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AFE58JD28ZAV Texas Instruments 16-Ch Ultrasound AFE With 102mW/Ch Power, Digital Demodulator, and JESD or LVDS Interface 289-NFBGA -40 to 85
A108P3YZQ (1-1437555-5) TE Connectivity Ltd Toggle Switches; A108P3YZQ=SP FLAT TOG LUG TERM ( Alcoswitch )
A108MD9AB (1-1437555-2) TE Connectivity Ltd Toggle Switches; A108MD9AB=GEMINI TOGGLE SWITCH ( Alcoswitch )
A10839-000 TE Connectivity Ltd CONN BACKSHELL ADPT SZ 32 OLIVE
A10815-000 TE Connectivity Ltd BLOW-MOLDED PARTS
A108SD9AQ (1-1437555-6) TE Connectivity Ltd Toggle Switches; A108SD9AQ=SP TOGGLE RA ( Alcoswitch )

JESD-22-A108 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
2013 - Not Available

Abstract: No abstract text available
Text: RESULTS: TEST DESCRIPTION METHOD/CONDITIONS JESD- 22 , Method A108 HTOL High Temperature Operating , 100 pF 1X +/- Voltage JESD- 22 ,Method C101 ESD-CDM TA = +25°C ESD-MM TA = +25°C R


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PDF MIC826 /-200mA, JESD-22, BA24574MNB JESD-22 200pF, JESD-78, /-200mA UL-94V-0
Not Available

Abstract: No abstract text available
Text: SOLDERABILITY HTRB HTGB PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , 10.2 14 - 5.3 - - 0.78 - - 1.7 - - 2.2 Unit - Dynamic , 0.0 2.5V 0.5 1.0 1.5 2.0 2.5 22 18 16 VGS=10V 14 12 10 8 3.0 VGS , 5.80 6.20 0.228 0.244 3.80 4.00 0.150 0.157 0.50 0.010 2.2 0.020


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PDF SM4804DSK 2500ea/reel) JESD-22,
2011 - Not Available

Abstract: No abstract text available
Text: High Temperature Operating Life Test MIC23153YMT MIC23153-GYMT JESD- 22 , Method A108 HTOL


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PDF MIC23153 MIC23155 MIC23153YMT TMLF-10L 9A21145MNB MIC23153-GYMT 9A21143MNG
2011 - Not Available

Abstract: No abstract text available
Text: 1000HR Rj/SS JESD- 22 , Method A108 High Temperature Operating Life Test 9805 7C6879 0/129


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PDF MIC2940A/2941A /-200mA O263-5 1000HR JESD-22, 7C6879 200pF, JESD-78, 3A29327M02
2011 - Not Available

Abstract: No abstract text available
Text: DATE CODE LOT ID. 168 HR rej/ss HTOL JESD- 22 , Method A108 0833 8A22793MEL 0/77


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PDF MIC4223/4224/4225 /-200mA JESD-22, 8A22793MEL 8A22798MNU /200mA, 8A22796MNT 8A22797MNE JESD22-B102 UL-94V-0
2010 - Not Available

Abstract: No abstract text available
Text: DESCRIPTION METHOD/CONDITIONS PART NO. LOT ID. 168 HR Rej/ss 1000 HR Rej/ss JESD- 22 , Method A108 TEST DESCRIPTION 4A14488MNE 0/115 0/115 TA= + 125°C MIC5319 5A18254MEC


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PDF MIC5319 500mA Q3-10 /-200mA TSOT23-5 47X10E8 JESD-22, A14488MNE
2011 - Not Available

Abstract: No abstract text available
Text: Temperature Operating Life Test 0746 0809 JESD- 22 , Method A108 HTOL 7A34282MNFG 0/238 , METHOD/CONDITIONS JESD- 22 Method C101C TA = +25°C ESD-CDM TEST DESCRIPTION METHOD/CONDITIONS


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PDF MIC94040/41/42/43/44/45 /-200mA 7A34282MEC 7A34280MNH 7A34282MNG JESD22-B102D, 7A34282MNF UL-94V-0
2012 - Not Available

Abstract: No abstract text available
Text: /CONDITIONS LOT# DATE CODE 168 HR (rej/ss) 1000 HR (rej/ss) JESD- 22 , Method A108 0/60 0 , /CONDITIONS JESD- 22 , Method C101 ESD-CDM LOT# 7A18138MSE DATE CODE 0729 TA = +25°C TEST


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PDF MIC2230: 800mA/800mA MIC2238: MIC2230/2238 3x3MLF-12L 10E8HRS JESD-22, 6A36682MNC 6A42514MNN /-500V
2011 - Not Available

Abstract: No abstract text available
Text: ) HTOL JESD- 22 , Method A108 1024 9A21143MNJ 0/77 0/77 0/77 1024 0A16871MNE 0


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PDF MIC33153 /-200mA HMLF-14L: HMLF14L: Q1-2011 Q1-2011 99x10E9 JESD-22, JESD22-A103 JESD22-A101
2009 - JESD-22

Abstract: A108 APM9984C APM9984CCG B102 GEM2928
Text: Test item SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , .) Output Characteristics Drain-Source On Resistance 23 20 VGS=2,3,4,5,6,7,8,9,10V 22 RDS(ON , Threshold Voltage RDS(ON) - On - Resistance (m) 1.4 22 20 18 16 14 12 1 2 3


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PDF APM9984CCG JESD-22, JESD-22 A108 APM9984C APM9984CCG B102 GEM2928
2009 - APM6004NF

