 2.39 0.086 0.094 0.005 0.13 A1 b 0.50 , E1 H D D1 L1 E b e c SEE VIEW A 0 SEATING PLANE L VIEW A A1 0.25 GAUGE PLANE TO-263-5 S Y M B O L MIN. MAX. MIN. MAX. A 4.06


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PDF APL1582 APL1582 450mV O-252 O-263 JESD-22,
Not Available

Abstract: No abstract text available
Text: V 40 Diode Continuous Forward Current 1 b Avalanche Current (Single Pulse) 9 b , GS=0V, ID S=250mA Forward Transconductance mW Diode Characteristics V SDa b trr Qrr b Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Copyright ã Sinopower , 10.2 14 - 5.3 - - 0.78 - - 1.7 - - 2.2 Unit - Dynamic Characteristics b RG Gate Resistance V GS=0V,V DS=0V,F=1MHz Ciss Input Capacitance Coss Output


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PDF SM4804DSK 2500ea/reel) JESD-22,
2010 - sot-23-5 marking code

Abstract: diode RL 207 JESD for TCT B102 APC308 APC208 APC207 A108 A102 886-3-5642000
Text: Marking Information Package Code B : SOT-23-5 Temperature Range I : - 40 to 85 oC Handling Code TR , Handling Code Temperature Range Package Code APC206/207/208 B : 206 X 207 X 208 X X - Date , SEE VIEW A b c 0.25 A L 0 GAUGE PLANE SEATING PLANE A1 A2 e1 VIEW A S Y M B O L SOT-23-5 INCHES MILLIMETERS MIN. MIN. MAX. A MAX. 0.057 1.45 0.00 0.15 0.000 0.006 A2 0.90 1.30 0.035 0.051 b 0.30 0.50


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PDF APC206/207/208 APC206/207/208 310mA JESD-22, MIL-STD-883-3015 sot-23-5 marking code diode RL 207 JESD for TCT B102 APC308 APC208 APC207 A108 A102 886-3-5642000
2011 - APL3580

Abstract: Power Switch
Text: Information E b WLCSP1.2x1.2-4 Pin 1 D A2 A1 A e/2 NX aaa e e/2 SEATING PLANE e WLCSP1.2x1.2-4 S Y M B O L MIN. MAX. MIN. MAX. A 0.60 0.75 , 0.50 0.016 b 0.25 0.35 0.010 0.014 D 1.15 1.25 0.045 0.049 E , Dimensions P0 P2 P1 A B0 W F E1 OD0 K0 A0 A OD1 B B T SECTION , Program Test item SOLDERABILITY HOLT PCT TCT HBM MM Latch-Up Method JESD- 22 , B102 JESD- 22


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PDF APL3580 APL3580 JESD-22, MIL-STD-883-3015 100mA Power Switch
2009 - APW7181

Abstract: APM4010 apm*4015p APM4015 APM4010N apm*4010n APM4015P apm*4015
Text: Information SOP-8 D E E1 SEE VIEW A h X 45 ° c A 0.25 b GAUGE PLANE SEATING PLANE A1 A2 e L VIEW A S Y M B O L SOP-8 MILLIMETERS MIN. INCHES MAX. A MIN. MAX. 1.75 0.069 0.004 0.25 0.010 A1 0.10 A2 1.25 b 0.31 0.51 , F E1 OD0 K0 A0 A OD1 B B T SECTION A-A SECTION B-B H A d T1 , °C 3 Reliability Test Program Test item Method Description SOLDERABILITY JESD- 22


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PDF APW7181 APW7181 JESD-22, 100mA APM4010 apm*4015p APM4015 APM4010N apm*4010n APM4015P apm*4015
2010 - APM1101N

Abstract: apm1101 apm110
Text: to 150 5 100 60 35 22 50 20 2.5 50 400 Unit Common Ratings (TA=25°C Unless Otherwise Noted) V °C , APM1101NU Electrical Characteristics (Cont.) Symbol Parameter b (TA = 25°C unless otherwise noted , Capacitance Turn-on Delay Time Turn-on Rise Time Turn-off Delay Time Turn-off Fall Time b VGS=0V,VDS=0V,F , test ; pulse width300µs, duty cycle2%. Note b : Guaranteed by design, not subject to production testing , Resistance 2.4 2.2 VGS = 10V IDS = 35A Source-Drain Diode Forward 100 Normalized On Resistance 2.0


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PDF APM1101NU 00V/35A, O-252-3 APM1101N O-252-3 JESD-22, apm1101 apm110
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