Abstract: APM6004 APM6004N
Text: °C 245 °C 245 °C 3 Reliability Test Program Test item SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs , Operating Characteristics (Cont.) Drain-Source On Resistance 2.2 2.0 VGS = 10V IDS = 40A Source-Drain


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PDF APM6004NF 0V/80A, O-220 APM6004N O-220 JESD-22, APM6004NF APM6004
2010 - APM1101N

Abstract: apm1101 apm110
Text: Reliability Test Program Test item SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs, 100%RH, 2atm, 121°C 500 , to 150 5 100 60 35 22 50 20 2.5 50 400 Unit Common Ratings (TA=25°C Unless Otherwise Noted) V °C , Resistance 2.4 2.2 VGS = 10V IDS = 35A Source-Drain Diode Forward 100 Normalized On Resistance 2.0


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PDF APM1101NU 00V/35A, O-252-3 APM1101N O-252-3 JESD-22, apm1101 apm110
2013 - Not Available

Abstract: No abstract text available
Text: DESCRIPTION METHOD/CONDITIONS PART NO. LOT ID. 168 HR 1000HR JESD22, Method A108 , 2A40010MNO 0/76 COMMENTS 0/76 TEST DESCRIPTION METHOD/CONDITIONS JESD- 22 PART NO. LOT


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PDF MIC3808/3809 MIC3838/3839 MIC3808BM 541275MED 2A40012MNI 2A47047MNL MIC3808YM 5A19417MNA
2009 - ANPEC marking date code

Abstract: ANPEC JESD 51-7, ambient measurement APX9141
Text: Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 MIL-STD-883-3015.7 JESD 78 Description 5


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PDF APX9141 400mA O-92M APX9141 O-92M-2000 JESD-22, ANPEC marking date code ANPEC JESD 51-7, ambient measurement
2009 - APM60

Abstract: No abstract text available
Text: °C 245 °C 245 °C 3 Reliability Test Program Test item SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs , Characteristics (Cont.) Drain-Source On Resistance 2.2 2.0 1.8 VGS = 10V IDS = 20A Source-Drain Diode Forward


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PDF APM6003NF 0V/26A, O-220 APM6003N O-220 JESD-22, APM60
2010 - ANPEC Electronics

Abstract: 8D10
Text: SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245 , Charge Characteristics Total Gate Charge VDS=-30V, VGS=-10V, IDS=-8A - 22 3.8 4.5 31 nC


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PDF APM6010PU -60V/-8A, O-252-3 APM6010P O-252-3 JESD-22, ANPEC Electronics 8D10
2009 - APM6004

Abstract: APM6004N
Text: SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245


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PDF APM6004NU 0V/45A, O-252-3 APM6004N O-252-3 JESD-22, APM6004
2009 - APM8005

Abstract: APM8005K apm80 T1H9
Text: SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245


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PDF APM8005K APM8005 JESD-22, APM8005K apm80 T1H9
2009 - apm9946

Abstract: apm*9946 APM9946J ANPEC A102 A104 A108 B102 JESD-22
Text: PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec


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PDF APM9946J APM9946 JESD-22, apm9946 apm*9946 APM9946J ANPEC A102 A104 A108 B102 JESD-22
2009 - APM9926C

Abstract: M9926 GEM2928 A108 B102 JESD-22 APM9926CCG APM9926CC
Text: PCT TCT Copyright © ANPEC Electronics Corp. Rev. A.2 - Mar., 2009 Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 10 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs


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PDF APM9926CCG APM9926C APM9926C M9926C JESD-22, M9926 GEM2928 A108 B102 JESD-22 APM9926CCG APM9926CC
2009 - apm9946

Abstract: apm*9946 APM9946K C38M A102 A108 B102 JESD-22
Text: PCT TCT Copyright © ANPEC Electronics Corp. Rev. A.2 - Mar., 2009 Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 10 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs


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PDF APM9946K APM9946 JESD-22, apm9946 apm*9946 APM9946K C38M A102 A108 B102 JESD-22
2009 - apm30

Abstract: No abstract text available
Text: Test Program Test item SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs, 100%RH, 2atm, 121°C 500 Cycles , 1 30 2.5 ±100 15 22 V µA V nA m Diode Characteristics VSD trr Qrr a Diode Forward Voltage


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PDF APM3015NFP 0V/50A, O-220 APM3015N O-220-FP JESD-22, apm30
2009 - Not Available

Abstract: No abstract text available
Text: SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245


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PDF APM1103NG 00V/60A, O-263-3 APM1103N O-263-3 JESD-22,
2010 - APM1110N

Abstract: apm1110 C135M APM1110NU 8D10 DS5A
Text: Reliability Test Program Test item SOLDERABILITY HOLT PCT TCT Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs, 100%RH, 2atm, 121°C 500


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PDF APM1110NU 00V/10A, O-252-3 APM1110N O-252-3 JESD-22, apm1110 C135M APM1110NU 8D10 DS5A
2009 - APM2605

Abstract: APM2605C JESD-22 J-STD-020D MARKING A104 SOT AAAX
Text: PCT TCT Copyright © ANPEC Electronics Corp. Rev. A.2 - Jul., 2009 Method JESD- 22 , B102 JESD- 22 , A108 JESD- 22 , A102 JESD- 22 , A104 10 Description 5 Sec, 245°C 1000 Hrs, Bias @ 125°C 168 Hrs


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PDF APM2605C -30V/-4 OT-23-6 APM2605 JESD-22, APM2605 APM2605C JESD-22 J-STD-020D MARKING A104 SOT AAAX
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